Power management system for integrated circuits
A power management circuit for integrated circuits operating systems where the power supply may be marginal includes a supply voltage characterization circuit and a clock synthesis circuit. The supply voltage characterization circuit determines the strength of the supply voltage applied to the IC and provides information to the synthesis circuit that is used to adjust the clock frequency of the IC to insure the IC does not draw too much current and force the IC into reset. A counter is used to determine the time between when the supply voltage reaches a first level and a second higher level, the time being representative of the slope of the supply voltage. Knowledge of the characteristics of a portion of the circuit under certain operating or benchmark conditions may be used to adjust the characterization.
1. A power management system for an integrated circuit, the power management apparatus comprising:
a supply voltage characterization circuit configured to determine a first value that is representative of a characteristic of a supply voltage applied to the integrated circuit and a second value that is representative of a characteristic of the supply voltage; and
a clock synthesis circuit, operatively coupled to the supply voltage characterization circuit, that receives and uses the first value to generate a clock with a first frequency used to clock logic within at least a portion of the integrated circuit, receives the second value, and uses both the first and second values to generate the first frequency.
2. The power management system of claim 1 , wherein the first value is representative of a slope characteristic of the supply voltage.
3. The power management system of claim 2 , wherein the first value represents a period of time.
4. The power management system of claim 3 , wherein the first value is an output of a counter.
5. The power management system of claim 1 , wherein each of the first and second values represents a period of time.
6. The power management system of claim 1 , wherein at least one of the first and second values represents a sample of the supply voltage.
7. The power management system of claim 1 , wherein at least one of the supply voltage characterization circuit and the clock synthesis circuit is situated external to the integrated circuit.
8. The power management system of claim 1 , wherein the portion of the integrated circuit is a non-volatile memory within the integrated circuit.
9. The power management system of claim 1 , wherein the first frequency is below a frequency that the integrated circuit is specified to operate at when provided with manufacturer-recommended nominal power supply voltage.
10. A system clock generator for a portion of an integrated circuit, the system clock generator comprising:
a first threshold voltage crossing detector;
a second threshold voltage crossing detector;
a timer; and
a programmable clock synthesizer, wherein:
following application of a supply voltage to the integrated circuit, the timer is used to determine a time value representative of the time from (a) when the supply voltage for the integrated circuit crosses the first threshold voltage to (b) when the supply voltage crosses the second threshold voltage, the first threshold voltage being less than the second threshold voltage, and wherein a frequency of the clock synthesizer is programmed as a function of the time value and the clock synthesizer is used to generate the system clock for the portion of the integrated circuit.
11. The system clock generator of claim 10 , wherein the timer comprises a counter.
12. The system clock generator of claim 10 , wherein the first threshold voltage is a low-voltage detection rising trigger level voltage.
13. The system clock generator of claim 10 , comprising a low voltage detection rising trigger level voltage that is lower than the first threshold voltage, wherein when the low-voltage detection rising trigger level voltage is crossed by the supply voltage, the operation of the timer is enabled.
14. The system clock generator of claim 10 , wherein at least one of the voltage crossing detectors is situated external to the integrated circuit.
15. The system clock generator of claim 10 , wherein the portion of the integrated circuit is a non-volatile memory within the integrated circuit.
16. The system clock generator of claim 10 , wherein, following the time (a) when the supply voltage for the integrated circuit crosses the first threshold voltage, a benchmark application is run on the portion of the integrated circuit at a test frequency.
17. The system clock generator of claim 10 , wherein the current draw of the portion of the integrated circuit is known in advance of the time (a) when the supply voltage for the integrated circuit crosses the first threshold voltage.
18. The system clock generator of claim 10 , comprising a third threshold voltage crossing detector, wherein a timer is used to determine a second time value representative of the time from (b) when the supply voltage crosses the second threshold voltage to (c) when the supply voltage crosses the third voltage threshold, the third threshold voltage being higher than the first and second threshold voltages, and wherein the frequency of the clock synthesizer is programmed as a function of the second time value.