IP Library Granted Patent US 9,058,973
Granted Patent B2
US 9,058,973 · App. 13/085,970 · Granted Jun 16, 2015

Passive devices fabricated on glass substrates, methods of manufacture and design structures

Inventor: Anthony K. Stamper (Williston, VT)
Assignee: International Business Machines Corporation
H01L27/01H01L28/10H01L28/20H01L28/40H01L23/544H01L2223/54406H01L2223/54413H01L2223/54426H01L2223/54433H01L2924/0002
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Quick Facts
Patent No.
US 9,058,973
App. No.
13/085,970
Granted
Jun 16, 2015
Kind
B2
Abstract

Passive devices fabricated on glass substrates, methods of manufacture and design structures are provided. The method includes forming an opaque or semi-opaque layer on at least a first side of a glass substrate. The method further includes forming one or more passive devices on the opaque or semi-opaque layer on a second side of the glass substrate.

Claims (37)

1. A method comprising:

forming an opaque or semi-opaque layer on and directly contacting an entire a first side of a glass substrate; and

forming one or more passive devices over the opaque or semi-opaque layer on a second side of the glass substrate; and

entirely removing the opaque or semi-opaque layer from the first side of the glass substrate, prior to packaging,

wherein the one or more passive devices are formed by etching and deposition of material processes through the first side of the glass substrate, and further comprising:

forming a first crackstop in the second side of the glass substrate and on a first lateral side of the one or more passive devices; and

forming a second crackstop in the second side of the glass substrate and on a second lateral side of the one or more passive devices, wherein

the first crackstop is formed by:

forming a trench in the second side of the glass substrate; and

filling the trench with a polysilicon or metal;

the second crackstop is formed by:

forming a trench in the second side of the glass substrate; and

filling the trench until it is pinched thereby forming a void within the glass substrate,

the first crackstop and the second crackstop are different.

2. A method comprising:

forming an opaque or semi-opaque layer on and directly contacting an entire a first side of a glass substrate;

forming one or more passive devices over the opaque or semi-opaque layer on a second side of the glass substrate, wherein the one or more passive devices are formed by etching and deposition of material processes through the first side of the glass substrate;

forming a first crackstop in the second side of the glass substrate and on a first lateral side of the one or more passive devices;

forming a second crackstop in the second side of the glass substrate and on a second lateral side of the one or more passive devices, wherein the first crackstop and the second crackstop are different;

entirely removing the opaque or semi-opaque layer from the first side of the glass substrate, prior to packaging; and

roughening of the first side of the glass substrate and conformally filling the roughening with the opaque or semi-opaque layer.

3. The method of claim 2 , wherein the opaque or semi-opaque layer is a doped polysilicon to provide a conductor for electrostatic chucking and a metal formed directly on the glass substrate.

4. A method comprising:

forming an opaque layer on a backside of a glass substrate;

forming one or more passive devices directly through the frontside of the glass substrate;

entirely removing the opaque layer on the backside of the glass substrate prior to packaging,

forming a first crackstop in the frontside of the glass substrate and on a first lateral side of the one or more passive devices;

forming a second crackstop in the frontside of the glass substrate and on a second lateral side one or more passive devices;

forming another passive device on the first side of the glass substrate, adjacent to the first crackstop;

roughening of the backside of the glass substrate and conformally filling the roughening with the opaque layer wherein:

the first crackstop is formed by:

forming a trench in the frontside of the glass substrate; and

filling the trench with a polysilicon or metal;

the second crackstop is formed by:

forming a trench in the frontside of the glass substrate; and

filling the trench until it is pinched thereby forming a void within the glass substrate, and

the opaque layer is formed directly on the glass substrate.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded May 12, 2021
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES U.S. INC.
Reel/Frame 056987/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 20, 2020
From: WILMINGTON TRUST, NATIONAL ASSOCIATION
To: GLOBALFOUNDRIES INC.
Reel/Frame 054636/0001 →
SECURITY AGREEMENT Recorded Nov 29, 2018
From: GLOBALFOUNDRIES INC.
To: WILMINGTON TRUST, NATIONAL ASSOCIATION
Reel/Frame 049490/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 5, 2015
From: GLOBALFOUNDRIES U.S. 2 LLC; GLOBALFOUNDRIES U.S. INC.
To: GLOBALFOUNDRIES INC.
Reel/Frame 036779/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2015
From: INTERNATIONAL BUSINESS MACHINES CORPORATION
To: GLOBALFOUNDRIES U.S. 2 LLC
Reel/Frame 036550/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 14, 2011
From: STAMPER, ANTHONY K.
To: INTERNATIONAL BUSINESS MACHINES CORPORATION
Reel/Frame 026123/0938 →
Continuity (1)
Related Publication 20120261787A1 · Oct 18, 2012