Integrated circuit package in package system
View Patent ↗An integrated circuit package in package system including forming a base integrated circuit package with a base lead having a portion with a substantially planar base surface, forming an extended-lead integrated circuit package with an extended lead having a portion with a substantially planar lead-end surface, and stacking the extended-lead integrated circuit package over the base integrated circuit package with the substantially planar lead-end surface coplanar with the substantially planar base surface.
1. A method for manufacturing an integrated circuit package in package system comprising:
forming a base integrated circuit package with a base lead substantially coplanar with a base die paddle and having a portion with a substantially planar base surface;
forming an extended-lead integrated circuit package with an extended lead having a portion with a substantially planar lead-end surface;
attaching a package-stacking layer over the base integrated circuit package; and
stacking the extended-lead integrated circuit package over the base integrated circuit package including:
an end portion of the extended lead, directly on the package-stacking layer, and
the extended lead exposed by and extending away from the bottom of the side of an extended-lead encapsulation and bending downwards toward the direction of the package stacking layer with the substantially planar lead-end surface coplanar with the substantially planar base surface.
2. The method as claimed in claim 1 wherein forming the extended-lead integrated circuit package comprises forming the extended lead beyond an extended-lead encapsulant.
3. The method as claimed in claim 1 wherein forming the extended-lead integrated circuit package comprises forming the extended lead downward towards a side opposite a top integrated circuit die.
4. The method as claimed in claim 1 wherein stacking the extended-lead integrated circuit package comprises applying a lead-end encapsulant over lead ends of the extended leads.
5. The method as claimed in claim 1 wherein stacking the extended-lead integrated circuit package comprises applying a package encapsulant over a portion of the bottom integrated circuit die and a portion of the extended-lead integrated circuit package including lead ends of the extended leads.
6. A method for manufacturing an integrated circuit package in package system comprising:
forming a base integrated circuit package with a base surface of base leads substantially planar to one another and exposed and the base leads substantially coplanar with a base die paddle;
forming an extended-lead integrated circuit package with a lead-end surface of extended leads substantially planar to one another and exposed;
attaching a package-stacking layer over the base integrated circuit package; and
stacking the extended-lead integrated circuit package over the base integrated circuit package including:
an end portion of the extended lead, directly on the package-stacking layer, and
the extended lead exposed by and extending away from the bottom of the side of an extended-lead encapsulation and bending downwards toward the direction of the package stacking layer with the substantially planar lead-end surface coplanar with the substantially planar base surface.
7. The method as claimed in claim 6 wherein stacking the extended-lead integrated circuit package comprises stacking a bottom surface of the extended-lead integrated circuit package on the package stacking layer.
8. The method as claimed in claim 6 wherein attaching the package-stacking layer over the base integrated circuit package comprises attaching the package stacking layer on the base integrated circuit package.
9. The method as claimed in claim 6 wherein forming the extended-lead integrated circuit package comprises discretely validating the extended-lead integrated circuit package with functional tests and performance tests.
10. The method as claimed in claim 6 wherein forming the base integrated circuit package comprises discretely validating the base integrated circuit package with functional tests and performance tests.