IP Library › Granted Patent US 8,341,473
Granted Patent B2
US 8,341,473 · App. 13/242,906 · Granted Dec 25, 2012

Microprocessor and method for detecting faults therein

Assignee: The Regents of the University of Michigan
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Quick Facts
Patent No.
US 8,341,473
App. No.
13/242,906
Granted
Dec 25, 2012
Kind
B2
Abstract

A microprocessor has a silicon area comprising a plurality of transistors implemented on the silicon area and a fault detection circuit occupying less than 20% of the silicon area and configured to detect faults at runtime in at least 80% of the plurality of transistors.

Claims (3)

1. A microprocessor having a silicon area, comprising:

a plurality of transistors implemented on the silicon area; and

a fault detection unit operatively arranged with the plurality of transistors, occupying less than 20% of the silicon area, and configured to detect faults at runtime in at least 80% of the plurality of transistors based on run-time inspection of integrity of the plurality of transistors.

Assignments (1)
CONFIRMATORY LICENSE Recorded Dec 28, 2011
From: UNIVERSITY OF MICHIGAN
To: NATIONAL SCIENCE FOUNDATION
Reel/Frame 027456/0102 →
Continuity (3)
Division 13036276 · Feb 28, 2011
Division 12252861 · Oct 16, 2008
Related Publication 20120011422A1 · Jan 12, 2012