IP Library Granted Patent US 8,963,561
Granted Patent B2
US 8,963,561 · App. 13/288,385 · Granted Feb 24, 2015

Randomizing one or more micro-features of a touch sensor

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Quick Facts
Patent No.
US 8,963,561
App. No.
13/288,385
Granted
Feb 24, 2015
Kind
B2
Abstract

In one embodiment, an apparatus includes a touch sensor with one or more meshes of conductive material. Each of the meshes includes multiple mesh cells defined by multiple mesh segments. Each of the mesh cells includes a centroid and multiple vertices. The mesh segments are made of the conductive material, and the centroids or vertices of the mesh cells have a substantially random distribution within an area of the touch sensor. The apparatus also includes one or more computer-readable non-transitory storage media coupled to the touch sensor that embody logic that is configured when executed to control the touch sensor.

Claims (35)

1. An apparatus comprising:

a touch sensor comprising one or more meshes of conductive material, each of the meshes comprising a plurality of mesh cells defined by a plurality of mesh segments, each of the mesh cells comprising a centroid and a plurality of vertices, the mesh segments being made of the conductive material, the centroids or vertices of the mesh cells having a substantially random distribution within an area of the touch sensor, wherein one or more of the meshes of conductive material substantially embody a Voronoi diagram, the mesh segments of the one or more meshes of conductive material corresponding to respective Voronoi segments positioned with respect to one or more Voronoi sites; and

one or more computer-readable non-transitory storage media coupled to the touch sensor and embodying logic that is configured when executed to control the touch sensor.

2. The apparatus of claim 1 , wherein the one or more meshes of conductive material comprise a first mesh and a second mesh, the first mesh being disposed on a first surface of a substrate and the second mesh being disposed on a second surface of the substrate opposite the first surface.

3. The apparatus of claim 2 , wherein:

in the first mesh, the centroids of the mesh cells have a substantially random distribution within the area of the touch sensor; and

in the second mesh, the vertices of the mesh cells have a substantially random distribution within the area of the touch sensor.

4. The apparatus of claim 1 , wherein the one or more meshes of conductive material comprise a first mesh and a second mesh, the first mesh being disposed on a surface of a first substrate and the second mesh being disposed on a surface of a second substrate.

5. The apparatus of claim 4 , wherein:

in the first mesh, the centroids of the mesh cells have a substantially random distribution within the area of the touch sensor; and

in the second mesh, the vertices of the mesh cells have a substantially random distribution within the area of the touch sensor.

6. The apparatus of claim 1 , wherein each of one or more of the mesh segments is a substantially straight line.

7. The apparatus of claim 1 , wherein each of one or more of the mesh segments is substantially non-linear.

8. The apparatus of claim 7 , wherein each of one or more of the mesh segments is substantially sinusoidal.

9. A touch sensor comprising:

one or more meshes of conductive material;

each of the meshes comprising a plurality of mesh cells defined by a plurality of mesh segments;

each of the mesh cells comprising a centroid and a plurality of vertices;

the mesh segments being made of the conductive material; and

the centroids of the mesh cells having a substantially random distribution within an area of the touch sensor such that distances between the centroids vary, wherein one or more of the meshes of conductive material substantially embody a Voronoi diagram, the mesh segments of the one or more meshes of conductive material corresponding to a respective Voronoi segment positioned with respect to one or more Voronoi sites.

10. The touch sensor of claim 9 , wherein the one or more meshes of conductive material comprise a first mesh and a second mesh, the first mesh being disposed on a first surface of a substrate and the second mesh being disposed on a second surface of the substrate opposite the first surface.

11. The touch sensor of claim 10 , wherein:

in the first mesh, the centroids of the mesh cells have a substantially random distribution within the area of the touch sensor; and

in the second mesh, the vertices of the mesh cells have a substantially random distribution within the area of the touch sensor.

12. The touch sensor of claim 9 , wherein the one or more meshes of conductive material comprise a first mesh and a second mesh, the first mesh being disposed on a surface of a first substrate and the second mesh being disposed on a surface of a second substrate.

13. The touch sensor of claim 12 , wherein:

in the first mesh, the centroids of the mesh cells have a substantially random distribution within the area of the touch sensor; and

in the second mesh, the vertices of the mesh cells have a substantially random distribution within the area of the touch sensor.

14. A method comprising:

placing by one or more computer systems a plurality of seeds within an area subject to one or more placement rules and one or more area-saturation rules, the seeds having a substantially random distribution within the area as a result of the placement;

generating a pattern for a mesh of conductive material of a touch sensor at least in part by determining by one or more of the computer systems a plurality of mesh cells based on the placement of the seeds, the mesh cells being defined by a plurality of mesh segments, each of the mesh cells comprising a centroid and a plurality of vertices, the centroids or vertices of the mesh cells corresponding to the seeds, the pattern for the mesh of conductive material substantially embodying a Voronoi diagram, the seeds corresponding to Voronoi sites, the mesh segments corresponding to respective Voronoi segments.

15. The method of claim 14 , wherein each of one or more of the mesh segments is a substantially straight line.

16. The method of claim 14 , wherein each of one or more of the mesh segments is substantially non-linear.

17. The method of claim 16 , wherein each of one or more of the mesh segments is substantially sinusoidal.

18. The method of claim 16 , further comprising manufacturing the mesh of conductive material of the touch sensor.

Assignments (14)
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: ATMEL CORPORATION
Reel/Frame 059262/0105 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 050987/0430 →
RELEASE OF SECURITY INTEREST Recorded Nov 12, 2019
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; ATMEL CORPORATION
Reel/Frame 050986/0798 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 7, 2019
From: ATMEL CORPORATION
To: BOE TECHNOLOGY GROUP CO., LTD.
Reel/Frame 050950/0594 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: ATMEL CORPORATION
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041715/0747 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT COLLATERAL Recorded Apr 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: ATMEL CORPORATION
Reel/Frame 038376/0001 →
PATENT SECURITY AGREEMENT Recorded Jan 3, 2014
From: ATMEL CORPORATION
To: MORGAN STANLEY SENIOR FUNDING, INC. AS ADMINISTRATIVE AGENT
Reel/Frame 031912/0173 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 19, 2012
From: ATMEL TECHNOLOGIES U.K. LIMITED
To: ATMEL CORPORATION
Reel/Frame 027558/0297 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2011
From: CARLEY, CARL
To: ATMEL TECHNOLOGIES U.K. LIMITED
Reel/Frame 027169/0740 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 3, 2011
From: YILMAZ, ESAT; MORRIONE, MICHAEL THOMAS
To: ATMEL CORPORATION
Reel/Frame 027169/0804 →