IP Library Granted Patent US 7,666,711
Granted Patent B2
US 7,666,711 · App. 12/127,357 · Granted Feb 23, 2010

Semiconductor device and method of forming double-sided through vias in saw streets

Assignee: STATS ChipPAC, Ltd.
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Quick Facts
Patent No.
US 7,666,711
App. No.
12/127,357
Granted
Feb 23, 2010
Kind
B2
Abstract

A semiconductor device is made by creating a gap between semiconductor die on a wafer. An insulating material is deposited in the gap. A first portion of the insulating material is removed from a first side of the semiconductor wafer to form a first notch. The first notch is less than a thickness of the semiconductor die. A conductive material is deposited into the first notch to form a first portion of the conductive via within the gap. A second portion of the insulating material is removed from a second side of the semiconductor wafer to form a second notch. The second notch extends through the insulating material to the first notch. A conductive material is deposited into the second notch to form a second portion of the conductive via within the gap. The semiconductor wafer is singulated through the gap to separate the semiconductor die.

Claims (48)

1. A method of making a semiconductor device, comprising:

providing a semiconductor wafer having a plurality of semiconductor dice, each semiconductor die having a contact pad;

creating a gap between each of the semiconductor dice, the gap having sufficient width to form a conductive via within the gap;

depositing an insulating material in the gap;

removing a first portion of the insulating material from a first side of the semiconductor wafer to form a first notch, the first notch being less than a thickness of the semiconductor dice;

depositing conductive material into the first notch to form a first portion of the conductive via within the gap;

forming a conductive layer over the semiconductor dice and insulating layer to electrically connect the contact pad and conductive via;

after depositing conductive material into the first notch, removing a second portion of the insulating material from a second side of the semiconductor wafer opposite the first side of the semiconductor wafer to form a second notch, the second notch extending through the insulating material to the first notch;

depositing conductive material into the second notch to form a second portion of the conductive via within the gap; and

singulating the semiconductor wafer through the gap to separate the semiconductor dice.

2. The method of claim 1 , wherein the conductive via is tapered or vertical.

3. The method of claim 1 , wherein depositing conductive material includes conforming a conductive lining in the first and second notches.

4. The method of claim 1 , wherein the wafer is singulated through the conductive via to form a conductive half via.

5. The method of claim 1 , further including:

stacking a plurality of semiconductor dice; and

electrically interconnecting the plurality of semiconductor dice through the conductive vias.

6. The method of claim 1 , further including depositing insulating material under the semiconductor dice.

7. The method of claim 1 , further including forming a through silicon via under the contact pad.

8. A method of making a semiconductor device, comprising:

providing a semiconductor wafer having a plurality of semiconductor dice;

creating a gap between each of the semiconductor dice; depositing an insulating material in the gap;

removing a first portion of the insulating material from a first side of the semiconductor wafer to form a first notch, the first notch being less than a thickness of the semiconductor dice;

depositing conductive material into the first notch to form a first portion of the conductive via within the gap;

after depositing conductive material into the first notch, removing a second portion of the insulating material from a second side of the semiconductor wafer opposite the first side of the semiconductor wafer to form a second notch, the second notch extending through the insulating material to the first notch;

depositing conductive material into the second notch to form a second portion of the conductive via within the gap; and

singulating the semiconductor wafer through the gap to separate the semiconductor dice.

9. The method of claim 8 , wherein the conductive via is tapered or vertical.

10. The method of claim 8 , wherein depositing conductive material includes conforming a conductive lining in the first and second notches.

11. The method of claim 8 , further including forming a conductive layer over the semiconductor dice and insulating layer to electrically connect the conductive via and a contact pad of the semiconductor dice.

12. The method of claim 8 , wherein the wafer is singulated through the conductive via to form a conductive half via.

13. The method of claim 8 , further including forming a plurality of rows of conductive vias in the gap.

14. The method of claim 8 , further including:

stacking a plurality of semiconductor die; and

electrically interconnecting the plurality of semiconductor die through the conductive vias.

15. A method of making a semiconductor device, comprising:

creating a gap between a plurality of semiconductor dice;

depositing an insulating material in the gap;

removing a first portion of the insulating material from a first side of the semiconductor dice to form a first notch, the first notch being less than a thickness of the semiconductor dice;

depositing conductive material into the first notch to form a first portion of a conductive via within the gap;

after depositing conductive material into the first notch, removing a second portion of the insulating material from a second side of the semiconductor die opposite the first side of the semiconductor die to form a second notch; and

depositing conductive material into the second notch to form a second portion of the conductive via within the gap.

16. The method of claim 15 , wherein the conductive via is tapered or vertical.

17. The method of claim 15 , wherein depositing conductive material includes conforming a conductive lining in the first and second notches.

18. The method of claim 15 , further including forming a conductive layer over the semiconductor dice and insulating layer to electrically connect the conductive via and a contact pad of the semiconductor dice.

19. The method of claim 15 , further including forming a plurality of rows of conductive vias in the gap.

20. The method of claim 15 , further including:

stacking a plurality of semiconductor dice; and

electrically interconnecting the plurality of semiconductor dice through the conductive vias.

Assignments (5)
CORRECT ERROR IN ASSIGNMENT NAME FROM STATS CHIPPAC PTE. LTE. TO STATS CHIPPAC PTE. LTD. (REEL: 038378 FRAME: 0328 Recorded Aug 30, 2023
From: STATS CHIPPAC PTE. LTE.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 064838/0948 →
RELEASE OF SECURITY INTEREST Recorded Jun 15, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052935/0327 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0328 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 27, 2008
From: PAGAILA, REZA A.; DO, BYUNG TAI
To: STATS CHIPPAC, LTD.
Reel/Frame 021001/0810 →
Continuity (1)
Related Publication 20090294911A1 · Dec 3, 2009