Semiconductor device and manufacturing method thereof
A semiconductor package having a molding unit that seals bonding wires connected to electrode pads of a semiconductor chip is provided with through electrode units comprising bonding wires embedded therein and penetrating the molding unit. A leading end of the respective through electrode units is exposed from an upper surface of the molding unit and a lower surface of the molding unit.
1. A semiconductor package comprising:
a molding unit that seals a bonding wire connected to an electrode pad of a semiconductor chip,
a through electrode unit; and
a bonding wire embedded in the through electrode unit,
wherein the through electrode unit penetrates the molding unit, and
wherein the upper surface and the lower surface of the electrode pad are exposed from an upper surface of the molding unit and a lower surface of the molding unit.
2. The semiconductor package according to claim 1 , wherein:
the through electrode unit comprises a columnar conducting unit that penetrates the molding unit;
the through electrode unit comprises a columnar part formed with electrolytic plating; and
the inside of the columnar part is cut across by the bonding wire.
3. The semiconductor package according to claim 1 , wherein the semiconductor package houses a semiconductor chip.
4. The semiconductor package according to claim 2 , wherein an exposed surface of the columnar conducting unit that is exposed from the molding unit is coated with metal plating.
5. The semiconductor package according to claim 2 , comprising a wire connecting unit that is connected to the bonding wire and is exposed from the molding unit.
6. The semiconductor package according to claim 4 , wherein an exposed surface area of the columnar conducting unit is wider than a surface area of the wire connecting unit.
7. A manufacturing method of a semiconductor package comprising:
sealing a bonding wire connected to an electrode pad of a semiconductor chip, and
forming a through electrode unit that embeds therein the bonding wire, wherein
the through electrode unit penetrates the molding unit, and
wherein the upper surface and the lower surface of the electrode pad are exposed from an upper surface of the molding unit and a lower surface of the molding unit.
8. The manufacturing method according to claim 7 , wherein:
forming the through electrode unit further comprises forming a columnar conducting unit which penetrates the molding unit,
the columnar conducting unit has a columnar part formed with electrolytic plating, and
the inside of the columnar part is cut across by the bonding wire.
9. The manufacturing method according to claim 8 , further comprising coating an exposed surface of the columnar conducting unit that is exposed from the molding unit with metal plating.
10. The manufacturing method according to claim 8 , further comprising forming a wire connecting unit that is connected to the bonding wire and is exposed from the molding unit.
11. The manufacturing method according to claim 9 , wherein an exposed surface area of the columnar conducting unit is wider than a surface area of the wire connecting unit.
12. A semiconductor device comprising:
a semiconductor package having a molding unit that seals a bonding wire connected to an electrode pad of a semiconductor chip; and
a through electrode unit that embeds therein the bonding wire and penetrates the molding unit,
wherein the upper surface and the lower surface of the electrode pad are exposed from an upper surface of the molding unit and a lower surface of the molding unit.
13. The semiconductor device according to claim 12 , wherein:
the through electrode unit comprises a columnar conducting unit that penetrates the molding unit and has a columnar part formed with electrolytic plating; and
the inside of the columnar part is cut across by the bonding wire.
14. The semiconductor device according to claim 13 , wherein a first exposed surface of the columnar conducting unit that is exposed from the upper surface of the molding unit is coated with metal plating.
15. The semiconductor device according to claim 13 , wherein a second exposed surface the columnar conducting unit that is exposed from the lower surface of the molding unit is coated with metal plating.
16. The semiconductor device according to claim 13 , wherein both of the first exposed surface and the second exposed surface are coated with metal plating.
17. The semiconductor device according to claim 13 , comprising a wire connecting unit that is connected to the bonding wire and is exposed from the molding unit.
18. The semiconductor device according to claim 17 , wherein an area of the first exposed surface and an area of the second exposed surface are wider than a surface area of the wire connecting unit.
19. The semiconductor device according to claim 17 , comprising:
a motherboard on which a wiring pattern is formed;
a plurality of semiconductor packages, a semiconductor package stacked by fixing the second exposed surface of the semiconductor package in an upper layer onto the first exposed surface of the semiconductor package in a lower layer, and
wherein the second exposed surface of the semiconductor package in a lowermost layer amongst the plurality of the semiconductor package stacked is fixed onto the wiring pattern.
20. The semiconductor device according to claim 19 ,
wherein the plurality of the semiconductor package are adhered to each other, and
wherein the motherboard and the semiconductor package in the lowermost layer are adhered to each other.