IP Library Granted Patent US 9,606,567
Granted Patent B2
US 9,606,567 · App. 14/434,414 · Granted Mar 28, 2017

Method and apparatus for providing electrical isolation

Inventors: Thierry Sicard (Auzeville Tolosane, FR); Philippe Perruchoud (Tournefeuille, FR)
Assignee: NXP USA, Inc.
G05F5/00
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Quick Facts
Patent No.
US 9,606,567
App. No.
14/434,414
Granted
Mar 28, 2017
Kind
B2
Abstract

An isolation circuit arranged to provide electrical isolation between at least one control module and at least one driver module. The isolation circuit comprises at least one boost circuit arranged to receive at least one control signal from the at least one control module, and boost the at least one control signal from a first voltage level signal to an increased voltage level signal. The isolation circuit further comprising at least a first capacitive isolation component comprising a first electrically conductive element and at least one further electrically conductive element formed from at least a part of printed circuit board layer, the first and at least one further electrically conductive elements being electrically isolated with respect to one another and arranged to comprise capacitive characteristics there between.

Claims (42)

1. A high voltage device, the high voltage device comprising:

a high-voltage transistor having a first current terminal to be coupled to a high-voltage supply, a second current terminal to be coupled to a high voltage load, and a control terminal;

a driver module coupled to the control terminal of the high voltage transistor device;

an isolation circuit configured to provide electrical isolation to the driver module from a received control signal having a control voltage, the isolation circuit comprising:

a boost circuit, wherein the boost circuit is configured to receive the control signal at a control input and output a boosted control signal having a boosted control signal voltage, wherein the boosted control signal voltage is at least five times the control signal voltage;

a first capacitive isolation component formed in a printed circuit board with multiple layers, wherein the first capacitive isolation component comprises:

a first shielding dielectric layer;

a first conductive element layer having a first electrically conductive element;

an intermediate dielectric layer;

a second conductive element layer having a second electrically conductive element;

a second shielding dielectric layer

wherein

the first electrically conductive element and the second electrically conductive element are electrically isolated with respect to one another by the intermediate dielectric layer and positioned relative to each other to provide a capacitive coupling between the first electrically conductive element and the second electrically conductive element,

the first conductive element layer abuts the first shielding dielectric layer, and the second shielding dielectric layer abuts the second conductive element layer;

the first electrically conductive element of the first capacitive isolation component is coupled to the boost circuit to receive the boosted control signal from the boost circuit,

the second electrically conductive element of the first capacitive isolation component is operably coupled to a first input of the driver module to provide the boosted control signal to the driver module over the capacitive coupling, and

the driver module drives the control terminal of the high voltage transistor device according to the boosted control signal to drive the high voltage transistor device to provide a high voltage to the high voltage load, the high voltage an order of magnitude greater than the boosted control signal voltage.

2. The high voltage device of claim 1 , wherein the control signal comprises a pulsed control signal.

3. The high voltage device of claim 1 , wherein the control signal comprises an integrated circuit supply voltage level for a control module.

4. The high voltage device of claim 3 , wherein the control signal comprises a 5V voltage level.

5. The high voltage device of claim 1 , wherein the boost circuit boosts a rate of change of voltage.

6. The high voltage device of claim 5 , wherein the boost circuit provides a highest available rate of change of voltage to drive the first capacitive isolation component.

7. The high voltage device of claim 1 , wherein the boost circuit boosts the control signal to up to a 40V voltage level.

8. The high voltage device of claim 1 , wherein the isolation circuit comprises at least one further capacitive isolation component operably coupled between a ground plane and at least one further input of the at least one driver module, wherein the first and at least one further input of the at least one driver module comprise a differential input.

9. The high voltage device of claim 1 , wherein the boost circuit is arranged to output a differential boosted control signal, and the isolation circuit comprises the first capacitive isolation component and at least one further capacitive isolation component; wherein the first and at least one further capacitive isolation component are operably coupled between differential outputs of the boost circuit and differential inputs of the at least one driver module.

10. The high voltage device of claim 1 , wherein the electrically conductive elements of the first capacitive isolation component are formed from internal PCB layers.

11. The high voltage device of claim 1 , wherein each of the first and second electrically conductive elements of the first capacitive isolation component comprise an area of between 1 mm 2 to 0.2 mm 2 .

12. The high voltage device of claim 11 , wherein each of the first and second conductive elements of the first capacitive isolation component comprise an area of 1 mm 2 .

13. The high voltage device of claim 1 , wherein the driver module comprises a differential comparator.

14. The high voltage device of claim 1 , wherein a low voltage power rail for the differential comparator is coupled to an emitter junction of the high voltage transistor device, and a high voltage power rail for the differential comparator is coupled to the emitter junction of the high voltage transistor device.

15. A method comprising:

receiving a control signal at a boost circuit;

boosting the control signal from a first voltage level to an increased voltage level at the boost circuit to generate a boosted control signal, wherein the increased voltage level is at least five times the first voltage level;

providing the boosted control signal to a first electrically conductive element of a first capacitive isolation component formed in a printed circuit board having multiple lavers, wherein the first electrically conductive element is formed in a first conductive element layer of the printed circuit board;

receiving the boosted control signal at a second electrically conductive element of the first capacitive isolation component via a capacitive coupling with the first electrically conductive element, the second electrically conductive element separated from the first electrically conductive element by a dielectric layer of the printed circuit board, wherein the second electrically conductive element is formed in a second conductive element layer of the printed circuit board;

providing the boosted control signal to a driver module via the second electrically conductive element;

driving a control terminal of a high voltage transistor device with the driver module based on the boosted control signal to provide a high voltage, the high voltage an order of magnitude greater than the increased voltage level.

16. A method comprising:

receiving a boosted control signal at a first electrically conductive element of a first capacitive isolation component formed in a printed circuit board having multiple layers, wherein the first electrically conductive element is formed in a first conductive element layer of the printed circuit board, and the boosted control signal has a boosted control signal voltage at least five times a control signal voltage of a control signal;

receiving the boosted control signal at a second electrically conductive element of the first capacitive isolation component over a capacitive coupling with the first electrically conductive element, the second electrically conductive element separated from the first electrically conductive element by a dielectric layer of the printed circuit board, wherein the second electrically conductive element is formed in a second conductive element layer of the printed circuit board;

providing the boosted control signal to a driver module via the second electrically conductive element; and

driving a control terminal of a high voltage transistor device with the driver module based on the boosted control signal to provide a high voltage, the high voltage an order of magnitude greater than the boosted control signal voltage.

Assignments (24)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042985 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 042762 FRAME 0145. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051145/0184 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051030/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12298143 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Oct 22, 2019
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 051029/0387 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050745/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 039361 FRAME 0212. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042762/0145 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12681366 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded May 9, 2017
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 042985/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 12092129 PREVIOUSLY RECORDED ON REEL 038017 FRAME 0058. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY AGREEMENT SUPPLEMENT. Recorded Jul 14, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039361/0212 →
SUPPLEMENT TO THE SECURITY AGREEMENT Recorded Jun 16, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 039138/0001 →
SECURITY AGREEMENT SUPPLEMENT Recorded Mar 7, 2016
From: NXP B.V.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 038017/0058 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 20, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037565/0527 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 20, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037565/0510 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0859 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 6, 2015
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 036284/0363 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 6, 2015
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 036284/0105 →
SUPPLEMENT TO IP SECURITY AGREEMENT Recorded Aug 6, 2015
From: FREESCALE SEMICONDUCTOR, INC.
To: CITIBANK, N.A., AS NOTES COLLATERAL AGENT
Reel/Frame 036284/0339 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 9, 2015
From: SICARD, THIERRY; PERRUCHOUD, PHILIPPE
To: FREESCALE SEMICONDUCTOR INC
Reel/Frame 035365/0947 →
Priority Claims (1)
WO PCT/IB2012/002332 · Oct 10, 2012 · international
Continuity (1)
Related Publication 20150234415A1 · Aug 20, 2015