Semiconductor bonding with compliant resin and utilizing hydrogen implantation for transfer-wafer removal

1. A method of bonding a chip to a target substrate, the method comprising:

forming a compliant layer on a surface of a transfer substrate;

forming a pit in the compliant layer by removing a portion of the compliant layer, the pit having a first depth from a surface of the compliant layer and a width, the first depth being less than a thickness of the chip, and the first width being greater than a width of the chip;

securing the chip to a bottom of the pit, such that a portion of the chip protrudes above the surface of the compliant layer and there is a gap between a sidewall of the chip and a sidewall of the pit;

forming a photoresist layer on the surface of the compliant layer, wherein the photoresist layer fills the gap between the sidewall of the chip and the sidewall of the pit;

removing the portion of the chip that protrudes above the surface of the compliant layer;

aligning the transfer substrate with the target substrate;

bonding the chip to the target substrate while applying a pressure on the transfer substrate against the target substrate through the compliant layer;

removing the transfer substrate from the compliant layer; and

removing the compliant layer.

2. The method of claim 1 , wherein the compliant layer comprises a resin.

3. The method of claim 1 , wherein the compliant layer has a thickness ranging from about 10 microns to about 40 microns.

4. The method of claim 1 , wherein:

the transfer substrate comprises silicon;

the target substrate comprises silicon; and

the chip comprises a III-V semiconductor material.

5. The method of claim 1 , wherein the transfer substrate is opaque to light in a wavelength range from 200 nm to 400 nm.

6. The method of claim 1 , further comprising:

before forming the compliant layer, forming an implant region in the transfer substrate;

wherein removing the transfer substrate from the compliant layer comprises fracturing the transfer substrate at the implant region.

7. The method of claim 1 , further comprising forming a first bond pad on a surface of the chip after removing the portion of the chip that protrudes above the surface of the compliant layer and before bonding the chip to the target substrate.

8. The method of claim 7 , wherein the first bond pad is formed on the surface of the chip using photolithography.

9. The method of claim 7 , wherein the target substrate comprises:

a second bond pad on a surface of the target substrate;

wherein the chip is bonded to the target substrate via a bond material disposed between the first bond pad and the second bond pad.

10. A method of bonding a chip to a target substrate, the method comprising:

forming an implant region in a transfer substrate, the implant region being at a first depth from a surface of the transfer substrate;

forming a compliant layer on the surface of the transfer substrate;

securing the chip to the compliant layer, wherein a portion of the chip extends above a surface of the compliant layer;

removing the portion of the chip that extends above the surface of the compliant layer;

aligning the transfer substrate with the target substrate;

bonding the chip to the target substrate while applying a pressure on the transfer substrate against the target substrate through the compliant layer;

removing the transfer substrate from the compliant layer by fracturing the transfer substrate at the implant region; and

removing the compliant layer.

11. The method of claim 10 , wherein:

securing the chip to the compliant material further comprises forming a pit in the compliant layer by removing a portion of the compliant layer, the pit having a depth from the surface of the compliant layer and a width, the depth of the pit being less than a thickness of the chip; and

the chip is secured to a bottom of the pit.

12. The method of claim 11 , wherein:

the first width of the pit is greater than a width of the chip such that there is a gap between a sidewall of the chip and a sidewall of the pit after the chip is secured to the bottom of the pit; and

removing the portion of the chip that extends above the surface of the compliant layer comprises:

forming a photoresist layer on the surface of the compliant layer, the photoresist layer filling the gap between the sidewall of the chip and the sidewall of the pit; and

performing photolithography to remove the portion of the chip that extends above the surface of the compliant layer.

13. The method of claim 10 , wherein the compliant layer comprises a resin.

14. The method of claim 10 , wherein the compliant layer has a thickness ranging from about 10 microns to about 40 microns.

15. The method of claim 10 , the transfer substrate is opaque to light in a wavelength range from 200 nm to 400 nm.

16. The method of claim 10 , wherein:

the transfer substrate is silicon; and

the target substrate is silicon.

17. A transfer structure for bonding a chip to a target substrate, the transfer structure comprising:

a transfer substrate having an implant region at a first depth from a surface of the transfer substrate;

the chip; and

a compliant layer formed on the surface of the transfer substrate, wherein:

the compliant layer defines a pit;

the chip is secured to a bottom of the pit;

the pit has a depth from a surface of the compliant layer and a width;

the depth of the pit is less than a thickness of the chip so that the chip extends above the surface of the compliant layer;

the width of the pit is greater than a width of the chip so that there is a gap between a sidewall of the pit and a sidewall of the chip; and

the gap between the sidewall of the pit and the sidewall of the chip is filled by a photoresist material.

18. The transfer structure of claim 17 , wherein:

the compliant layer comprises a resin;

the chip comprises III-V material; and

the transfer substrate comprises silicon.

19. The transfer structure of claim 17 wherein the compliant layer has a thickness ranging from about 10 microns to about 40 microns.

20. The transfer structure of claim 17 , wherein the transfer substrate is opaque to light in a wavelength range from 200 nm to 400 nm.