IP Library Granted Patent US 8,241,401
Granted Patent B2
US 8,241,401 · App. 12/917,875 · Granted Aug 14, 2012

Apparatus and method for producing purified hydrogen gas by a pressure swing adsorption processes

Assignees: Mitsubishi Polycrystalline Silicon America Corporation (MIPSA); Mitsubishi Materials Corporation
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Quick Facts
Patent No.
US 8,241,401
App. No.
12/917,875
Granted
Aug 14, 2012
Kind
B2
Abstract

The invention relates to a method and an apparatus for producing purified hydrogen gas by a pressure swing adsorption process. Further the invention relates to detecting an operating life of adsorbents in a adsorption tower. The method and the apparatus have a gas supply unit for adding an inert gas to an unpurified hydrogen gas and a detector for measuring an inert gas in a purified hydrogen gas discharged from the adsorption tower.

Claims (17)

1. A method for producing purified hydrogen gas by a pressure swing adsorption processes, comprising:

adding an inert gas to an unpurified hydrogen gas;

feeding the unpurified hydrogen gas into an adsorption tower and purifying by pressure swing adsorption; and

detecting the inert gas in the purified hydrogen gas discharged from the adsorption tower.

2. The method according to claim 1 , wherein the inert gas is Ar gas.

3. The method according to claim 2 , wherein Ar gas is detected in the range of about 0.15 to 0.35 wt %.

4. The method according to claim 2 , wherein Ar gas is detected under an adsorption tower pressure range of about 0.59 to 0.76 MPaG.

5. A method for producing polycrystalline silicon, which purifies hydrogen gas discharged from a reaction of depositing polycrystalline silicon and feeds the hydrogen gas back to the reaction, comprising:

depositing polycrystalline silicon on silicon seed rods by reacting trichlorosilane with hydrogen gas in a reactor;

separating an unpurified hydrogen gas by condensing a discharged gas from the reactor;

adding an inert gas to the unpurified hydrogen gas;

feeding the unpurified hydrogen gas into an adsorption tower and purifying by pressure swing adsorption; and

detecting the inert gas in the purified hydrogen gas discharged from the adsorption tower.

6. The method of claim 5 , further comprising returning some of the discharged purified hydrogen gas back to the adsorption tower for regenerating the adsorption tower.

7. The method according to claim 5 , wherein the inert gas is Ar gas.

8. The method according to claim 7 , wherein Ar gas is detected in the range of about 0.15 to 0.35 wt %.

9. The method according to claim 7 , wherein Ar gas is detected under an adsorption tower pressure range of about 0.59 to 0.76 MPaG.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 5, 2023
From: MITSUBISHI MATERIALS CORPORATION
To: HIGH-PURITY SILICON CORPORATION
Reel/Frame 063858/0867 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 2, 2010
From: KAMEI, TAKESHI; TAKIMOTO, YASUNARI
To: MITSUBISHI POLYCRYSTALLINE SILICON AMERICA CORPORATION (MIPSA); MITSUBISHI MATERIALS CORPORATION
Reel/Frame 025234/0916 →
Continuity (1)
Related Publication 20120107219A1 · May 3, 2012