IP Library Granted Patent US 8,054,090
Granted Patent B2
US 8,054,090 · App. 12/255,998 · Granted Nov 8, 2011

Noise handling in capacitive touch sensors

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 8,054,090
App. No.
12/255,998
Granted
Nov 8, 2011
Kind
B2
Abstract

In a capacitive sensor of the type having X electrodes which are driven and Y electrodes that are used as sense channels connected to charge measurement capacitors, signal measurements are made conventionally by driving the X electrodes to transfer successive packets of charge to the charge measurement capacitors. However, an additional noise measurement is made by emulating or mimicking the signal measurement, but without driving the X electrodes. The packets of charge transferred to the charge accumulation capacitor are then indicative of noise induced on the XY sensing nodes. These noise measurements can be used to configure post-processing of the signal measurements.

Claims (32)

1. A method comprising:

grounding a first plate of a charge-accumulation capacitor;

injecting, through a resistor coupled to a voltage source, a predetermined amount of charge onto a charge-measurement capacitor;

transferring an amount of charge accumulated on a second plate of the charge-accumulation capacitor to a first plate of the charge-measurement capacitor, the charge having accumulated on the second plate of the charge-accumulation capacitor due at least in part to noise; and

determining, through a measured voltage across the charge-measurement capacitor, the amount of charge.

2. The method of claim 1 , further comprising calculating a noise factor to configure a filter based on the determined amount of charge.

3. The method of claim 1 , further comprising if the calculated noise factor is above a specified threshold value, then applying the configured filter to perform a numerical process on a measured signal.

4. An apparatus comprising:

a charge-measurement capacitor having a second plate coupled to a first plate of a charge-accumulation capacitor; and

one or more non-transitory computer-readable storage media embodying logic that is operable when executed to:

ground the first plate of the charge-accumulation capacitor;

inject a predetermined amount of charge onto the charge-measurement capacitor through a resistor coupled to a voltage source;

transfer an amount of charge accumulated on a second plate of the charge-accumulation capacitor to a first plate of the charge-measurement-capacitor, the charge having accumulated on the second plate of the charge-accumulations capacitor due at least in part to noise; and

determine, through a measured voltage across the charge-measurement capacitor, the amount of charge.

5. The apparatus of claim 4 , wherein the logic is further operable when executed to calculate a noise factor to configure a filter based on the determined amount of charge due to noise.

6. The apparatus of claim 5 , wherein the logic when executed is further operable to apply the configured filter to perform a numerical process on a measured signal, if the calculated noise factor is above a specified value.

7. The apparatus of claim 4 , wherein injecting the predetermined amount of charge further comprises coupling the second plate of the charge-measurement capacitor to the voltage source for a predetermined amount of time.

8. The apparatus of claim 4 , wherein the logic is further operable when executed to determine the amount of charge by measuring an amount of time to reduce the measured voltage across the charge-measurement capacitor to ground.

9. The apparatus of claim 8 , wherein the logic is further operable when executed to determine the amount of time by counting a number of clock periods for the measured voltage across the charge-measurement capacitor to become ground.

10. A non-transitory computer-readable storage media embodying logic that is operable when executed to:

ground a first plate of a charge-accumulation capacitor;

inject, through a resistor coupled to a voltage source, a predetermined amount of charge onto a charge-measurement capacitor;

transfer an amount of charge on a second plate of the charge-accumulation capacitor to a first plate of the charge-measurement capacitor, the charge having accumulated on the second plate of the charge-accumulation capacitor at least in part due to noise; and

determine, through a measured voltage across the charge-measurement capacitor, the amount of charge.

11. The media of claim 10 , wherein the logic is further operable when executed to calculate a noise factor to configure a filter based on the determined amount of charge.

12. The media of claim 11 , wherein the logic is further operable when executed to apply the configured filter to a numerical process on a measured signal, if the calculated noise factor is above a specified value.

13. The media of claim 10 , wherein injecting the predetermined amount of charge further comprises coupling the second plate of the charge-measurement capacitor to the voltage source for a predetermined amount of time.

14. The media of claim 10 , wherein the logic is further operable when executed to determine the amount of charge by measuring an amount of time to reduce the measured voltage across the charge-measurement capacitor to ground.

15. The media of claim 14 , wherein the logic is further operable when executed to determine the amount of time by counting a number of clock periods for the measured voltage across the charge-measurement capacitor to become ground.

16. The method of claim 1 , wherein injecting the predetermined amount of charge further comprises coupling the second plate of the charge-measurement capacitor to the voltage source for a predetermined amount of time.

17. The method of claim 1 , wherein determining the amount of charge further comprises measuring an amount of time to reduce the measured voltage across the charge-measurement capacitor to ground.

18. The method of claim 17 , wherein determining the amount of time further comprises counting a number of clock periods for the measured voltage across the charge-measurement capacitor to become ground.

Assignments (15)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2019
From: MICROCHIP TECHNOLOGY INC.; ATMEL CORPORATION; MICROCHIP TECHNOLOGY GERMANY GMBH
To: NEODRÓN LIMITED
Reel/Frame 048259/0840 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0884 →
RELEASE OF SECURITY INTEREST IN CERTAIN PATENT RIGHTS Recorded Dec 21, 2018
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 047976/0937 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2009
From: QRG LIMITED
To: ATMEL CORPORATION
Reel/Frame 023656/0538 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 11, 2009
From: PHILIPP, HARALD; YILMAZ, ESAT; PICKETT, DANIEL
To: QRG LIMITED
Reel/Frame 023647/0797 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2009
From: QRG LIMITED
To: ATMEL CORPORATION
Reel/Frame 022610/0350 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2009
From: QRG LIMITED
To: ATMEL CORPORATION
Reel/Frame 022783/0804 →