Asymmetric alignment of substrate interconnect to semiconductor die
An apparatus includes a first semiconductor die and at least one further semiconductor die. A substrate is attached to the first die and the further die and has an electrical interconnect pattern that interconnects contacts on the first die with respective contacts on the further die. Features of the interconnect pattern have positions on the substrate with smaller tolerances relative to positions of the contacts on the first die than to positions of the contacts on the further die.
1. A method comprising:
a) attaching a first semiconductor die and at least one further semiconductor die to a substrate, wherein the first die and the further die comprise electrical contacts; and
b) fabricating an interconnect pattern on the substrate that interconnects the contacts on the first die with the contacts on the further die, wherein the interconnect pattern has feature positions that have smaller placement error relative to the first die than to the further die.
2. The method of claim 1 wherein step b) comprises fabricating the interconnect pattern such that the feature positions have smaller tolerances relative to positions of the contacts on the first die than to positions of the contacts on the further die, along a direction of die placement variance.
3. The method of claim 1 wherein the contacts on the first die have a first dimension along a direction of die placement variance, and the contacts on the further die have a second dimension along the direction of die placement variation, which is larger than the first dimension.
4. The method of claim 1 wherein, in step a),
the first semiconductor die comprises a base platform having at least one user-defined metallization layer coupling a diffused transistor fabric of the platform to perform one or more functions, wherein the contacts of the first die provide external electrical connections to circuit elements within the base platform; and
the further die comprise at least one standard integrated circuit product, wherein the contacts of the further die provide external electrical connection to circuit elements within the further die.
5. The method of claim 1 , wherein step b) is performed after performing step a).
6. The method of claim 1 , wherein step b) comprises fabricating the interconnect pattern with the feature positions of the interconnect pattern positioned along at least one of an X axis and an orthogonal Y axis relative to a position of the first die, exclusive of positions of the further die and the substrate.
7. The method of claim 1 , wherein step b) comprises fabricating the interconnect pattern with a rotational orientation positioned relative to an origin on first die, exclusive of any origins on the further die and on the substrate.
8. The method of claim 1 wherein:
the contacts on the first die to which the substrate interconnect pattern connects have a first pitch on the first die along a direction of placement variation of the further die; and
the contacts on the further die to which the substrate interconnect pattern connects have a second pitch on the further die along the direction of placement variation, which is larger than the first pitch.
9. The method of claim 1 , wherein step b) comprises fabricating the interconnect pattern with the features of the interconnect pattern having positions on the substrate that are positioned relative to an origin on the first die, and wherein:
the contacts on the further die comprise a first set of contacts and a second set of contacts, which are radially further from the origin on the first die than the first set of contacts; and
the second set of contacts have a larger diameter along at least one dimension than the first set of contacts.
10. A method comprising:
a) attaching a first semiconductor die and at least one further semiconductor die to a substrate, wherein the first die and the further die comprise electrical contacts; and
b) after step a), fabricating an interconnect pattern on the substrate that interconnects the contacts on the first die with the contacts on the further die, wherein the interconnect pattern has feature positions that have smaller placement error relative to the first die than to the further die such that the feature positions of the interconnect pattern have smaller placement error relative to positions of the contacts on the first die than to positions of the contacts on the further die.