IP Library Granted Patent US 8,572,543
Granted Patent B2
US 8,572,543 · App. 13/442,099 · Granted Oct 29, 2013

Automation of tie cell insertion, optimization and replacement by scan flip-flops to increase fault coverage

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Quick Facts
Patent No.
US 8,572,543
App. No.
13/442,099
Granted
Oct 29, 2013
Kind
B2
Abstract

A method for designing an integrated circuit is disclosed. The method generally comprises the steps of (A) splitting a design layout of the integrated circuit into a plurality of tiles, (B) adding a plurality of tie-to cells to the design layout, wherein at least one of the tie-to cells generating a tie-to signal at a particular logical level is added into each of the tiles having at least one gate with an input fixed to the particular logical level and (C) routing the tie-to signal to each of the inputs within each of the tiles.

Claims (43)

1. A method of designing an integrated circuit, comprising the steps of:

(A) generating a design layout of said integrated circuit in a computer, said design layout comprising (i) a plurality of common cells each configured to perform a logical operation and (ii) a logic gate having a logic input fixed to a logic level;

(B) replacing at least one of said common cells proximate said logic gate with a special cell configured to (i) perform said logical operation and (ii) generate a signal at said logic level;

(C) removing a connection that fixes said logic input of said logic gate to said logic level;

(D) routing said signal from said special cell to said logic input of said logic gate, wherein (i) said logic gate resides inside a first of a plurality of boundaries in said design layout, (ii) said design layout further comprises a scan chain having a scan cell within said first boundary, (iii) an additional logic gate resides in a second of said boundaries and (iv) said second boundary adjoins said first boundary; and

(E) marking said second boundary as full in response to said second boundary lacking available space to place another scan cell.

2. The method according to claim 1 , wherein said logical operation comprises a flip-flop operation.

3. The method according to claim 1 , wherein said special cell is configured to generate said signal at a logical high level.

4. The method according to claim 1 , wherein said special cell is configured to generate said signal at a logical low level.

5. The method according to claim 1 , wherein said design layout further comprises another logic gate having another logic input fixed to said logic level, the method further comprising the steps of:

removing another connection that fixes said other logic input of said other logic gate to said logic level; and

routing said signal from said special cell to said other logic input of said other logic gate.

6. The method according to claim 1 , wherein said design layout further comprises another logic gate having another logic input fixed to said logic level, the method further comprising the steps of:

adding a tie-to cell to said design layout proximate said other logic gate, wherein said tie-to cell is configured to generate another signal at said logic level;

removing another connection that fixes said other logic input of said other logic gate to said logic level; and

routing said other signal from said tie-to cell to said other logic input of said other logic gate.

7. The method according to claim 1 , wherein (i) said special cell comprises a given scan cell and (ii) said design layout further comprises another logic gate having another logic input fixed to a particular logic level.

8. The method according to claim 7 , further comprising the steps of:

removing another connection that fixes said other logic input of said other logic gate to said particular logic level; and

routing a data output of said given scan cell to said other logic input of said other logic gate.

9. The method according to claim 7 , further comprising the step of:

routing a data output of said given scan cell to another scan cell in said design layout.

10. The method according to claim 1 , further comprising the steps of:

rerouting said logic input of said logic gate to a data output of said scan cell.

11. The method according to claim 1 , wherein the steps are preformed by processor executable instructions contained within a non-transitory computer readable medium.

12. A method of designing an integrated circuit, comprising the steps of:

(A) generating a design layout of said integrated circuit in a computer, said design layout comprising (i) a scan chain and (ii) a plurality of logic gates, at least one of said logic gates having a logic input fixed to a logic level and residing inside a first of a plurality of boundaries in said design layout;

(B) adding a scan cell within said first boundary;

(C) rerouting said logic input of said at least one logic gate to a data output of said scan cell; and

(D) rerouting said scan chain to include said scan cell.

13. The method according to claim 12 , wherein (i) another of said logic gates resides in a second of said boundaries and (ii) said second boundary adjoins said first boundary, the method further comprising the step of:

marking said second boundary as full in response to said second boundary lacking available space to place another scan cell.

14. The method according to claim 12 , further comprising the step of:

adding another scan cell within said first boundary in response to a second boundary being marked as full.

15. The method according to claim 14 , further comprising the step of:

rerouting another logic input of another cell in said second boundary to a data output of said other scan cell.

16. The method according to claim 12 , wherein said design layout further comprises (i) a plurality of common cells each configured to perform a logical operation and (ii) another of said logic gates having another logic input fixed to said logic level.

17. The method according to claim 16 , further comprising the steps of:

replacing at least one of said common cells proximate said other logic gate with a special cell configured to (i) perform said logical operation and (ii) generate a signal at said logic level;

removing a connection that fixes said other logic input of said other logic gate to said logic level; and

routing said signal from said special cell to said other logic input of said other logic gate.

18. The method according to claim 16 , wherein said logical operation comprises a flip-flop operation.

19. The method according to claim 12 , wherein the steps are preformed by processor executable instructions contained within a non-transitory computer readable medium.

Assignments (8)
RELEASE OF SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 059720/0223 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044887/0109 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →