Integrated circuit embodying a non-volatile memory cell
An integrated circuit is provided including at least one memory cell. Such memory cell, in turn, includes a transistor and a capacitor. The transistor includes a source, a drain, and a gate. Further, the capacitor includes a well and a gate. The gate of the transistor remains in communication with the gate of the capacitor. In various other embodiments, the memory cell includes a transistor and a capacitor including wells of differing types (e.g. P-type, N-type). In such embodiments, the well of the transistor abuts the well of the capacitor. In still further embodiments, for a more compact design, a diffusion region of the transistor is situated less than 2.5 μm from a diffusion region of the capacitor.
1 . An integrated circuit, comprising:
a memory cell including:
a transistor including a source, a drain, and a gate, and
a capacitor including at least one well and a gate;
wherein the gate of the transistor is in communication with the gate of the capacitor.
2 . The integrated circuit as recited in claim 1 , wherein the transistor includes a substrate.
3 . The integrated circuit as recited in claim 1 , wherein the transistor is an NMOS transistor.
4 . The integrated circuit as recited in claim 1 , wherein the gate of the transistor is a floating gate.
5 . The integrated circuit as recited in claim 1 , wherein at least one diffusion region is formed in the well.
6 . The integrated circuit as recited in claim 5 , wherein the at least one diffusion region is an N+-type diffusion region, and the well is an N-well.
7 . The integrated circuit as recited in claim 5 , wherein the at least one diffusion region operates as a control gate of the memory cell.
8 . The integrated circuit as recited in claim 1 , wherein the capacitor includes a diffusion region formed in the well, and the diffusion region and the well are doped with the same dopant type, where the diffusion region is more heavily doped than the well.
9 . The integrated circuit as recited in claim 1 , wherein the gate of the capacitor is positioned, at least in part, above the well of the capacitor.
10 . The integrated circuit as recited in claim 1 , wherein the memory cell is rewritable.
11 . The integrated circuit as recited in claim 10 , wherein the rewritable memory cell is included in an array of memory cells.
12 . The integrated circuit as recited in claim 1 , wherein the integrated circuit includes arrays of memory cells of different types.
13 . The integrated circuit as recited in claim 1 , wherein a plurality of the memory cells is included in an array of memory cells, where each of the memory cells is connected to a separate source line.
14 . The integrated circuit as recited in claim 1 , wherein a plurality of the memory cells is included in an array of memory cells, where at least a subset of the memory cells share a common source line.
15 . The integrated circuit as recited in claim 1 , wherein a plurality of the memory cells is included in an array of memory cells, where at least a subset of the memory cells has a virtual ground.
16 . The integrated circuit as recited in claim 1 , wherein the memory cell has a single metal layer.
17 . The integrated circuit as recited in claim 1 , wherein the memory cell has a single piece of polysilicon material.
18 . The integrated circuit as recited in claim 1 , wherein the memory cell is an Electrically Erasable Programmable Read-Only Memory (EEPROM) cell.
19 . The integrated circuit as recited in claim 1 , wherein a plurality of the memory cells is included in a three-dimensional array having more than one level of the word lines and/or more than one level of the bit lines.
20 . The integrated circuit as recited in claim 19 , wherein the more than one level of bit lines and/or more than one level of word lines are monolithically formed above a substrate in a monolithic three-dimensional memory array.
21 . The integrated circuit as recited in claim 20 , wherein the substrate comprises monocrystalline silicon.
22 . An integrated circuit, comprising:
a memory cell including:
a transistor including a well of a first type, and
a capacitor including a well of a second type;
wherein the well of the transistor abuts the well of the capacitor.
23 . The integrated circuit as recited in claim 22 , wherein the well of the first type is a P-well.
24 . The integrated circuit as recited in claim 23 , wherein the well of the second type is an N-well.
25 . An integrated circuit, comprising:
a memory cell including:
a transistor including at least one diffusion region, and
a capacitor including at least one diffusion region;
wherein the diffusion region of the transistor is situated less than 2.5 μm from the diffusion region of the capacitor.
26 . The integrated circuit as recited in claim 25 , wherein the transistor includes a pair of the diffusion regions defining a source and a drain.
27 . The integrated circuit as recited in claim 25 , wherein the diffusion region of the transistor is situated less than 2.0 μm from the diffusion region of the capacitor.
28 . The integrated circuit as recited in claim 27 , wherein the diffusion region of the transistor is situated less than 1.5 μm from the diffusion region of the capacitor.
29 . The integrated circuit as recited in claim 25 , wherein the memory cell is constructed utilizing 0.15 μm technology.
30 . (canceled)