IP Library Granted Patent US 7,319,053
Granted Patent B2
US 7,319,053 · App. 11/355,214 · Granted Jan 15, 2008

Vertically stacked field programmable nonvolatile memory and method of fabrication

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Quick Facts
Patent No.
US 7,319,053
App. No.
11/355,214
Granted
Jan 15, 2008
Kind
B2
Abstract

A very high density field programmable memory is disclosed. An array is formed vertically above a substrate using several layers, each layer of which includes vertically fabricated memory cells. The cell in an N level array may be formed with N+1 masking steps plus masking steps needed for contacts. Maximum use of self alignment techniques minimizes photolithographic limitations. In one embodiment the peripheral circuits are formed in a silicon substrate and an N level array is fabricated above the substrate.

Claims (15)

1. A process for fabricating a 3-D semiconductor memory device comprising the steps of:

forming a first stack comprising a P-N diode and a state change element;

forming a second stack comprising a P-N diode and a state change element overlying the first stack,

wherein the first and second stacks comprise elements of a pillar in a 3-D memory array, wherein the 3-D memory array comprises a plurality of layers of memory cells stacked vertically above one another, and

forming edge regions on the pillar using a plasma oxidation process.

2. The process of claim 1 , wherein forming a first stack comprises:

forming a bottom conductor layer;

forming a bottom semiconductor layer overlying the conductor layer;

oxidizing at least a portion of the bottom semiconductor layer in a plasma to form an oxide layer thereon;

forming a top semiconductor layer overlying the oxide layer; and

sequentially etching the top semiconductor layer, the oxide layer, the bottom semiconductor layer and the bottom conductor layer.

3. A process for fabricating a pillar in a 3-D semiconductor memory device, wherein the pillar includes a P-N diode and a state change element vertically arranged between orthogonally disposed conductors leads, the process comprising the steps of:

forming a semiconductor layer; and

oxidizing at least a portion of the semiconductor layer in a plasma to form an oxide antifuse layer overlying the semiconductor layer;

wherein the 3-D semiconductor memory device comprises a plurality of layers of memory cells stacked vertically above one another.

Assignments (5)
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038807/0980 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT LISTED PATENT NUMBER 8853569 TO THE CORRECT PATENT NUMBER 8883569 PREVIOUSLY RECORDED ON REEL 038300 FRAME 0665. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Apr 25, 2016
From: SANDISK 3D LLC
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038520/0552 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 30, 2016
From: SANDISK 3D LLC.
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 038300/0665 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CORRECTIVE MERGER TO ADD PAGES TO THE MERGER DOCUMENT PREVIOUSLY RECORDED PREVIOUSLY RECORDED ON REEL 017544 FRAME 0769. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER. Recorded Mar 2, 2007
From: MATRIX SEMICONDUCTOR, INC.
To: SANDISK 3D LLC
Reel/Frame 018950/0686 →
MERGER Recorded Apr 28, 2006
From: MATRIX SEMICONDUCTOR, INC.
To: SANDISK 3D LLC
Reel/Frame 017544/0769 →