IP Library Granted Patent US 7,902,520
Granted Patent B2
US 7,902,520 · App. 12/340,288 · Granted Mar 8, 2011

Radiation detecting electronic device and methods of operating

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 7,902,520
App. No.
12/340,288
Granted
Mar 8, 2011
Kind
B2
Abstract

A method of operating an electronic device including determining an initial charge level at a non-volatile charge storage structure of a radiation-sensitive device including a radiation-reactive material and determining if a first radiation event has occurred based upon the non-volatile charge storage device having a different charge level than the initial charge level. The method further includes identifying the first radiation event as associated with either a first type of radiation or a second type of radiation based upon the different charge level.

Claims (35)

1. A method of operating an electronic device comprising:

determining an initial charge level at a non-volatile charge storage structure of a radiation-detecting device including a radiation-reactive material;

determining a first radiation event has occurred based upon the non-volatile charge storage structure having a different charge level than the initial charge level; and

identifying the first radiation event as associated with either a first type of radiation or a second type of radiation based upon the different charge level.

2. The method of claim 1 , wherein determining the initial charge level includes setting the initial charge level at a non-volatile charge storage structure.

3. The method of claim 2 , wherein setting the initial charge level include setting the initial charge level within a defined voltage range.

4. The method of claim 2 , wherein setting an initial charge level comprises:

modifying the charge level at a non-volatile storage structure; and

reading the charge level associated with the non-volatile storage structure.

5. The method of claim 1 , wherein determining the initial charge level comprises:

reading a non-volatile storage structure to determine a charge level; and

storing the charge level associated with the non-volatile storage structure.

6. The method of claim 5 , wherein storing comprises storing the charge level at an integrated circuit that includes the non-volatile charge storage structure.

7. The method of claim 1 , wherein the process of determining the initial charge level includes determining a first radiation event, and identifying is carried out at an integrated circuit.

8. The method of claim 1 , further comprising reporting the first type of radiation and not reporting the second type of radiation.

9. The method of claim 8 , wherein reporting comprises:

determining if the first radiation event matches a reporting criteria, wherein the reporting criteria is different in response to the first radiation event being of a first type of radiation, than in response to the first radiation event being of a second type radiation.

10. The method of claim 1 , wherein reporting comprises:

reporting the first type of radiation using a first reporting manner; and

reporting the second type of radiation using a second reporting manner different than the first reporting manner.

11. The method of claim 1 , wherein a threshold voltage of a transistor device corresponds to the initial charge level.

12. The method of claim 1 , further comprising determining a quantification indicator based upon the different charge level.

13. A method of operating an electronic device comprising:

determining an initial charge level at a non-volatile charge storage structure of a radiation-detecting device including a radiation-reactive material;

determining a first radiation event has occurred based upon the non-volatile charge storage structure having a different charge level than the initial charge level; and

determining a quantification indicator based upon the different charge level, wherein the quantification indicator is associated with a type of radiation.

14. The method of claim 13 , further comprising transmitting the quantification indicator and the initial charge level.

15. The method of claim 13 , further comprising determining a duration between determining an initial charge level and determining a first radiation event.

16. The method of claim 13 , wherein the quantification indicator is based on a difference between the initial charge level and the different charge level.

17. The method of claim 13 , wherein determining a quantification indicator comprises conducting multiple read operations at multiple, different read voltages.

18. The method of claim 13 , wherein the quantification indicator is associated with a radiation signature for identifying different types of radiation.

19. A method of operating an electronic device comprising:

setting an initial charge level within a defined voltage range at a non-volatile charge storage structure of a radiation-detecting device including a radiation-reactive material;

determining a first radiation event has occurred based upon the non-volatile charge storage structure having a different charge level than the initial charge level; and

identifying the first radiation event as associated with either a first type of radiation or a second type of radiation based upon the different charge level.

Assignments (8)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 15, 2022
From: CYPRESS SEMICONDUCTOR CORPORATION
To: INFINEON TECHNOLOGIES LLC
Reel/Frame 059721/0467 →
RELEASE OF SECURITY INTEREST Recorded Mar 16, 2022
From: MUFG UNION BANK, N.A.
To: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
Reel/Frame 059410/0438 →
CORRECTIVE ASSIGNMENT TO CORRECT THE 8647899 PREVIOUSLY RECORDED ON REEL 035240 FRAME 0429. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTERST. Recorded Nov 3, 2020
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 058002/0470 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN INTELLECTUAL PROPERTY Recorded Oct 28, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MUFG UNION BANK, N.A.
Reel/Frame 050896/0366 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 2, 2015
From: SPANSION, LLC
To: CYPRESS SEMICONDUCTOR CORPORATION
Reel/Frame 036050/0174 →
SECURITY INTEREST Recorded Mar 21, 2015
From: CYPRESS SEMICONDUCTOR CORPORATION; SPANSION LLC
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 035240/0429 →
SECURITY AGREEMENT Recorded Aug 23, 2012
From: SPANSION LLC; SPANSION INC.; SPANSION TECHNOLOGY INC.; SPANSION TECHNOLOGY LLC
To: BARCLAYS BANK PLC
Reel/Frame 028840/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 6, 2009
From: HOSSAIN, TIMOTHY Z.; CLOPTON, PATRICK MARK; FULLWOOD, CLAYTON; POSEY, DAN E.
To: SPANSION LLC
Reel/Frame 022066/0184 →