IP Library Granted Patent US 7,561,484
Granted Patent B2
US 7,561,484 · App. 11/955,802 · Granted Jul 14, 2009

Reference-free sampled sensing

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Quick Facts
Patent No.
US 7,561,484
App. No.
11/955,802
Granted
Jul 14, 2009
Kind
B2
Abstract

Systems and methods for extending the usable lifetime of memory cells by utilizing reference-free sampled sensing. A stimulus component applies a plurality of different stimuli to a plurality of memory cells of a memory device. A sense component senses a characteristic of each memory cell of the plurality of memory cells as a function of the applied plurality of different stimuli. An analysis component determines a logic state of each memory cell of the plurality of memory cells as a function of the sensed characteristic of each memory cell of the plurality of memory cells.

Claims (61)

1. A system comprising:

at least one processor that executes the following computer executable components:

a stimulus component that applies a plurality of different stimuli to a plurality of memory cells of a memory device;

a sense component that senses a characteristic of each memory cell of the plurality of memory cells as a function of the applied plurality of different stimuli; and

an analysis component that determines a logic state of each memory cell of the plurality of memory cells as a function of the sensed characteristic of each memory cell of the plurality of memory cells by at least one of:

comparing the sensed characteristic of each memory cell of the plurality of memory cells with one or more numbers, wherein each of the one or more numbers represents a number of memory cells of the plurality of memory cells programmed to a particular logic state; or

associating the logic state with a minimum number in change of sensed logic states as a function of the applied plurality of different stimuli.

2. The system of claim 1 , further comprising:

a data store component that stores the sensed characteristic of each memory cell of the plurality of memory cells;

wherein the analysis component determines the logic state of each memory cell of the plurality of memory cells as a function of the stored sensed characteristic of each memory cell of the plurality of memory cells.

3. The system of claim 2 , further comprising:

an artificial intelligence component that automatically:

applies the plurality of different stimuli to the plurality of memory cells;

senses the characteristic of each memory cell of the plurality of memory cells;

stores the sensed characteristic of each memory cell of the plurality of memory cells; and

determines the logic state of each memory cell of the plurality of memory cells.

4. The system of claim 1 , wherein the stimulus component at least one of:

applies a bit-line voltage to the plurality of memory cells;

applies a word-line voltage to the plurality of memory cells;

pre-charges an output of one or more memory cells of the plurality of memory cells to a reference voltage; or

applies a current to bit-lines of the plurality of memory cells.

5. The system of claim 4 , wherein the sensed characteristic of each memory cell of the plurality of memory cells comprises at least one of a drain current, a threshold voltage, a gain, or a logic state.

6. The system of claim 5 , wherein the sense component at least one of:

senses a rate of discharge of current of an output of one or more memory cells of the plurality of memory cells;

senses a voltage of an output of one or more memory cells of the plurality of memory cells; or

senses a current of an output of one or more memory cells of the plurality of memory cells.

7. The system of claim 6 , wherein the sense component comprises:

one or more sense amplifiers comprising at least one of a resistor, a transistor, a pass gate, a latch, an operational amplifier, a comparator, or a window comparator.

8. The system of claim 7 , wherein an output of each memory cell of the plurality of memory cells is coupled to a first input of one of the one or more sense amplifiers, wherein a fixed comparison voltage is coupled to a second input of the one of the one or more sense amplifiers, and wherein the sense component senses the characteristic of each memory cell of the plurality of memory cells as a function of an output of at least one of the one or more sense amplifiers.

9. The system of claim 8 , wherein an output of the one or more sense amplifiers is coupled to a tri-state logic device, wherein an output of each tri-state logic device is coupled to a latch, wherein an output of each latch is coupled to a pass gate, and wherein the sense component senses the characteristic of each memory cell of the plurality of memory cells as a function of an output of at least one pass gate.

10. The system of claim 9 , wherein an output of each pass gate is coupled to an output of one or more other pass gates.

11. The system of claim 8 , wherein an output of the one or more sense amplifiers is coupled to a first input of one or more other sense amplifiers and wherein a target voltage is coupled to a second input of the one or more other sense amplifiers.

12. The system of claim 11 , wherein the target voltage coupled to the second input of the one or more other sense amplifiers is associated with a number of memory cells expected to be sensed at a logic state.

13. The system of claim 12 , wherein the sense component senses the characteristic of each memory cell of the plurality of memory cells as a function of the output of the one or more other sense amplifiers.

14. The system of claim 1 , wherein each memory cell of the plurality of memory cells is a non-volatile memory that is at least one of flash memory, multi-bit flash memory, read only memory (ROM), programmable ROM (PROM), erasable programmable read only memory (EPROM), electronically erasable programmable read only memory (EEPROM), or a combination thereof.

15. A method comprising:

employing at least one processor to execute computer executable instructions stored on at least one computer readable medium to perform the following acts:

applying different stimuli to a plurality of memory cells of a memory device;

identifying a characteristic of each memory cell of the plurality of memory cells as a function of the applied plurality of different stimuli; and

establishing a logic state of each memory cell of the plurality of memory cells as a function of the identified characteristic of each memory cell of the plurality of memory cells by at least one of:

comparing the identified characteristic of each memory cell of the plurality of memory cells with one or more values, wherein each value of the one or more values represents an amount of memory cells of the plurality of memory cells programmed at a particular logic state; or

associating the logic state of the memory cell with a minimum number in change of identified logic states based on the applied different stimuli.

16. The method of claim 15 , the employing including employing at least one processor to execute the computer executable instructions to further perform at least one of the following acts:

applying a bit-line voltage to one or more memory cells of the plurality of memory cells;

applying a word-line voltage to one or more memory cells of the plurality of memory cells;

pre-charging an output of one or more memory cells of the plurality of memory cells to a reference voltage; or

applying a current to bit-lines of one or more memory cells of the plurality of memory cells.

17. The method of claim 16 , the employing including employing at least one processor to execute the computer executable instructions to further perform at least one of the following acts:

sensing a rate of discharge of current associated with an output of one or more memory cells of the plurality of memory cells;

sensing a voltage associated with an output of one or more memory cells of the plurality of memory cells;

sensing a current associated with an output of one or more memory cells of the plurality of memory cells;

sensing the characteristic of each memory cell of the plurality of memory cells as a function of one or more outputs of one or more sense amplifiers, wherein an output of each memory cell of the plurality of memory cells is coupled to at least one of the one or more sense amplifiers; or

sensing the characteristic of each memory cell of the plurality of memory cells as a function of an output of one or more pass gates, wherein an output of each memory cell of the plurality of memory cells is coupled to at least one sense amplifier, wherein an output of the at least one sense amplifier is coupled to a tri-state logic device, wherein an output of the tri-state logic device is coupled to a latch, and wherein an output of the latch is coupled to the one or more pass gates.

18. A system comprising:

means for applying unique stimuli to a plurality of memory cells of a memory device;

means for detecting a characteristic of each memory cell of the plurality of memory cells based on the applied unique stimuli; and

means for deriving a logic state of each memory cell of the plurality of memory cells based on the detected characteristic each memory cell of the plurality of memory cells, wherein the means for deriving the logic state comprises at least one of:

means for comparing the detected characteristic of each memory cell of the plurality of memory cells with one or more numeric quantities, wherein each of the one or more numeric quantities represents a number of memory cells of the plurality of memory cells programmed in a particular logic state; or

means for detecting a change in logic states of the plurality of memory cells based on the applied unique stimuli, and

means for relating the logic state of the memory cell with a smallest detected change in logic states of the plurality of memory cells;

wherein instructions associated with one or more of the above means are executed by one or more processors operatively coupled to one or more memory devices.

Assignments (8)
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 14, 2016
From: CYPRESS SEMICONDUCTOR CORPORATION
To: MONTEREY RESEARCH, LLC
Reel/Frame 040911/0238 →
PARTIAL RELEASE OF SECURITY INTEREST IN PATENTS Recorded Aug 11, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 039708/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 1, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036044/0122 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
RELEASE OF SECURITY INTEREST Recorded Mar 13, 2015
From: BARCLAYS BANK PLC
To: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY LLC
Reel/Frame 035201/0159 →
SECURITY AGREEMENT Recorded Jun 4, 2010
From: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
To: BARCLAYS BANK PLC
Reel/Frame 024522/0338 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 13, 2007
From: ACHTER, MICHAEL
To: SPANSION LLC
Reel/Frame 020242/0540 →