Memory cell sensing using negative voltage
Embodiments of the present disclosure provide methods, devices, modules, and systems for memory cell sensing using negative voltage. One method includes applying a negative read voltage to a selected access line of an array of memory cells, applying a pass voltage to a number of unselected access lines of the array, and sensing whether a cell coupled to the selected access line is in a conductive state in response to the applied negative read voltage.
1. A memory device, comprising:
an array of memory cells;
a global access line switch system coupled to a number of input global access lines and a corresponding number of output global access lines associated with the array and configured to provide a particular negative read voltage to a selected local access line associated with a selected block of cells; and
a negative voltage generator configured to provide the particular negative voltage as an input to the global access line switch system.
2. The device of claim 1 , wherein, in operation, the selected block includes a number of unselected local access lines biased at a read pass voltage while the particular negative read voltage is applied to the selected local access line.
3. The device of claim 1 , wherein the negative voltage generator includes:
a comparator having an input coupled to a resistive divider;
a negative charge pump that provides the particular negative read voltage at its output; and
a digital to analog converter having an output coupled to the input of the comparator through a resistor of the resistive divider.
4. The device of claim 1 , wherein the global access line switch system includes a number of switch circuits each having an input coupled to a particular one of the input global access lines and having an output coupled to a corresponding one of the output global access lines.
5. The device of claim 4 , wherein each of the number of switch circuits includes a level shifter that receives an enable input signal.
6. The device of claim 5 , wherein a state of the enable input signal determines whether a path between the input coupled to the particular one of the input global access lines and the output coupled to the corresponding one of the output global access lines is closed.
7. The device of claim 1 , wherein the device includes control circuitry coupled to the array and configured to sense whether one or more memory cells coupled to the selected local access line is in a conductive state in response to the provided particular negative read voltage.
8. A memory device, comprising:
an array of multilevel memory cells, wherein the cells are associated with a number of positive programmed states and a number of negative programmed states to which the cells can be programmed;
a global access line switch system having a number of switches, each switch coupled between one of a number of input global access lines and a corresponding one of a number of output global access lines; and
circuitry coupled to the array and configured to determine a particular negative programmed state of a selected cell by:
applying a negative read voltage to a local access line of the selected cell while applying a pass voltage to access lines of unselected cells during a sensing operation;
wherein each of the number of output global access lines is coupled to a respective one of a number of local access lines of the array; and
sensing a current variation of a data line to which the selected cell is coupled in response to the selected cell changing from a non-conducting state to a conducting state.
9. The device of claim 8 , wherein the each of the number output global access lines is coupled to the respective one of the number of local access lines of the array through a bank of string driver transistors.
10. The device of claim 9 , wherein the circuitry includes:
a driver coupled to the number of input global access lines, the driver applies a positive pass voltage to access lines of unselected cells; and
a negative voltage generator coupled to the global access line switch system, the negative voltage generator applies the negative read voltage to the switch that is coupled to the input global access line corresponding to the local access line of the selected cell.
11. The device of claim 8 , wherein the array is a NAND array of non-volatile multilevel memory cells.
12. A global access line switch system for memory cell sensing using negative voltage, the system, comprising:
a number of switches each having an input coupled to one of a number of input global access lines and having an output coupled to one of a corresponding number of output global access lines that are coupled to a corresponding number of local access lines of an array of memory cells;
wherein each of the number of switches includes an input for selectively receiving a target negative read voltage from a negative voltage generator; and
wherein the system is configured to apply the received target negative voltage to a selected local access line of the array of memory cells during a sensing operation.
13. The system of claim 12 , wherein the system is configured to open a path between the input coupled to a selected one of the number of input global access lines and the output coupled to a selected one of the corresponding number of output global access lines during the sensing operation such that the input coupled to the selected one of the number of input global access lines is insulated from the selectively received target negative read voltage.
14. The system of claim 12 , wherein the system includes a decoder that receives:
an address signal indicating a selected output global access line to receive the target negative voltage; and
an enable signal.
15. The system of claim 14 , wherein the enable signal is also provided to the negative voltage generator.
16. The system of claim 12 , wherein the number of switches include a level shifter that receives the target negative read voltage.
17. The system of claim 12 , wherein the number of switches include at least one depleted nmos transistor.