IP Library Granted Patent US 7,031,191
Granted Patent B2
US 7,031,191 · App. 10/748,701 · Granted Apr 18, 2006

Stabilization method for drain voltage in non-volatile multi-level memory cells and related memory device

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,031,191
App. No.
10/748,701
Granted
Apr 18, 2006
Kind
B2
Abstract

A method and an electronic device for stabilizing the voltage on the drain terminals of multi-level non-volatile memory cells during programming thereof. The voltage is provided by a drain voltage regulator having an output connected to the drain terminals at a common circuit node by a metal line conduction path having a parasitic intrinsic resistance. A feedback path is advantageously provided between the common circuit node and an input of the regulator.

Claims (27)

1. A method for programming an electronic memory device comprising a plurality of non-volatile memory cells each having a conduction terminal associated therewith, a voltage regulator having at least one input and an output, and a conductor having a first end connected to the output of the voltage regulator and a second end connected to a common circuit node also connected to each of the conduction terminals, the method comprising:

outputting a first voltage from the output of the voltage regulator to the first end of the conductor, the conductor having a parasitic intrinsic resistance associated therewith; and

feeding back a second voltage from the common circuit node along a feedback path to the at least one input of the voltage regulator.

2. The method of claim 1 wherein the feedback path comprises a resistor and also has a parasitic feedback path resistance associated therewith.

3. The method of claim 1 wherein the at least one input comprises an inverting input and a non-inverting input, wherein the feedback path is connected to the inverting input, and wherein the non-inverting input is connected to a reference voltage.

4. The method of claim 1 further comprising buffering the first voltage between the output of the voltage regulator and the common circuit node.

5. The method of claim 1 wherein the non-volatile memory cells comprise multi-level non-volatile memory cells.

6. The method of claim 1 wherein the conductor comprises a metal line.

7. A method for supplying power to a load from among a plurality of loads each connected to a conductor having first and second ends, the method comprising:

applying a first voltage to the first end of the conductor using a voltage regulator, the voltage regulator having at least one input and an output and being connected to the first end of the conductor at the output, and the conductor having at least one routing resistance associated therewith; and

feeding back a second voltage from the second end of the conductor along a feedback path to the at least one input of the voltage regulator.

8. The method of claim 7 wherein the loads are spaced apart along the conductor, and wherein the at least one routing resistance comprises a plurality of routing resistances each associated with a respective load.

9. The method of claim 7 wherein the feedback path has a parasitic resistance associated therewith.

10. The method of claim 7 wherein the conductor comprises a metal line.

11. An electronic memory device comprising:

a programming circuit having at least one input and an output;

a plurality of non-volatile memory cells each having a conduction terminal associated therewith;

a conductor having a first end connected to the output of said programming circuit and a second end connected to a common circuit node, the common circuit node also being connected to each of the conduction terminals, the conductor having a parasitic intrinsic resistance associated therewith; and

a feedback path connected between the common circuit node and the at least one input of said programming circuit.

12. The electronic memory device of claim 11 wherein said programming circuit comprises a voltage regulator.

13. The electronic memory device of claim 11 wherein said feedback path comprises a resistor and also has a parasitic feedback path resistance associated therewith.

14. The electronic memory device of claim 11 wherein the at least one input comprises an inverting input and a non-inverting input, wherein said feedback path is connected to the inverting input, and wherein the non-inverting input is connected to a reference voltage.

15. The electronic memory device of claim 11 further comprising a buffer connected to the output of said programming circuit.

16. The electronic memory device of claim 11 wherein said non-volatile memory cells comprise multi-level non-volatile memory cells.

17. The electronic memory device of claim 11 wherein said conductor comprises a metal line.

18. The electronic memory device of claim 11 wherein each memory cell comprises at least one floating gate transistor having a source terminal, a drain terminal, and a gate terminal, and wherein the drain terminal of each floating gate transistor is connected to the common circuit node.

19. The electronic memory device of claim 11 wherein said programming circuit, said non-volatile memory cells, said conductor, and said feedback path are implemented in a semiconductor device.

Assignments (11)
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →
RELEASE OF SECURITY INTEREST Recorded Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050937/0001 →
RELEASE OF SECURITY INTEREST Recorded Aug 23, 2018
From: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 047243/0001 →
SECURITY INTEREST Recorded Jul 13, 2018
From: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 047540/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REPLACE ERRONEOUSLY FILED PATENT #7358718 WITH THE CORRECT PATENT #7358178 PREVIOUSLY RECORDED ON REEL 038669 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Jun 8, 2017
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 043079/0001 →
PATENT SECURITY AGREEMENT Recorded Jun 2, 2016
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 038954/0001 →
SECURITY INTEREST Recorded May 12, 2016
From: MICRON TECHNOLOGY, INC.
To: U.S. BANK NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 038669/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2014
From: STMICROELECTRONICS S.R.L.
To: STMICROELECTRONICS NV
Reel/Frame 032146/0367 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 31, 2014
From: STMICROELECTRONICS NV
To: NUMONYX BV
Reel/Frame 032148/0068 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 18, 2011
From: NUMONYX B.V.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 027075/0682 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 18, 2004
From: CRIPPA, LUCA; RAGONE, GIANCARLO
To: STMICROELECTRONICS S.R.L.
Reel/Frame 015484/0994 →