IP Library Granted Patent US 9,159,643
Granted Patent B2
US 9,159,643 · App. 13/618,185 · Granted Oct 13, 2015

Matrix lid heatspreader for flip chip package

View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,159,643
App. No.
13/618,185
Granted
Oct 13, 2015
Kind
B2
Abstract

A method and apparatus are provided for manufacturing a lead frame based thermally enhanced flip chip package with an exposed heat spreader lid array ( 310 ) designed for direct attachment to an array of integrated circuit die ( 306 ) by including a thermal interface adhesion layer ( 308 ) to each die ( 306 ) and encapsulating the attached heat spreader lid array ( 310 ) and array of integrated circuit die ( 306 ) with mold compound ( 321 ) except for planar upper lid surfaces of the heat spreader lids ( 312 ).

Claims (29)

1. A method of making a plurality of integrated circuit packages, comprising:

providing a substrate array comprising a plurality of flip chip mounted integrated circuit die, each having a first surface that is attached to a first surface of the substrate array using flip chip bumps and a second surface which is formed a compliant thermally conductive interface layer;

providing a heat spreader lid array comprising a plurality of heat spreader lids having planar upper lid surfaces connected together by connection spars to define one or more openings between adjacent heat spreader lids defining singulation cut areas around each head spreader lid;

attaching the heat spreader lid array to the substrate array by pressing the heat spreader lid array to compress the compliant thermally conductive interface layer formed on each integrated circuit die to expand laterally to form a compressed thermally conductive interface layer which completely covers the second surface of the die and make direct contact therebetween;

encapsulating the plurality of flip chip mounted integrated circuit die and the heat spreader lid array with encapsulant wherein the upper planar upper lid surfaces of the plurality of heat spreader lids are exposed; and

curing the encapsulant to form an array of molded packages, each having a portion of the substrate array exposed on a first side and a planar upper lid surface of a heat spreader lid exposed on a second side.

2. The method of claim 1 , further comprising:

singulating the array of molded packages into a plurality of integrated circuit packages.

3. The method of claim 1 , further comprising:

forming a plurality of ball grid arrays on an exposed surface of said substrate array to be electrically connected to conductive traces formed in the substrate array.

4. The method of claim 1 , further comprising forming the compliant thermally conductive interface layer by applying a thermally conductive, compliant adhesive layer or patterned layer of compliant, thermally conductive grease or non-curing silicon material to the second surface of each integrated circuit die.

5. The method of claim 1 , where providing the heat spreader lid array comprises selectively etching, machining, or stamping a metal layer to define a planar leadframe heat spreader lid array with the plurality of heat spreader lids and connection spars formed in a single planar layer.

6. The method of claim 1 , where providing the heat spreader lid array comprises providing a plurality of upset heat spreader lids connected together by a plurality of downset lead finger spars to define the one or more openings between adjacent heat spreader lids.

7. The method of claim 1 , where attaching the heat spreader lid array to the substrate array comprises pressing an upper mold cavity tool against a lower mold cavity tool and the planar upper lid surfaces of the heat spreader lid array to form a mold cavity between the upper and lower mold cavity and to attach the heat spreader lid array into contact with the thermally conductive interface layer formed on each integrated circuit die.

8. The method of claim 7 , further comprising lining an interior surface of the upper mold cavity with a polymer film before pressing the upper mold cavity tool against the lower mold cavity tool.

9. The method of claim 7 , where encapsulating the plurality of flip chip mounted integrated circuit die and the heat spreader lid array with encapsulant comprises:

filling the mold cavity with encapsulant except for the planar upper lid surfaces of the plurality of heat spreader lids; and

clamping the upper and lower mold cavity tools.

10. The method of claim 1 , where providing the heat spreader lid array comprises providing a plurality of upset heat spreader lids connected together by a plurality of downset lead finger spars, where each upset heat spreader lid is sized to make contact with a corresponding integrated circuit die through the compliant thermally conductive interface layer formed thereon.

11. A method of making a semiconductor package, comprising:

attaching a plurality of integrated circuit die to a molded array package substrate array using flip-chip bonding to enable electrical connection between each integrated circuit die and conductors in the substrate array;

providing a heat spreader lid array formed with an unlaminated thermally conductive material to define a plurality of heat spreader lids positioned for alignment with the plurality of integrated circuit die, where each heat spread lid comprises an exposed heat dissipation surface layer and a plurality of connection spars extending laterally from the exposed heat dissipation surface layer;

forming a compression-compliant thermal interface material layer on an exposed first surface of each of the plurality of integrated circuit die or on a bottom surface of each exposed heat dissipation surface layer;

pressing the heat spreader lid array into direct thermal contact with the plurality of integrated circuit die by compressing the compression-compliant thermal interface material layer to laterally expand to completely cover the first surface of each integrated circuit die and to define an encapsulation molding cavity region between the exposed heat dissipation surface layers and the substrate array;

filling the encapsulation molding cavity region with encapsulation mold compound material without covering the exposed heat dissipation surface layers with encapsulation mold compound material; and

curing the encapsulation mold compound material in the encapsulation molding cavity region to encapsulate the plurality of integrated circuit die and to seal the substrate array and heat spreader lid array, resulting in an array of molded packages, each having a portion of the heat spreader lid array exposed on a first side.

12. The method of claim 11 , further comprising:

singulating the array of molded packages into a plurality of integrated circuit packages.

13. The method of claim 11 , wherein the heat spreader lid array includes each exposed heat dissipation surface layer and connection spars extending laterally and formed in a single planar layer with said exposed heat dissipation surface layer.

Assignments (16)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2024
From: NXP USA, INC.
To: CHIP PACKAGING TECHNOLOGIES, LLC
Reel/Frame 068541/0903 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040925 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Feb 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V. F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 052917/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 040928 FRAME 0001. ASSIGNOR(S) HEREBY CONFIRMS THE RELEASE OF SECURITY INTEREST. Recorded Jan 17, 2020
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 052915/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE APPLICATION 11759915 AND REPLACE IT WITH APPLICATION 11759935 PREVIOUSLY RECORDED ON REEL 037486 FRAME 0517. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Dec 10, 2019
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 053547/0421 →
RELEASE OF SECURITY INTEREST Recorded Sep 10, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 050744/0097 →
CORRECTIVE ASSIGNMENT TO CORRECT THE TO CORRECT THE APPLICATION NO. FROM 13,883,290 TO 13,833,290 PREVIOUSLY RECORDED ON REEL 041703 FRAME 0536. ASSIGNOR(S) HEREBY CONFIRMS THE THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS.. Recorded Feb 20, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: SHENZHEN XINGUODU TECHNOLOGY CO., LTD.
Reel/Frame 048734/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040632 FRAME: 0001. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME. Recorded Sep 21, 2017
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 044209/0047 →
CORRECTIVE ASSIGNMENT TO CORRECT THE REMOVE PATENTS 8108266 AND 8062324 AND REPLACE THEM WITH 6108266 AND 8060324 PREVIOUSLY RECORDED ON REEL 037518 FRAME 0292. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS. Recorded Feb 1, 2017
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041703/0536 →
CHANGE OF NAME Recorded Nov 8, 2016
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 040632/0001 →
RELEASE OF SECURITY INTEREST Recorded Nov 7, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP B.V.
Reel/Frame 040928/0001 →
RELEASE OF SECURITY INTEREST Recorded Sep 21, 2016
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: NXP, B.V., F/K/A FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040925/0001 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 13, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037518/0292 →
ASSIGNMENT AND ASSUMPTION OF SECURITY INTEREST IN PATENTS Recorded Jan 12, 2016
From: CITIBANK, N.A.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037486/0517 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0614 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0633 →
PATENT RELEASE Recorded Dec 21, 2015
From: CITIBANK, N.A., AS COLLATERAL AGENT
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 037357/0652 →