Extraction electrode assembly voltage modulation in an ion implantation system
View Patent ↗A method is disclosed for reducing particle contamination in an ion implantation system, wherein an ion beam is created via the ion source operating in conjunction with an extraction electrode assembly. A cathode voltage is applied to the ion source for generating ions therein, and a suppression voltage is applied to the extraction assembly for preventing electrons in the ion beam from being drawn into the ion source. The suppression voltage is selectively modulated, thereby inducing a current flow or an arc discharge through the extraction assembly to remove deposits on surfaces thereof to mitigate subsequent contamination of workpieces. An improvement to an ion implantation system is also disclosed in accordance with the foregoing, wherein a controller is configured to selectively modulate a voltage between a predetermined voltage and a predetermined suppression voltage generally concurrent with the transferring of the workpiece, thereby inducing a current flow or an arc discharge through the extraction electrode assembly to remove deposits on surfaces thereof to mitigate subsequent contamination of workpieces.
1. A method for reducing particle contamination in an ion implantation system, the method comprising the steps of:
providing an ion implantation system comprising:
an ion source;
an extraction electrode assembly situated proximate to the ion source, said extraction electrode assembly including a suppression electrode and a ground electrode separated by ceramic insulators for electrically isolating the suppression electrode and the ground electrode; and
an end station configured to transfer workpieces into and out of the end station for selective implantation of ions into the workpieces;
forming an ion beam via the ion source operating in conjunction with the with the extraction electrode assembly proximate to the ion source, whereby a cathode voltage is applied to the ion source for generating ions therein, and a suppression voltage is applied to the extraction electrode assembly proximate to the ion source for preventing electrons in the ion beam from being drawn into the ion source;
exchanging the workpieces between the end station and an external environment such that, once sufficient implantation of ions is complete, a treated workpiece is transferred from the end station into an external environment, and an untreated workpiece is transferred from the external environment into the end station for implantation of ions; and
modulating the suppression voltage applied to the extraction electrode assembly proximate to the ion source generally concurrent with the exchanging step whereby treated workpieces are transferred from the end station into an external environment, and the untreated workpieces are transferred from the external environment into the end station for implantation of ions, thereby inducing a current flow through the ceramic insulators of the extraction electrode assembly during the exchange step to remove deposits on surfaces of the extraction electrode assembly and to mitigate subsequent contamination of workpieces.
2. The method of claim 1 , wherein modulating the suppression voltage applied to the extraction electrode assembly proximate to the on source comprises cyclically varying the suppression voltage for one or more cycles.
3. The method of claim 1 , wherein the previously deposited material precipitates away from the extraction electrode assembly proximate the on source.
4. An improvement to an on implantation system for reducing particle contamination therein, the on implantation system comprising:
an on source;
an extraction electrode assembly situated proximate to the on source for extracting ions therefrom, said extraction electrode assembly including a suppression electrode and a ground electrode separated by ceramic insulators for electrically isolating the suppression electrode and the ground electrode; and
an end station configured to exchange the workpieces between the end station and an external environment such that, once sufficient implantation of ions is complete, a treated workpiece is transferred from the end station into an external environment, and an untreated workpiece is transferred from the external environment into the end station for selective implantation of ions into the workpieces;
said improvement comprising a controller configured to selectively modulate a voltage applied to the extraction electrode assembly proximate the on source generally concurrent with the exchange of the workpieces, thereby inducing a current flow through the ceramic insulators of the extraction electrode assembly during the exchange of workpieces to remove deposits on surfaces of the extraction electrode assembly and to mitigate subsequent contamination thereof.
5. The improvement of claim 4 , wherein the controller is further configured to selectively modulate a voltage applied to the ion source to eliminate formation of ion therein.