Secure low voltage testing
An integrated circuit includes a normal voltage detector configured to detect a normal voltage at which the integrated circuit being fully functional. A first voltage detector detects a first voltage that is less than the normal voltage. A second voltage detector detects a second voltage that is less than the first voltage. A reset module is coupled to a supply voltage, the normal voltage detector, the first voltage detector, and the second voltage detector. The reset module includes test logic to, when the supply voltage rises to the first voltage from the second voltage, perform a pass/fail test when the integrated circuit is in a pass/fail test mode, and perform a power up reset when the integrated circuit in not in the pass/fail test mode.
1. An integrated circuit, comprising:
a normal voltage detector configured to detect a normal voltage, the integrated circuit being fully functional at the normal voltage;
a first voltage detector configured to detect a first voltage, the first voltage is less than the normal voltage;
a second voltage detector configured to detect a second voltage, the second voltage is less than the first voltage;
a reset module coupled to a supply voltage, the normal voltage detector, the first voltage detector, and the second voltage detector, the reset module including test logic operable to:
when the supply voltage rises to the first voltage from the second voltage,
determine the integrated circuit is in a pass/fail test mode when a first security test is passed;
when the integrated circuit is in the pass/fail test mode, perform a pass/fail test; and
when the integrated circuit in not in the pass/fail test mode, perform a power up reset.
2. The integrated circuit of claim 1 , wherein the test logic is further operable to:
when the normal voltage drops to a value between the normal voltage and the first voltage,
determine the integrated circuit is in a pass/fail test mode when the first security test is passed;
when the integrated circuit is in the pass/fail test mode, perform a pass/fail test; and
when the integrated circuit in not in the pass/fail test mode, perform power down reset.
3. The integrated circuit of claim 1 , wherein the test logic is further operable to:
when the supply voltage drops to a value between the first voltage and the second voltage,
determine that the integrated circuit is in a characterization test mode when a second security test is passed;
when the integrated circuit is in the characterization test mode, perform a characterization test.
4. The integrated circuit of claim 3 , wherein the second security test determines that a user's security state matches a selected value.
5. The integrated circuit of claim 3 , wherein the characterization test determines a voltage level where at least a portion of the integrated circuit does not operate correctly.
6. The integrated circuit of claim 3 , wherein the pass/fail test is performed when a user's security state is unlocked after having been locked, the first security test is passed, and a test enable signal is set.
7. The integrated circuit of claim 3 , wherein the characterization test is performed when the second security test is passed and a test enable signal is set.
8. The integrated circuit of claim 1 , wherein the first security test determines that a test security state matches a selected value.
9. The integrated circuit of claim 1 , wherein the pass/fail test determines whether at least a portion of the integrated circuit operates correctly at a voltage less than the normal voltage.
10. The integrated circuit of claim 1 , wherein the power up reset is performed in response to the supply voltage rising to the normal voltage.
11. The integrated circuit of claim 1 , wherein the fail/pass test is performed when the first security test is passed and a test enable signal is set.
12. A processing system comprising:
a normal voltage detector configured to detect a normal voltage, the processing system being fully functional at the normal voltage;
a first voltage detector configured to detect a first voltage, the first voltage is less than the normal voltage and the processing system is only partially functional at the first voltage;
a second voltage detector configured to detect a second voltage, the second voltage is less than the first voltage and the processing system is not functional at the second voltage;
a reset module coupled to a supply voltage, the normal voltage detector, the first voltage detector, and the second voltage detector, the reset module including test logic operable to:
when the supply voltage drops to a value between the first voltage and the second voltage,
determine that the processing system is in a characterization test mode when a first security test is passed; and
when the processing system is in the characterization test mode, perform a characterization test.
13. The processing system of claim 12 , wherein the test logic is further operable to:
when the supply voltage rises to the first voltage from the second voltage,
determine the processing system is in a pass/fail test mode when a second security test is passed;
when the processing system is in a pass/fail test mode, perform a pass/fail test; and
when the processing system in not in the pass/fail test mode, enter a power up reset mode in response to the supply voltage rising to the normal voltage.
14. The processing system of claim 13 , wherein the test logic is further operable to:
when the normal voltage drops to a value between the normal voltage and the first voltage,
determine the processing system is in the pass/fail test mode when the second security test is passed;
when the integrated circuit is in the pass/fail test mode, perform a pass/fail test; and
when the processing system in not in the pass/fail test mode, enter a power down reset mode.
15. The processing system of claim 14 , wherein the second security test determines that a test security state matches a selected value.
16. The processing system of claim 14 , wherein the pass/fail test determines whether at least a portion of the processing system operates correctly at a voltage less than the normal voltage.
17. The processing system of claim 12 , wherein the first security test determines that a user's security state matches a selected value.
18. The processing system of claim 12 , wherein the characterization test determines a voltage level where at least a portion of the integrated circuit does not operate correctly.