IP Library Granted Patent US 8,264,846
Granted Patent B2
US 8,264,846 · App. 11/611,063 · Granted Sep 11, 2012

Ceramic package substrate with recessed device

Assignee: Intel Corporation
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Quick Facts
Patent No.
US 8,264,846
App. No.
11/611,063
Granted
Sep 11, 2012
Kind
B2
Abstract

A ceramic package substrate has a recess. This allows a device in that recess to be close to a die attached to the substrate's top side, for better performance. The device may be an array capacitor, an in-silicon voltage regulator, or another device or devices.

Claims (30)

1. A device, comprising:

a first integrated circuit die;

a package substrate, the package substrate including:

a top surface coupled to the first integrated circuit die;

a bottom surface;

multiple matrix layers comprising a ceramic material;

recess side walls extending up from the bottom surface of the package substrate and a recessed surface, the recess side walls and recessed surface defining a cavity in the bottom of the package substrate; and

electrically conductive traces and vias through the matrix layers, to provide an electrically conductive pathway from the top surface to the recessed surface in the cavity; and

a first electrical device in the cavity, the first electrical device chosen from the group consisting of an array capacitor, and an in-silicon voltage regulator, the first electrical device being electrically connected to the first integrated circuit die by at least some of the electrically conductive traces and vias.

2. The device of claim 1 , wherein the cavity has a center, the first integrated circuit die has a center, and the center of the cavity is approximately directly under the center of the first integrated circuit die.

3. The device of claim 1 , further comprising a printed circuit board adjacent the bottom surface of the package substrate, and electrically connected to the package substrate and to the first electrical device in the cavity.

4. The device of claim 1 , wherein the first electrical device in the cavity is an array capacitor.

5. The device of claim 4 , further comprising an in-silicon voltage regulator in the cavity.

6. The device of claim 5 , wherein the array capacitor is between the in-silicon voltage regulator and the recessed surface.

7. The device of claim 6 , wherein the array capacitor is electrically connected to the first integrated circuit die by conductors on a top surface of the array capacitor connected to conductors on the recessed surface, and the array capacitor is electrically connected to the in-silicon voltage regulator by conductors on a bottom surface of the array capacitor and conductors on a top surface of the in-silicon voltage regulator.

8. The device of claim 1 , further comprising a second electrical device in the cavity, the second electrical device chosen from the group consisting of an array capacitor, a capacitor, and an in-silicon voltage regulator, the second electrical device being laterally separated from the first electrical device rather than being stacked on top of or below the first electrical device.

9. The device of claim 1 , further comprising a second integrated circuit die coupled to the top surface of the package substrate.

10. The device of claim 9 , wherein the first and second integrated circuit dies are each a microprocessor die.

11. A semiconductor device, comprising:

a package substrate comprising a ceramic material and conductive traces in the ceramic material, the package substrate having a maximum thickness;

a first integrated circuit die electrically connected to a top surface of the package substrate; and

an array capacitor electrically coupled to the integrated circuit die by the package substrate and being a distance away from the integrated circuit die, the distance being less than the thickness of the package substrate; and

wherein the array capacitor is in a recess in a bottom of the package substrate, the recess defined by side walls and a top surface, the thickness between the top surface of the recess and the top surface of the package substrate being less than the maximum thickness of the package substrate.

12. The device of claim 11 , further comprising a printed circuit board adjacent the bottom surface of the package substrate, and a first set of conductive connectors to electrically connect the package substrate to the printed circuit board and a second set of conductive connectors to electrically connect the array capacitor to the printed circuit board.

13. The device of claim 12 , wherein the printed circuit board is a motherboard in a computer system.

14. The device of claim 13 , wherein package substrate and array capacitor are connected to the printed circuit board by a land grid array socket.

15. The device of claim 11 , wherein the array capacitor is substantially directly beneath the first integrated circuit die.

16. The device of claim 11 , further comprising an in-silicon voltage regulator in the recess adjacent the array capacitor.

17. The device of claim 11 , further comprising a second integrated circuit die electrically connected to the top surface of the package substrate, wherein both the first and second integrated circuit dies are microprocessor dies.

18. The device of claim 11 , further comprising an in-silicon voltage regulator in said recess wherein said in-silicon voltage regulator is electrically connected to said array capacitor by conductors on a bottom surface of said array capacitor and conductors on a top surface of said in-silicon voltage regulator.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 6, 2008
From: JONES, CHRISTOPHER C.; BACH, DAVID; LITT, TIMOTHE; BINDER, LARRY; RADHAKRISHNAN, KALADHAR; PALANDUZ, CENGIZ A.
To: INTEL CORPORATION
Reel/Frame 021799/0442 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 20, 2008
From: JONES, CHRISTOPHER C.; BACH, DAVID; LITT, TIMOTHE; BINDER, LARRY; RADHAKRISHNAN, KALADHAR; PALANDUZ, CENGIZ A.
To: INTEL CORPORATION
Reel/Frame 021419/0098 →
Continuity (1)
Related Publication 20080142961A1 · Jun 19, 2008