IP Library › Granted Patent US 8,115,319
Granted Patent B2
US 8,115,319 · App. 12/717,518 · Granted Feb 14, 2012

Flip chip package maintaining alignment during soldering

Assignee: Powertech Technology Inc.
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Quick Facts
Patent No.
US 8,115,319
App. No.
12/717,518
Granted
Feb 14, 2012
Kind
B2
Abstract

Disclosed is a flip chip package maintaining alignment during soldering, primarily comprising a chip and a substrate. A plurality of bumps and at least an extruded alignment key are disposed on the active surface of the chip. The substrate has a plurality of bonding pads and at least an alignment base where the alignment base has a concaved alignment pattern corresponding to the extruded alignment key. When the chip is disposed on the substrate, the extruded alignment key is embedded into the concaved alignment pattern to achieve accurately align the bumps to the corresponding bonding pads. Therefore, even with the mechanical misalignment due to the accuracy of flip-chip die bonders and the transportation during reflow processes, the bumps of a chip still can accurately align to the bonding pads of the substrate to achieve accurate soldering which is especially beneficial to the mass production of MPS-C2 products.

Claims (16)

1. A flip chip package comprising:

a chip with a plurality of bumps and at least an extruded alignment key disposed on an active surface of the chip;

a substrate having a plurality of bonding pads and at least an alignment base where the alignment base has a concaved alignment pattern corresponding to the extruded alignment key;

when the chip is disposed on the substrate, the extruded alignment key is embedded into the concaved alignment pattern in a manner that the bumps are accurately aligned to the bonding pads; and

a plurality of solder bonding materials soldering the bumps to the corresponding bonding pads;

wherein the bumps are metal pillars without changing their shapes during reflow processes to form a MPS-C2 package;

wherein the combination height of the extruded alignment key embedded into the alignment base is not less than the height of the bumps so that a gap is maintained between the bumps of the chip and the bonding pads of the substrate;

wherein the alignment base is a protrusive component disposed on the substrate.

2. The flip chip package as claimed in claim 1 , wherein the alignment base has a plurality of first guiding slopes inside the concaved alignment pattern to enhance the guiding alignment of the extruded alignment key.

3. The flip chip package as claimed in claim 2 , wherein the concaved alignment pattern is a half-cone concaved cavity where the extruded alignment key has a plurality of second guiding slopes corresponding to the first guiding slopes so that the extruded alignment key have a cross-section of a half cone to completely fill into the concaved alignment pattern.

4. The flip chip package as claimed in claim 1 , wherein the extruded alignment key is located at a corner of the active surface of the chip.

5. The flip chip package as claimed in claim 1 , wherein the extruded alignment key is plural to be symmetrically disposed on the peripheries of the active surface of the chip relative to the dispositions of the bumps.

6. The flip chip package as claimed in claim 5 , wherein the extruded alignment keys have different flat top surfaces.

7. The flip chip package as claimed in claim 1 , wherein the extruded alignment key has a flat top surface chosen from the group consisting of square, strip, triangle, and L-shape.

8. The flip chip package as claimed in claim 1 , wherein the extruded alignment key has the same height and material as the bumps.

9. The flip chip package as claimed in claim 1 , wherein the materials of the bumps, the extruded alignment key, and the alignment base are the same, wherein the extruded alignment key is a copper post and the alignment base is a copper cavity component.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2010
From: HSU, HUNG-HSIN; KO, CHIH-MING
To: POWERTECH TECHNOLOGY INC.
Reel/Frame 024030/0914 →
Continuity (1)
Related Publication 20110215466A1 · Sep 8, 2011