All electric piezoelectric finger sensor (PEFS) for soft material stiffness measurement
A PEFS (Piezoelectric Finger Sensor) acts as an “electronic finger” capable of accurately and non-destructively measuring both the Young's compression modulus and shear modulus of tissues with gentle touches to the surface. The PEFS measures both the Young's compression modulus and shear modulus variations in tissue generating a less than one-millimeter spatial resolution up to a depth of several centimeters. This offers great potential for in-vivo early detection of diseases. A portable hand-held device is also disclosed. The PEF offers superior sensitivity.
1. A sensor system comprising:
a cantilever including:
a first piezoelectric layer, wherein a portion of said piezoelectric layer forms an exposed contact surface for contacting a sample and a second piezoelectric layer electrically separated from the first piezoelectric layer;
an apparatus for generating a force in said cantilever; and
a means for measuring a displacement of said piezoelectric layer resultant from said generated force and wherein said sensor is capable of simultaneously inducing a force in said cantilever and measuring a displacement of one said piezoelectric layer.
2. The sensor system of claim 1 , wherein the means for measuring a displacement of said piezoelectric layer comprises an apparatus for measuring a voltage, wherein the measured voltage is indicative of the displacement.
3. The sensor system of claim 1 , wherein the means for measuring a displacement of said piezoelectric layer is selected from the group consisting of: a laser and a piezoelectric displacement meter.
4. The sensor system of claim 1 , wherein said second piezoelectric layer comprises a portion that extends beyond the other piezoelectric layer and wherein said portion has a shape selected from the group consisting of: a substantially square-shaped configuration, a substantially L-shaped configuration, a substantially U-shaped configuration, a substantially O-shaped configuration and a tapered configuration.
5. The sensor system of claim 1 , wherein said second piezoelectric layer comprises a portion that extends beyond said first piezoelectric layer and wherein said portion is oriented at an angle greater than or less than 180 degrees with respect to said first piezoelectric layer.
6. The sensor system of claim 5 , wherein said portion is oriented at about a 90 degree angle with respect to a remainder of said second piezoelectric layer.
7. The sensor system of claim 1 , comprising two or more of said cantilevers, and wherein at least two of said cantilevers have different dimensions.
8. The sensor system of claim 7 , wherein the at least two cantilevers have different widths.
9. A sensor system comprising:
a cantilever including:
a first piezoelectric layer enabled to provide a force;
a second piezoelectric layer;
an apparatus for applying a voltage to said first piezoelectric layer to generate a force in said cantilever;
a means for measuring a displacement of said second piezoelectric layer resultant from said generated force and wherein a portion of a surface of at least one said piezoelectric layer forms an exposed surface portion for contacting a sample.
10. A sensor system as claimed in claim 9 , wherein said piezoelectric layers are the same length.
11. A sensor as claimed in claim 9 , wherein said first and second piezoelectric layers are electrically isolated from one another.
12. A method for determining a compression modulus of a substrate comprising the steps of;
applying a compressive force to the substrate via a sensor having a cantilever including a piezoelectric material, when said sensor is in contact with a substrate comprising a target;
detecting a displacement of the cantilever due to said compressive force;
determining a compression modulus of said substrate from said detected displacement.
13. The method of claim 12 , further comprising the step of determining a depth of a target located within the substrate.
14. The method of claim 12 , wherein the step of determining the compression modulus comprises determining the compression modulus at a plurality of different depths within the substrate.
15. The method of claim 12 , wherein said target is a tumor or tissue surrounding a tumor.
16. A method for determining a shear modulus of a substrate comprising the steps of;
applying a shear force to said substrate via a sensor having a cantilever including a piezoelectric material when said sensor is in contact with the substrate;
detecting a displacement of the cantilever due to said shear force; and
determining a shear modulus of said substrate from said detected displacement.
17. The method of claim 16 , wherein said substrate is a tumor or tissue surrounding a tumor.
18. The method of claim 17 , wherein a plurality of said sensors are employed in said method in an array and further comprising at least one step selected from the group consisting of: mapping a tumor, determining tumor stiffness and determining tumor mobility.