IP Library Granted Patent US 7,633,152
Granted Patent B2
US 7,633,152 · App. 11/468,901 · Granted Dec 15, 2009

Heat dissipation in integrated circuits

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Quick Facts
Patent No.
US 7,633,152
App. No.
11/468,901
Granted
Dec 15, 2009
Kind
B2
Abstract

The present invention provides an integrated circuit and method of manufacture therefore. The integrated circuit, in one embodiment, includes heat conducting elements located proximate a plurality of heat generating components located over a substrate. The integrated circuit may further include a heat radiating element comprising one or more fins in thermal communication and physical contact with the heat conducting elements, the heat radiating element configured to dissipate heat generated by the heat generating components away from the integrated circuit.

Claims (44)

1. An integrated circuit, comprising:

heat conducting elements located proximate a plurality of heat generating components located over a substrate;

a heat radiating element comprising one or more fins in thermal communication and physical contact with the heat conducting elements, the heat radiating element configured to dissipate heat generated by the heat generating components away from the integrated circuit; and

a passivation layer located above the heat radiating element, the passivation layer exposing at least a portion of an upper surface of the heat radiating element.

2. The integrated circuit as recited in claim 1 wherein the heat radiating element includes a single fin configured as a serpent or a comb.

3. The integrated circuit as recited in claim 1 wherein the heat radiating element includes multiple fins configured as interdigitated combs.

4. The integrated circuit as recited in claim 1 wherein active bond pad is in thermal communication and physical contact with the heat conducting elements, and further wherein the heat radiating element physically contacts the active bond pad.

5. The integrated circuit as recited in claim 1 wherein the heat conducting elements are electrically active interconnects or traces.

6. The integrated circuit as recited in claim 1 wherein the heat conducting elements are electrically inactive interconnects or traces.

7. The integrated circuit as recited in claim 1 wherein the heat radiating element comprises a material selected from the group consisting of:

copper;

aluminum;

titantium;

tantalum; and

tungsten.

8. The integrated circuit as recited in claim 1 wherein the plurality of heat generating components comprise one or more devices selected from the group consisting of:

transistors;

capacitors;

resistors;

diodes; or

any combination thereof.

9. The integrated circuit as recited in claim 1 further including a packaging layer at least partially encapsulating the integrated circuit, wherein the heat radiating element is located on, over or in an outside surface of the packaging layer, and further wherein a thermally conductive coupler extending through the packaging layer causes the heat radiating element to be in thermal communication and physical contact with the heat conducting elements.

10. A method for manufacturing an integrated circuit, comprising:

forming heat conducting elements proximate a plurality of heat generating components located over a substrate;

forming a heat radiating element comprising one or more fins in thermal communication and physical contact with the heat conducting elements, the heat radiating element configured to dissipate heat generated by the heat generating components away from the integrated circuit; and

creating a passivation layer above the heat radiating element, the passivation layer exposing at least a portion of an upper surface of the heat radiating element.

11. The method as recited in claim 10 wherein the heat radiating element includes a single fin configured as a serpent or a comb.

12. The method as recited in claim 10 wherein the heat radiating element includes multiple fins configured as interdigitated combs.

13. The method as recited in claim 10 wherein and active bond pad is in thermal communication and physical contact with the heat conducting elements, and further wherein the heat radiating element physically contacts the active bond pad.

14. The method as recited in claim 10 wherein the heat conducting elements are electrically active interconnects or traces.

15. The method as recited in claim 10 wherein the heat conducting elements are electrically inactive interconnects or traces.

16. The method as recited in claim 10 wherein the heat radiating element comprises a material selected from the group consisting of:

copper;

aluminum;

titantium;

tantalum; and

tungsten.

17. The method as recited in claim 10 wherein the plurality of heat generating components comprise one or more devices selected from the group consisting of:

transistors;

capacitors;

resistors;

diodes; or

any combination thereof.

18. The method as recited in claim 10 further including at least partially encapsulating the integrated circuit with a packaging layer, wherein the heat radiating element is located on over or in an outside surface of the packaging layer, and further wherein a thermally conductive coupler extending through the packaging layer causes the heat radiating element to be in thermal communication and physical contact with the heat conducting elements.

Assignments (9)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059723/0382 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044886/0766 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: AGERE SYSTEMS LLC
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035365/0634 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 25, 2006
From: LEE, CYNTHIA C.; SEN, SIDHARTHA
To: AGERE SYSTEMS INC.
Reel/Frame 018297/0520 →