Method for manufacturing mixed-dimension and void-free MRAM structure

1. A method for manufacturing a semiconductor structure, the method comprising:

providing a substrate;

forming an MRAM structure over the substrate;

forming a first dielectric layer over the MRAM structure;

forming a stop layer over the first dielectric layer;

forming a second dielectric layer over the stop layer; and

removing the second dielectric layer, the stop layer and at least a portion of the first dielectric layer through a CMP operation without exposing a top electrode of the MRAM structure.

2. The method of claim 1 , further comprising:

exposing the top electrode of the MRAM structure through a thinning operation.

3. The method of claim 2 , wherein the exposure of the top electrode of the MRAM structure through the thinning operation comprises:

exposing the top electrode of the MRAM structure through an etch operation.

4. The method of claim 1 , wherein the formation of the first dielectric layer over the MRAM structure comprises;

conformally forming a Tetraethyl Orthosilicate (TEOS) layer over the MRAM structure.

5. The method of claim 1 , wherein the formation of the first dielectric layer over the MRAM structure comprises;

conformally forming a high density plasma-oxide (HDP-oxide) layer over the MRAM structure.

6. The method of claim 1 , wherein the formation of the stop layer over the first dielectric layer comprises;

conformally forming a silicon nitride (SiN) layer over the first dielectric layer.

7. The method of claim 1 , wherein the formation of the second dielectric layer over the stop layer comprises;

conformally forming a un-doped Silicate Glass (USG) layer over the stop layer.

8. A method for manufacturing a semiconductor structure, the method comprising:

providing a substrate including an MRAM cell region and a logic region formed thereon;

forming an MRAM structure over the MRAM cell region, wherein a top surface of the MRAM structure is higher than a top surface of the logic region;

conformally forming a first dielectric layer over the MRAM structure and the logic region;

conformally forming a stop layer over the first dielectric layer;

conformally a second dielectric layer over the stop layer;

performing a planarization operation upon at least the second dielectric layer; and

stopping the planarization at a level of the stop layer over the logic region.

9. The method of claim 8 , wherein the formation of the first dielectric layer over the MRAM structure and the logic region comprises:

conformally forming the first dielectric layer over the MRAM structure and the logic region to allow a top surface of the first dielectric layer over the logic region is substantially higher than the top surface of the MRAM structure.

10. The method of claim 8 , further comprising:

exposing a top electrode of the MRAM structure through a thinning operation.

11. The method of claim 8 , wherein the performing of the planarization operation upon at least the second dielectric layer comprises:

performing a CMP operation upon at least the second dielectric layer.

12. The method of claim 10 , wherein the exposure of the top electrode of the MRAM structure through the thinning operation comprises:

exposing the top electrode of the MRAM structure through an etch operation.

13. The method of claim 8 , wherein the formation of the first dielectric layer over the MRAM structure and the logic region comprises;

conformally forming a Tetraethyl Orthosilicate (TEOS) layer over the MRAM structure and the logic region.

14. The method of claim 8 , wherein the formation of the first dielectric layer over the MRAM structure and the logic region comprises;

conformally forming a high density plasma-oxide (HDP-oxide) layer over the MRAM structure and the logic region.

15. A method for manufacturing a semiconductor structure, the method comprising:

providing a substrate including an MRAM cell region and a logic region formed thereon, wherein the logic region has a greater area than the MRAM cell region;

forming a first MRAM structure over the MRAM cell region, wherein a top surface of the first MRAM structure is higher than a top surface of the logic region;

forming a second MRAM structure over the MRAM cell region, wherein a top surface of the second MRAM structure is substantially level with the top surface of the first MRAM structure, and a width of the first MRAM structure is greater than a width of the second MRAM structure;

conformally forming a first dielectric layer over the first and second MRAM structures and the logic region to fill a gap between the first and second MRAM structures;

conformally forming a stop layer over the first dielectric layer;

conformally a second dielectric layer over the stop layer; and

performing a planarization operation upon at least the second dielectric layer according to an indication of the stop layer.

16. The method of claim 15 , wherein the formation of the first dielectric layer over the first and second MRAM structures and the logic region comprises:

conformally forming the first dielectric layer over the first and second MRAM structures and the logic region to allow a top surface of the first dielectric layer over the logic region is substantially higher than the top surfaces of the first and the second MRAM structure.

17. The method of claim 15 , further comprising:

exposing a top electrode of the first MRAM structure and a top electrode of the second MRAM structure through a thinning operation.

18. The method of claim 15 , wherein the performing of the planarization operation upon at least the second dielectric layer according to an indication of the stop layer comprises:

performing a CMP operation upon at least the second dielectric layer according to an indication of the stop layer over the logic region.

19. The method of claim 17 , wherein the exposure of the top electrode of the first MRAM structure and the top electrode of the second MRAM structure through the thinning operation comprises:

exposing the top electrode of the first MRAM structure and the top electrode of the second MRAM structure through an etch operation.

20. The method of claim 15 , wherein the formation of the first dielectric layer over the first and second MRAM structures and the logic region comprises:

conformally forming a Tetraethyl Orthosilicate (TEOS) layer over the first and second MRAM structures and the logic region.