IP Library Granted Patent US 8,333,839
Granted Patent B2
US 8,333,839 · App. 11/965,235 · Granted Dec 18, 2012

Vapor deposition reactor

Assignee: Synos Technology, Inc.
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Quick Facts
Patent No.
US 8,333,839
App. No.
11/965,235
Granted
Dec 18, 2012
Kind
B2
Abstract

A vapor deposition reactor has a configuration where a substrate or a vapor deposition reactor moves in a non-contact state with each other to allow the substrate to pass by the reactor and an injection unit and an exhaust unit are installed as a basic module of the reactor for receiving a precursor or a reactant and for receiving and pumping a purge gas, respectively. With the use of a small-size inlet for the reactor, homogeneous film properties are obtained, the deposition efficiency of precursors is improved, and an amount of time required for a purge/pumping process can be reduced. In addition, since the reactor itself is configured to reflect each step of ALD, it does not need a valve. Moreover, the reactor makes it easier for users to apply remote plasma, use super high frequencies including microwave, and UV irradiation.

Claims (30)

1. A vapor deposition reactor being configured to make a substrate pass by the reactor through a relative motion between the substrate and the reactor in a non-contact state, comprising:

a first injection unit having a first space for receiving a precursor or a reactant and exposing the substrate to the precursor or reactant, the precursor or reactant is supplied to the first space through a precursor or reactant supply channel opening into the first space;

a first exhaust unit having a second space for receiving a purge gas and exposing the substrate to the purge gas, the purge gas is supplied to the second space through a purge gas supply channel opening into the second space, the first exhaust unit exhausting the precursor or reactant and the purge gas by pumping the precursor or reactant and the purge gas through an exhaust channel opening into the second space;

a second injection unit having a third space for receiving a reactant and exposing the substrate to the reactant, the reactant is supplied to the third space through a reactant supply channel opening into the third space; and

a second exhaust unit having a fourth space for receiving the purge gas and exposing the substrate to the purge gas through a purge gas supply channel opening into the fourth space, the second exhaust unit exhausting the reactant and the purge gas by pumping the reactant and the purge gas through an exhaust channel opening into the fourth space;

wherein the first injection unit, the first exhaust unit, the second injection unit and the second exhaust unit are arranged along a direction of the relative motion between the substrate and the reactor and include guard barriers to control the flow of the precursor, reactant, or purge gas between the first, second, third and fourth spaces; and

wherein deposition conditions are varied according to a pressure in the first injection unit and the second injection unit.

2. The vapor deposition reactor of claim 1 , wherein the relative motion of the substrate and the reactor is a linear motion.

3. The vapor deposition of claim 1 , wherein the relative motion of the substrate and the reactor is a rotational motion.

4. The vapor deposition reactor of claim 1 , wherein the precursor or reactant gas supply channels of the injection unit and the purge gas supply channel and exhaust channel of the exhaust unit are formed in the shape of a linear pipe having multiple perforated holes as inlets.

5. The vapor deposition reactor of claim 1 , wherein a portion of the first exhaust unit and a portion of the second exhaust unit are curved.

6. The vapor deposition reactor of claim 1 , wherein a relative speed of the substrate and the reactor becomes a vapor deposition parameter.

7. The vapor deposition reactor of claim 1 , wherein a spacing between the substrate and the reactor becomes a vapor deposition parameter.

8. The vapor deposition reactor of claim 1 , wherein a width of the injection unit or a width of the exhaust unit becomes a vapor deposition parameter.

9. The vapor deposition reactor of claim 1 , wherein each of the first injection unit and the second injection unit comprises a plurality of inlets.

10. The vapor deposition reactor of claim 9 , wherein the plurality of inlets are arranged in parallel or alternately in a line.

11. The vapor deposition reactor of claim 1 , further comprising:

a third injection unit having a fifth space for receiving the reactant, the reactant is supplied to the fifth space through a reactant supply channel opening into the fifth space; and

a third exhaust unit having a sixth space for receiving the purge gas, the purge gas is supplied to the sixth space through a purge gas supply channel opening into the sixth space, the third exhaust unit exhausting the reactant and the purge gas by pumping the reactant and the purge gas through an exhaust channel opening into the sixth space.

12. The vapor deposition reactor of claim 1 , further comprising:

a third injection unit having a fifth space for receiving the precursor, the precursor is supplied to the fifth space through a precursor supply channel opening into the fifth space; and

a third exhaust unit having a sixth space for receiving the purge gas, the purge gas is supplied to the sixth space through a purge gas supply channel opening into the sixth space, the third exhaust unit exhausting the reactant and the purge gas by pumping the precursor and the purge gas through an exhaust channel opening into the sixth space.

13. The vapor deposition reactor of claim 1 , comprising a plurality of reactor units, each reactor unit comprising the first injection unit, the first exhaust unit, the second injection unit and the second exhaust unit so that a plurality of atomic layers are deposited each time the substrate passes by the reactor for ALD.

14. The vapor deposition reactor according to anyone of claims 11 through 13 , further comprising a cooling or heating means provided inside the first injection unit or the second injection unit.

15. The vapor deposition reactor according to any of claims 11 through 13 , further comprising a UV irradiation means provided inside the injection unit.

16. The vapor deposition reactor according to any one of claims 11 through 13 , further comprising a plasma application means provided inside the first injection unit or the second injection unit.

17. The vapor deposition reactor according to any one of claims 11 through 13 , further comprising a microwave application means provided inside the first injection unit or the second injection unit.

18. The vapor deposition reactor according to claim 1 , wherein the first space is in gas communication with the second space and wherein the third space is in communication with the fourth space.

19. The vapor deposition reactor according to claim 11 , wherein the fifth space is in gas communication with the sixth space.

20. The vapor deposition reactor according to claim 12 , wherein the fifth space is in communication with the sixth space.

Assignments (5)
CHANGE OF NAME Recorded Nov 7, 2013
From: SYNOS TECHNOLOGY, INC.
To: VEECO ALD INC.
Reel/Frame 031599/0531 →
RELEASE OF SECURITY INTEREST Recorded Mar 29, 2012
From: NOVELLUS DEVELOPMENT COMPANY, LLC
To: SYNOS TECHNOLOGY, INC.
Reel/Frame 027956/0025 →
SECURITY AGREEMENT Recorded Sep 22, 2011
From: SYNOS TECHNOLOGY, INC.
To: NOVELLUS DEVELOPMENT COMPANY, LLC
Reel/Frame 026953/0453 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 8, 2008
From: WOOREE LST CO., LTD
To: SYNOS TECHNOLOGY, INC.
Reel/Frame 021647/0820 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 5, 2008
From: OH, JAE-EUNG
To: WOOREE LST CO., LTD.
Reel/Frame 021338/0636 →
Continuity (1)
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