Method of selecting operating characteristics of a resistive memory device
In a method of providing an operating characteristic of a resistive memory device, material of an electrode thereof is selected to in turn provide a selected operating characteristic of the device. The material of the electrode may be reacted with material of an insulating layer of the resistive memory device to form a reaction layer, the selected operating characteristic being dependent on the presence of the reaction layer.
1. A method of providing a selected operating characteristic of a resistive memory device, the method comprising selecting material of an electrode of the resistive memory device, wherein the selected characteristic is an on-state resistance characteristic dependent on the selected material of the electrode.
2. A method of providing a selected operating characteristic of a resistive memory device, the method comprising selecting material of an electrode of the resistive memory device, wherein the selected characteristic is a programming characteristic dependent on the selected material of the electrode, wherein the selected characteristic is a programming thermal stability characteristic.
3. A method of providing a selected operating characteristic of a resistive memory device, the method comprising reacting material of an electrode of the resistive memory device with material of an insulating layer of the resistive memory device to form a reaction layer.
4. The method of claim 3 wherein the resistive memory device, prior to said reaction, comprises a first electrode, an insulating layer on and in contact with the first electrode, and a second electrode on and in contact with the insulating layer.
5. The method of claim 3 and further comprising selecting material of an electrode of the resistive memory device, the selected characteristic being dependent on the selected material of the electrode.
6. The method of claim 5 wherein material of the electrode reacting with the material of the insulating layer is the selected material.
7. The method of claim 3 wherein the selected characteristic is an on-state resistance characteristic.
8. The method of claim 3 wherein the selected characteristic is an erase characteristic.
9. The method of claim 3 wherein the selected characteristic is a programming characteristic.
10. The method of claim 3 wherein the selected characteristic is a programming thermal stability characteristic.
11. The method of claim 3 and further comprising said memory device incorporated in a system.
12. The method of claim 11 wherein the system is selected from the group consisting of a hand-held device, a vehicle, and a computer.
13. A resistive memory device comprising:
a first electrode;
an insulating layer;
a reaction layer; and
a second electrode, the insulating layer and reaction layer being between the first and second electrodes, the reaction layer formed by reaction of the insulating layer and an electrode.
14. The device of claim 13 wherein the reaction layer is an oxide of the material of the reacting electrode.
15. A method of erasing a programmed resistive memory device, comprising:
providing a temperature of the resistive memory device sufficient to erase the programmed resistive memory device by providing a high resistance erased state of the resistive memory device; and
selecting material of an electrode of the resistive memory device, the temperature sufficient to erase the resistive memory device being dependent on the selected material of the electrode.
16. The method of claim 15 wherein the step of providing a temperature of the resistive memory device sufficient to erase the programmed resistive memory device comprises Joule heating the device by passage of current through the device.
17. The method of claim 15 and further comprising reacting material of an electrode with material of the insulating layer to form a reaction layer, the temperature sufficient to erase the resistive memory device being dependent on the presence of the reaction of the electrode layer.
18. The method of claim 15 wherein the erasing of the resistive memory device comprises moving electronic charge carriers.
19. The method of claim 18 wherein the electronic charge carriers are moved from traps in the resistive memory device.
20. The method of claim 15 wherein erasing of the programmed resistive memory device further comprises applying an electrical potential across the resistive memory device.