IP Library Granted Patent US 8,395,250
Granted Patent B2
US 8,395,250 · App. 12/676,526 · Granted Mar 12, 2013

Plasma processing apparatus with an exhaust port above the substrate

Inventors: Katsushi Kishimoto (Osaka, JP); Yusuke Fukuoka (Osaka, JP)
Assignee: Kabushiki Kaisha Sharp
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Quick Facts
Patent No.
US 8,395,250
App. No.
12/676,526
Granted
Mar 12, 2013
Kind
B2
Abstract

In a chamber of a plasma processing apparatus, a cathode electrode and an anode electrode are disposed at a distance from each other. The cathode electrode is supplied with electric power from an electric power supply portion. The anode electrode is electrically grounded and a substrate is placed thereon. The anode electrode contains a heater. In an upper wall portion of the chamber, an exhaust port is provided and connected to a vacuum pump through an exhaust pipe. In a lower wall portion of a wall surface of the chamber, a gas introduction port is provided. A gas supply portion is provided outside the chamber.

Claims (33)

1. A plasma processing apparatus in which an object to be subjected to plasma processing is loaded for subjecting the loaded object to plasma processing, comprising:

a chamber in which plasma processing is performed;

a parallel plate type cathode electrode and anode electrode disposed horizontally in said chamber such that respective discharge surfaces thereof are opposed to one another;

a holding assembly holding the object on said cathode electrode or said anode electrode;

an introduction port for supplying a gas for processing into a plasma generation space between said cathode electrode and said anode electrode where plasma is generated; and

a first exhaust port for exhausting gas from within said chamber, said first exhaust port being disposed in an upper wall portion of said chamber above a center of said anode electrode such that said gas supplied through said introduction port and flowing toward a side in said chamber from between said cathode electrode and said anode electrode can be exhausted in an upward direction.

2. The plasma processing apparatus according to claim 1 , wherein said holding assembly includes a stack holding assembly for holding a plurality of horizontally held substrates as objects stacked in a vertical direction.

3. The plasma processing apparatus according to claim 1 , further comprising:

a second exhaust port for exhausting gas within said chamber, wherein said second exhaust port is disposed in a lower wall portion of said chamber under a center of said anode electrode.

4. A plasma processing apparatus in which an object to be subjected to plasma processing is loaded for subjecting the loaded object to plasma processing, comprising:

a chamber in which plasma processing is performed;

a parallel plate type cathode electrode and anode electrode disposed horizontally in said chamber such that respective discharge portions thereof are opposed to one another;

a holding assembly for holding the object on said cathode electrode or said anode electrode;

an introduction port for supplying a gas for processing into a plasma generation space between said cathode electrode and said anode electrode where plasma is generated; and

an exhaust port for exhausting the gas within said chamber, a plurality of said cathode electrodes and a plurality of said anode electrodes being disposed in said chamber in a vertical direction, said exhaust port being disposed in an upper wall portion of said chamber above a center of said anode electrode such that said gas supplied through said introduction port and flowing toward a side in said chamber from between said cathode electrode and said anode electrode can be exhausted in an upward direction.

5. A plasma processing method for subjecting an object loaded in a chamber to plasma processing, comprising:

holding an object between a parallel plate type cathode electrode and anode electrode which are horizontally disposed in said chamber such that respective discharge surfaces thereof are opposed to one another;

supplying a gas between said cathode electrode and said anode electrode;

generating plasma in a plasma generation space between said cathode electrode and said anode electrode;

subjecting said object to plasma processing by exposing said object to said plasma; and

exhausting said gas supplied into said chamber and flowing toward a side in said chamber from between said cathode electrode and said anode electrode in an upward direction from a position in an upper wall portion of said chamber above a center of said anode electrode.

6. A plasma processing apparatus in which an object to be subjected to plasma processing is loaded for subjecting the loaded object to plasma processing to manufacture a semiconductor device, comprising:

a chamber in which plasma processing to manufacture a semiconductor device is performed;

a parallel plate type cathode electrode and anode electrode disposed horizontally in said chamber such that respective discharge surfaces thereof are opposed to one another;

a holding assembly holding the object on said cathode electrode or said anode electrode;

an introduction port for supplying a gas for processing into a plasma generation space between said cathode electrode and said anode electrode where plasma is generated; and

a first exhaust port for exhausting gas from within said chamber, said first exhaust port being disposed in an upper wall portion of said chamber above a center of said anode electrode such that said gas supplied through said introduction port and flowing toward a side in said chamber from between said cathode electrode and said anode electrode can be exhausted in an upward direction.

7. A plasma processing method for making a semiconductor device by subjecting an object loaded in a chamber to plasma processing to form a semiconductor device, comprising:

holding an object between a parallel plate type cathode electrode and anode electrode which are horizontally disposed in said chamber such that respective discharge surfaces thereof are opposed to one another;

supplying a gas between said cathode electrode and said anode electrode;

generating plasma in a plasma generation space between said cathode electrode and said anode electrode;

subjecting said object to plasma processing by exposing said object to said plasma; and

exhausting said gas supplied into said chamber and flowing toward a side in said chamber from between said cathode electrode and said anode electrode in an upward direction from a position in an upper wall portion of said chamber above a center of said anode electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 4, 2010
From: KISHIMOTO, KATSUSHI; FUKUOKA, YUSUKE
To: SHARP KABUSHIKI KAISHA
Reel/Frame 024030/0439 →
Priority Claims (1)
JP 2007-228802 · Sep 4, 2007 · national
Continuity (1)
Related Publication 20100193915A1 · Aug 5, 2010