IP Library › Granted Patent US 8,968,838
Granted Patent B2
US 8,968,838 · App. 13/809,784 · Granted Mar 3, 2015

Plasma processing in a capacitively-coupled reactor with trapezoidal-waveform excitation

Inventors: Jean-Paul Booth (Boullay les Troux, FR); Erik Johnson (Paris, FR)
Assignees: Ecole Polytechnique; Centre National de la Recherche Scientifique
C23C16/509H01J37/32091H01J2237/3348
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Quick Facts
Patent No.
US 8,968,838
App. No.
13/809,784
Granted
Mar 3, 2015
Kind
B2
Abstract

A method is provided for exciting at least one electrode of a capacitively coupled reactive plasma reactor containing a substrate. The electrode is excited by applying a RF voltage with a trapezoidal waveform comprising a ramp-up, a high plateau, a ramp-down and a low plateau. The plasma density can be controlled by adjusting the duration of the ramp-up, the duration of the ramp-down, the amplitude and the repetition rate of the trapezoidal waveform. The ion energy distribution function at the substrate can be controlled by adjusting the amplitude and the relative duration between the high plateau and the low plateau of the trapezoidal waveform.

Claims (20)

1. A method for exciting at least one electrode of a capacitively coupled reactive plasma reactor containing a substrate, comprising:

the electrode is excited by applying a RF voltage with a trapezoidal waveform including sections of a ramp-up, a high plateau, a ramp-down, and a low plateau, each section having a predetermined time period, and

the plasma density and fluxes of ionic and neutral species to a substrate are controlled by adjusting the duration of the ramp-up and/or the duration of the ramp-down of the trapezoidal waveform,

wherein the duration of period of the trapezoidal waveform is between 10-1000 ns.

2. The method according to claim 1 , characterized in that the ion energy distribution function at the substrate is controlled by adjusting the relative duration between the high plateau and the low plateau of the trapezoidal waveform.

3. The method according to claim 1 , characterized in that the plasma density is further controlled by adjusting the repetition rate of the trapezoidal waveform.

4. The method according to claim 1 , characterized in that the plasma density and/or ion energy distribution function at the substrate is further controlled by adjusting the voltage amplitude of the trapezoidal waveform.

5. The method according to claim 1 , characterized in that growth of thin films on the substrate is adjusted between amorphous and nanocrystalline growth by applying the trapezoidal waveform and a complement of said trapezoidal waveform.

6. The method according to claim 1 , characterized in that the duration of the ramp-up and the duration of the ramp-down are between 1-10 ns.

7. The method according to claim 6 , characterized in that the duration of the ramp-up and the duration of the ramp-down are between 5-10 ns.

8. The method according to claim 1 , characterized in that the amplitude of the trapezoidal waveform is between 50-1000 v.

9. The method according to claim 1 , characterized in that the duration of a high plateau and a low plateau of the trapezoidal waveform are varied continuously or discretely in order to achieve, averaged over many periods, any arbitrary effective ion energy distribution function at the substrate, wherein decreasing a ratio of the duration of the high plateau relative to the duration of the low plateau increases the ion bombardment energy at the powered electrode or a substrate placed upon it, and lowers the ion energy at the grounded electrode; and increasing the ratio of the duration of the high plateau relative to the duration of the low plateau decreases the ion bombardment energy at the powered electrode or a substrate placed upon it, and increases the ion energy at the grounded electrode.

10. The method according to claim 1 , characterized in that the proportion at each electrode of DC sheath voltages between the plasma and electrodes is defined by a difference between a high plateau and a low plateau of the trapezoidal waveform, wherein decreasing a ratio of the duration of the high plateau relative to the duration of the low plateau increases the DC sheath voltage between the plasma and the powered electrode or a substrate placed upon it, and decreases DC sheath voltage between the plasma and grounded electrode; and increasing the ratio of the duration of the high plateau relative to the duration of the low plateau decreases the DC sheath voltage between the plasma and the powered electrode or a substrate placed upon it, and increases DC sheath voltage between the plasma and grounded electrode.

11. The method according to claim 1 , characterized in that the trapezoidal waveform at the electrode surface is obtained by using a corrective feedback of the RF voltage waveform.

12. The method according to claim 1 , characterized in that the substrate is on the powered electrode or on the unpowered electrode.

13. The method according to claim 1 , characterized in that the capacitively coupled reactive plasma reactor is a large-area symmetric plasma reactor.

14. A method for exciting at least one electrode of a capacitively coupled reactive plasma reactor containing a substrate, comprising:

the electrode is excited by applying a RF voltage with a trapezoidal waveform including sections of a ramp-up, a high plateau, a ramp-down, and a low plateau, each section having a predetermined time period, and

the plasma density and fluxes of ionic and neutral species to a substrate are controlled by adjusting the duration of the ramp-up and/or the duration of the ramp-down of the trapezoidal waveform,

wherein the duration of the ramp-up and the duration of the ramp-down are between 1-10 ns, and an overall time period of the trapezoidal waveform is between 20-100 ns.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 26, 2013
From: BOOTH, JEAN-PAUL; JOHNSON, ERIK
To: ECOLE POLYTECHNIQUE; CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
Reel/Frame 031082/0228 →
Priority Claims (1)
EP 10169735 · Jul 15, 2010 · regional
Continuity (1)
Related Publication 20130136872A1 · May 30, 2013