Granted Patent
Utility
US 6,779,139
· Confirmation No. 2365
CIRCUIT FOR REDUCING TEST TIME AND SEMICONDUCTOR MEMORY DEVICE INCLUDING THE CIRCUIT
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⬇ PDF
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Code | Description | Pages | ||
|---|---|---|---|---|---|
| 2004-06-29 | IFEE |
Issue Fee Payment (PTO-85B) | 1 | View | |
| 2001-05-01 | TRNA |
Transmittal of New Application | 2 | View | |
| 2001-05-01 | SPEC |
Specification | 28 | View | |
| 2001-05-01 | CLM |
Claims | 5 | View | |
| 2001-05-01 | ABST |
Abstract | 1 | View | |
| 2001-05-01 | DRW |
Drawings-only black and white line drawings | 25 | View | |
| 2001-05-01 | OATH |
Oath or Declaration filed | 4 | View |
Inventors
Attorneys & Agents of Record
Classification
USPC
714/718
Prosecution
- Examiner
- CHUNG, PHUNG M
- Art Unit
- 2133
- Customer No.
- 20277
- Docket No.
- 57454-103
- Confirmation No.
- 2365
Foreign Priority
2000-337612(P)
·
2000-11-06
·
JAPAN
Publication
- Pub. No.
- US20020056061A1
- Pub. Date
- 2002-05-09
Patent Term Adjustment
0days
No related applications found.
CHANGE OF ADDRESS
Recorded 2017-11-29
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2004-04-07
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2003-09-10
ASSIGNMENT OF ASSIGNOR'S INTEREST
Recorded 2001-05-01
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Quick Facts
- Patent No.
- US 6,779,139
- App. No.
- 09/845,494
- Filed
- 2001-05-01
- Granted
- 2004-08-17
- Pub. No.
- US20020056061A1
- Examiner
- CHUNG, PHUNG M
- Art Unit
- 2133
- PTA
- 0 days
External Links