IP Library Granted Patent US 8,018,259
Granted Patent B2
US 8,018,259 · App. 12/695,461 · Granted Sep 13, 2011

Phase-locked loop having a feedback clock detector circuit and method therefor

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Quick Facts
Patent No.
US 8,018,259
App. No.
12/695,461
Granted
Sep 13, 2011
Kind
B2
Abstract

A method for a phase-locked loop (PLL) in an integrated circuit, wherein the PLL comprises a voltage-controlled oscillator (VCO). The method includes, in a training mode: (1) setting a control voltage of the VCO at a first voltage level; (2) increasing the control voltage of the VCO from the first voltage level to a second voltage level, until a loss of the feedback signal is detected; and (3) storing an indicator value corresponding to the second voltage level of the control voltage of the VCO. The method further includes, in a normal mode: (1) monitoring a voltage level of the control voltage of the VCO by generating a monitored indicator value corresponding to the voltage level of the control voltage of the VCO; and (2) asserting the loss of feedback signal based on a comparison of the monitored indicator value and the indicator value.

Claims (27)

1. A method for a phase-locked loop (PLL) in an integrated circuit, wherein the PLL comprises a voltage-controlled oscillator (VCO), and wherein the PLL is configured to receive a reference signal and a feedback signal, the method comprising:

operating the PLL in a training mode, wherein operating the PLL in the training mode comprises:

setting a control voltage of the VCO at a first voltage level,

increasing the control voltage of the VCO from the first voltage level to a second voltage level, until a loss of the feedback signal is detected, and

storing an indicator value corresponding to the second voltage level of the control voltage of the VCO; and

after operating the PLL in the training mode, operating the PLL in a normal mode, wherein operating the PLL in the normal mode comprises:

monitoring a voltage level of the control voltage of the VCO by generating a monitored indicator value corresponding to the voltage level of the control voltage of the VCO, and

asserting the loss of feedback signal based on a comparison of the monitored indicator value and the indicator value.

2. The method of claim 1 , wherein the loss of the feedback signal is detected using a feedback loss detect circuit.

3. The method of claim 1 , wherein each of the indicator value and the monitored indicator value is a digital value generated by converting respective voltage levels from an analog form into a digital form using an analog to digital converter.

4. The method of claim 1 , wherein the loss of feedback signal is detected using a feedback loss detect circuit and wherein the feedback loss detect circuit further comprises a logic circuit, a first register, and a second register, and wherein the digital value corresponding to the indicator value is stored in the first register based on a first enable signal from the logic circuit and wherein the digital value corresponding to the monitored indicator value is stored in the second register based on a second enable signal from the logic circuit.

5. The method of claim 4 , wherein the feedback loss detect circuit further comprises a comparator and wherein the step of asserting the loss of feedback signal further comprises comparing the digital value stored in the first register with the digital value stored in the second register using the comparator.

6. The method of claim 3 , wherein the loss of the feedback signal is detected using a feedback loss detect circuit and wherein the feedback loss detect circuit further comprises a voltage generator for generating the control voltage of the VCO and a unity amplifier for amplifying the control voltage of the VCO, and wherein the method further comprises, during the normal operating mode, decoupling the voltage generator and the unity amplifier from the analog to digital converter.

7. The method of claim 1 , wherein generating the monitored indicator value further comprises adding an offset to the monitored indicator value.

8. The method of claim 1 , wherein the steps of operating the PLL in the training mode and operating the PLL in the normal mode are performed in-situ and in real-time.

9. The method of claim 1 , wherein the step of operating the PLL in the training mode is performed each time the integrated circuit is powered on.

10. A phase-locked loop (PLL) in an integrated circuit, wherein the PLL comprises a voltage-controlled oscillator (VCO), and wherein the PLL is configured to receive a reference signal and a feedback signal, the PLL comprising:

a first control logic portion for setting a control voltage of the VCO at a first voltage level and for increasing the control voltage of the VCO from the first voltage level to a second voltage level, until a loss of the feedback signal is detected;

a first register for storing an indicator value corresponding to the second voltage level of the control voltage of the VCO;

a second control logic portion for monitoring a voltage level of the control voltage of the VCO and for generating a monitored indicator value corresponding to the voltage level of the control voltage of the VCO;

a second register for storing the monitored indicator value; and

a third control logic portion for asserting the loss of feedback signal based on a comparison of the monitored indicator value and the indicator value.

11. The PLL of claim 10 further comprising:

an analog to digital converter for converting the second voltage level into the indicator value and for converting the monitored voltage level into the monitored indicator value; and

a comparator for comparing the indicator value with the monitored indicator value to generate the loss of feedback signal.

12. The PLL of claim 10 , wherein the first control logic portion is configured to operate the PLL in a training mode in response to a first value of a mode control signal and wherein the second control logic portion is configured to operate the PLL in a normal mode in response to a second value of the mode control signal.

13. The PLL of claim 12 , wherein the PLL is configured to operate in the training mode and to operate in the normal mode each time the integrated circuit is powered on.

Assignments (26)
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
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RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
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To: NXP B.V.
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CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
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RELEASE OF SECURITY INTEREST Recorded May 29, 2017
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP USA, INC. F/K/A FREESCALE SEMICONDUCTOR, INC.
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ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 29, 2017
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MERGER Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040652/0241 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
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RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
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To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
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