IP Library Granted Patent US 9,799,542
Granted Patent B2
US 9,799,542 · App. 13/434,255 · Granted Oct 24, 2017

Substrate processing apparatus

Inventor: Eiichi Sugawara (Miyagi, JP)
Assignee: TOKYO ELECTRON LIMITED
H01L21/67346H01L21/681H01L21/68728H01L21/68742H01L21/67748
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Quick Facts
Patent No.
US 9,799,542
App. No.
13/434,255
Granted
Oct 24, 2017
Kind
B2
Abstract

Provided is a substrate processing apparatus, including: transportation chamber maintained in an atmospheric environment where a substrate is transported; a vacuum processing chamber connected with the transportation chamber through a load lock chamber; a substrate placing table installed in the vacuum processing chamber and having a body part and a surface part that is attachable to/detachable from the body part; a storage unit installed in the load lock chamber or the transportation chamber and configured to receive the surface part; and a transportation mechanism configured to transport the substrate from the transportation chamber to the vacuum processing chamber through the load lock chamber and transport the surface part between the storage unit and the body part of the vacuum processing chamber.

Claims (19)

1. A substrate processing apparatus, comprising:

a transportation chamber maintained in an atmospheric environment where a substrate is transported;

a vacuum processing chamber connected with the transportation chamber through a load lock chamber to perform a vacuum processing of the substrate;

a substrate placing table installed in the vacuum processing chamber and having a body part and a surface part that is attachable to/detachable from the body part, the surface part including an electrostatic chuck for adsorbing the substrate and a focus ring for surrounding an outer periphery of the substrate and controlling a state of plasma;

a storage unit installed in the load lock chamber or the transportation chamber and configured to receive the surface part,

wherein the storage unit includes:

a plurality of racks configured to stack and support each of a plurality of electrostatic chucks and a plurality of focus rings, and

a holding unit installed below and spaced apart from the plurality of racks and configured to hold a target transport body including the substrate, the electrostatic chuck, and the focus ring, the holding unit including a plurality of holes placed in a circumferential direction of the holding unit and a plurality of support pins respectively installed in the plurality of holes, the plurality of support pins selectively supporting one of the substrate, the electrostatic chuck, and the focus ring, and the plurality of support pins being configured to be elevatable by a driving mechanism;

wherein the plurality of holes includes a plurality of first holes, a plurality of second holes placed more inward on the holding unit than the plurality of first holes, and a plurality of third holes placed more outward on the holding unit than the plurality of first holes, and

the plurality of support pins includes a plurality of first support pins installed in the plurality of first holes respectively and configured to support a rear surface of the electrostatic chuck, a plurality of second support pins installed in the plurality of second holes respectively and configured to support a rear surface of the substrate, and a plurality of third support pins installed in the plurality of third holes respectively and configured to support a rear surface of the focus ring;

an alignment mechanism configured to align the electrostatic chuck and the focus ring before transporting the electrostatic chuck and the focus ring to the holding unit in order to place the focus ring at a predetermined position of the electrostatic chuck; and

a transportation mechanism configured to transport the substrate from the transportation chamber to the vacuum processing chamber through the load lock chamber and transport the surface part between the holding unit of the storage unit and the body part of the vacuum processing chamber and transport the electrostatic chuck and the focus ring between the holding unit of the storage unit and the alignment mechanism.

2. The substrate processing apparatus of claim 1 , wherein a vacuum transportation chamber in a vacuum state interposed between the load lock chamber and the vacuum processing chamber is installed.

3. The substrate processing apparatus of claim 1 , wherein the surface part has a placement surface where the substrate is placed,

the transportation mechanism transports the substrate from the storage unit to a vacuum processing chamber while placing the substrate in the surface part.

4. The substrate processing apparatus of claim 3 , wherein the alignment mechanism is configured to align the surface part and the substrate before transporting the surface part and the substrate to the holding unit in order to place the substrate at a predetermined position of the placement surface.

5. The substrate processing apparatus of claim 1 , wherein the vacuum processing chamber is used to plasma-process the substrate.

6. The substrate processing apparatus of claim 1 , wherein one side wall of the storage unit is configured to be transparent.

7. The substrate processing apparatus of claim 1 , wherein one side wall of the storage unit is configured to be attachable/detachable.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 12, 2012
From: SUGAWARA, EIICHI
To: TOKYO ELECTRON LIMITED
Reel/Frame 028037/0192 →
Priority Claims (1)
JP 2011-079859 · Mar 31, 2011 · national
Continuity (2)
Provisional Application 61477639 · Apr 21, 2011
Related Publication 20120247671A1 · Oct 4, 2012