IP Library › Granted Patent US 9,640,384
Granted Patent B2
US 9,640,384 · App. 14/139,746 · Granted May 2, 2017

Substrate cleaning apparatus and substrate cleaning method

Inventor: Tomoatsu Ishibashi (Tokyo, JP)
Assignee: Ebara Corporation
H01L21/02057H01L21/67051
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Quick Facts
Patent No.
US 9,640,384
App. No.
14/139,746
Granted
May 2, 2017
Kind
B2
Abstract

A substrate cleaning apparatus includes: a substrate holder configured to hold and rotate a substrate; an ultrasonic cleaning unit configured to impart an ultrasonic vibration energy to deaerated pure water and then supply the deaerated pure water onto a surface of the substrate; a pure water spray nozzle configured to spray deaerated pure water onto the surface of the substrate; a chamber surrounding the substrate holder and the pure water spray nozzle; and an inert gas supply line configured to supply an inert gas into the chamber.

Claims (8)

1. A substrate cleaning method, comprising:

holding and rotating a substrate;

imparting an ultrasonic vibration energy to deaerated pure water and then supplying the deaerated pure water onto a surface of the substrate to form a film of the deaerated pure water on the surface of the substrate;

spraying a mist of deaerated pure water from at least one spray nozzle into an inert gas atmosphere to incorporate an inert gas into the mist of deaerated pure water; and

supplying the mist of deaerated pure water that has passed through the inert gas atmosphere onto the film of the deaerated pure water to increase a concentration of the inert gas dissolved in the film of the deaerated pure water, thereby cleaning the surface of the substrate with the film of the deaerated pure water having the increased concentration of the inert gas.

2. The substrate cleaning method according to claim 1 , wherein the deaerated pure water, to which the ultrasonic vibration energy has been imparted, is supplied at an angle which is larger than 0° and not more than 30° with respect to the surface of the substrate.

3. The substrate cleaning method according to claim 1 , wherein the concentration of the inert gas in the film of the deaerated pure water is increased to at least 1 ppm.

4. The substrate cleaning method according to claim 1 , wherein the deaerated pure water, to which the ultrasonic vibration energy has been imparted, is supplied from outside a peripheral edge of the substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 30, 2013
From: ISHIBASHI, TOMOATSU
To: EBARA CORPORATION
Reel/Frame 031859/0021 →
Priority Claims (1)
JP 2012-287120 · Dec 28, 2012 · national
Continuity (1)
Related Publication 20140182628A1 · Jul 3, 2014