Metal oxide film and method for forming metal oxide film
A metal oxide film including a crystal part and having highly stable physical properties is provided. The size of the crystal part is less than or equal to 10 nm, which allows the observation of circumferentially arranged spots in a nanobeam electron diffraction pattern of the cross section of the metal oxide film when the measurement area is greater than or equal to 5 nmφ and less than or equal to 10 nmφ.
1. An oxide semiconductor film including crystals,
wherein a first plurality of circumferentially distributed spots are observable in a measurement area greater than or equal to an area with a diameter of 5 nmφ and less than or equal to an area with a diameter of 10 nmφ in a nanobeam electron diffraction pattern of a cross-section of the oxide semiconductor film,
wherein there is no difference between the first plurality of circumferentially distributed spots and a second plurality of circumferentially distributed spots which are observable in a nanobeam electron diffraction of a cross-section in which a measurement area is 5 nmφ or more and 10 nmφ or less with respect to the same oxide semiconductor film including the crystals after being irradiated with an electron beam whose beam diameter is converged to about 1 nmφ for one minute,
wherein an acceleration voltage for the electron beam is 200 kV, and
wherein a crystalline peak is not observable in an XRD spectrum with respect to the oxide semiconductor film.
2. The oxide semiconductor film according to claim 1 , wherein the oxide semiconductor film comprises one of indium, gallium, and zinc.
3. The oxide semiconductor film according to claim 1 , wherein a halo pattern is observable in a selected-area electron diffraction pattern of a plane using a transmission electron microscope where a diameter of an electron beam is 300 nmφ or more.
4. The oxide semiconductor film according to claim 1 , wherein the oxide semiconductor film further comprises an amorphous part.
5. An oxide semiconductor film including crystals,
wherein size of one of the crystals is less than or equal to 10 nm,
wherein a first plurality of circumferentially distributed spots are observable in a measurement area greater than or equal to an area with a diameter of 5 nmφ and less than or equal to an area with a diameter of 10 nmφ in a nanobeam electron diffraction pattern of a cross-section of the oxide semiconductor film,
wherein there is no difference between the first plurality of circumferentially distributed spots and a second plurality of circumferentially distributed spots which are observable in a nanobeam electron diffraction of a cross-section in which a measurement area is 5 nmφ or more and 10 nmφ or less with respect to the same oxide semiconductor film including the crystals after being irradiated with an electron beam whose beam diameter is converged to about 1 nmφ for one minute,
wherein an acceleration voltage for the electron beam is 200 kV, and
wherein a crystalline peak is not observable in an XRD spectrum with respect to the oxide semiconductor film.
6. The oxide semiconductor film according to claim 5 , wherein the oxide semiconductor film comprises one of indium, gallium, and zinc.
7. The oxide semiconductor film according to claim 5 , wherein a halo pattern is observable in a selected-area electron diffraction pattern of a plane using a transmission electron microscope where a diameter of an electron beam is 300 nmφ or more.
8. The oxide semiconductor film according to claim 5 , wherein the oxide semiconductor film further comprises an amorphous part.
9. An oxide semiconductor film including crystals,
wherein a first plurality of circumferentially distributed spots are observable in a measurement area greater than or equal to an area with a diameter of 5 nmφ and less than or equal to an area with a diameter of 10 nmφ in a nanobeam electron diffraction pattern of a cross-section of the oxide semiconductor film,
wherein spots having order of regularity that represents a crystal state in which crystals are aligned with a specific plane are observable in a nanobeam electron diffraction of a cross-section in which a diameter of an electron beam is converged to about 1 nmφ in a cross-sectional direction of the measurement area of a film thinned from the oxide semiconductor film to be less than or equal to 10 nm,
wherein there is no difference between the first plurality of circumferentially distributed spots and a second plurality of circumferentially distributed spots which are observable in a nanobeam electron diffraction of a cross-section in which a measurement area is 5 nmφ or more and 10 nmφ or less with respect to the same oxide semiconductor film including the crystals after being irradiated with an electron beam whose beam diameter is converged to about 1 nmφ for one minute, and
wherein an acceleration voltage for the electron beam is 200 kV, and
wherein a crystalline peak is not observable in an XRD spectrum with respect to the oxide semiconductor film.
10. The oxide semiconductor film according to claim 9 , wherein the oxide semiconductor film comprises one of indium, gallium, and zinc.
11. The oxide semiconductor film according to claim 9 , wherein size of one of the crystals is less than or equal to 10 nm.
12. The oxide semiconductor film according to claim 9 , wherein a halo pattern is observable in a selected-area electron diffraction pattern of plane using a transmission electron microscope where a diameter of an electron beam is 300 nmφ or more.
13. The oxide semiconductor film according to claim 9 , wherein the oxide semiconductor film further comprises an amorphous part.