Multi charged particle beam writing apparatus and multi charged particle beam writing method

1. A multi charged particle beam writing apparatus, comprising:

a stage on which a target object is placed and which is continuously movable;

an emitting unit configured to emit charged particle beam;

an aperture member, in which a plurality of openings are formed, configured to receive irradiation of the charged particle beam on a region including all the plurality of openings, and to form multi-beams by making portions of the charged particle beam pass through the plurality of openings;

a plurality of blankers configured to perform blanking-deflect regarding beams corresponding to the multi-beams passing through the plurality of openings of the aperture member, respectively;

a blanking aperture member configured to shield each of the beams deflected by the plurality of blankers so that the beams deflected by the plurality of blankers are beam-off;

a deflector configured to deflect beams together, which have passed through the blanking aperture member, at each irradiation position of each beam on the target object;

a writing processing control unit configured to control writing processing with a plurality of beams having passed through different openings among the plurality of openings being irradiated on the target object at a predetermined control grid interval; and

a dose controlling unit configured to variably control each dose of the plurality of beams associated with a deviation of an interval between the plurality of beams irradiated, from the control grid interval according to a deviation amount of the interval between the plurality of beams irradiated when the interval between the plurality of beams irradiated is deviated from the control grid interval.

2. The apparatus according to claim 1 , further comprising:

a maximum dose computing unit configured to compute a maximum dose according to the deviation amount,

wherein the dose controlling unit variably controls the dose of the beam associated with the deviation with a dose in the maximum dose computed.

3. The apparatus according to claim 2 , wherein the maximum dose computing unit computes the maximum dose depending on a ratio between the control grid interval and the deviation amount.

4. The apparatus according to claim 2 , wherein the maximum dose computing unit computes the maximum dose of each beam passing through each opening of the plurality of openings of the aperture member.

5. The apparatus according to claim 2 , wherein the maximum dose Dmax is defined as Equation (1) below by using an overlapping amount Xor defined as a deviation amount when the interval of the beams irradiated is narrower than the control grid interval AU, and a maximum dose D 0 having been set in advance

D max={1−( X or/2 AU )}· D 0   (1).

6. The apparatus according to claim 2 , wherein the maximum dose of the dose of the beam associated with the deviation is smaller than a maximum dose of a dose of a beam which is not associated with the deviation.

7. The apparatus according to claim 2 , wherein at an intermediate position of neighboring beams associated with the deviation, the dose of the beam is controlled with a dose of one of the neighboring beams being zero and a dose of another one of the neighboring beams being the maximum dose of the another one of the neighboring beams.

8. The apparatus according to claim 7 , wherein the maximum dose of the dose of the beam associated with the deviation is smaller than a maximum dose of a dose of a beam which is not associated with the deviation.

9. The apparatus according to claim 8 , wherein the maximum dose Dmax is defined as Equation (1) below by using an overlapping amount Xor defined as a deviation amount when the interval of the beams irradiated is narrower than the control grid interval AU, and a maximum dose D 0 having been set in advance

D max={1−( X or/2 AU )}· D 0   (1).

10. A multi charged particle beam writing apparatus, comprising:

a stage on which a target object is placed and which is continuously movable;

an emitting means for emitting charged particle beam;

an aperture member, in which a plurality of openings are formed, configured to receive irradiation of the charged particle beam on a region including all the plurality of openings, and to form multi-beams by making portions of the charged particle beam pass through the plurality of openings;

a plurality of blankers configured to perform blanking-deflect regarding beams corresponding to the multi-beams passing through the plurality of openings of the aperture member, respectively;

a blanking aperture member configured to shield each of the beams deflected by the plurality of blankers so that the beams deflected by the plurality of blankers are beam-off;

a deflecting means for deflecting beams together, which have passed through the blanking aperture member, at each irradiation position of each beam on the target object;

a writing processing control means for controlling writing processing with a plurality of beams having passed through different openings among the plurality of openings being irradiated on the target object at a predetermined control grid interval; and

a dose controlling means for variably controlling each dose of the plurality of beams associated with a deviation of an interval between the plurality of beams irradiated, from the control grid interval according to a deviation amount of the interval between the plurality of beams irradiated when the interval between the plurality of beams irradiated is deviated from the control grid interval.