Methods and structures for achieving target resistance post CMP using in-situ resistance measurements

1. A method for controlling chemical mechanical polishing, comprising:

polishing a semiconductor wafer in a chemical mechanical polishing (CMP) tool;

measuring a resistance of a resistive pathway through the semiconductor wafer while the semiconductor wafer is undergoing polishing in the CMP tool, wherein the resistive pathway includes at least one through substrate via (TSV) formed in a substrate of the semiconductor wafer, at least one via formed in a metallization level of the semiconductor wafer, a conductive polishing pad of the CMP tool, and a conductive membrane of the CMP tool, wherein the semiconductor wafer is sandwiched between the conductive polishing pad and the conductive membrane of the CMP tool; and

terminating the polishing of the semiconductor wafer when the measured resistance reaches a target resistance.

2. The method of claim 1 , wherein the conductive polishing pad is divided into a plurality of segments, and wherein measuring the resistance further comprises measuring the resistance of a resistive pathway through each of the plurality of segments of the conductive polishing pad while the semiconductor wafer is undergoing polishing in the CMP tool.

3. The method of claim 1 , wherein the at least one TSV has a critical dimension that is larger than a critical dimension of the at least one via.

4. The method of claim 1 , wherein the at least one via is formed at a sub ground rule width, and wherein the at least one TSV is formed at a 3× ground rule width or greater.

5. The method of claim 1 , wherein the resistive pathway through the semiconductor wafer is located in a kerf region of the semiconductor wafer.

6. The method of claim 1 , further comprising:

polishing an additional semiconductor wafer in the CMP tool;

measuring the resistance of a resistive pathway through the additional semiconductor wafer while the additional semiconductor wafer is undergoing polishing in the CMP tool; and

terminating the polishing of the additional semiconductor wafer when measured resistance reaches the target resistance.

7. A resistive pathway through a semiconductor wafer in a chemical mechanical polishing (CMP) tool, comprising:

at least one through substrate via (TSV) formed in a substrate of the semiconductor wafer;

at least one via formed in a metallization level of the semiconductor wafer;

a conductive polishing pad of the CMP tool; and

a conductive membrane of the CMP tool;

wherein the semiconductor wafer is sandwiched between the conductive polishing pad and the conductive membrane of the CMP tool.

8. The resistive pathway of claim 7 , wherein the at least one TSV has a critical dimension that is larger than a critical dimension of the at least one via.

9. The resistive pathway of claim 7 , wherein the at least one via is formed at a sub ground rule width, and wherein the at least one TSV is formed at a 3× ground rule width or greater.

10. The resistive pathway of claim 7 , wherein the at least one TSV and the at least one via are disposed in a kerf region of the semiconductor wafer.

11. A chemical mechanical polishing (CMP) tool, comprising:

a resistance measuring system for measuring a resistance of a resistive pathway through a semiconductor wafer while the semiconductor wafer is undergoing polishing in the CMP tool, wherein the resistive pathway includes at least one through substrate via (TSV) formed in a substrate of the semiconductor wafer, at least one via formed in a metallization level of the semiconductor wafer, a conductive polishing pad of the CMP tool, and a conductive membrane of the CMP tool, wherein the semiconductor wafer is sandwiched between the conductive polishing pad and the conductive membrane of the CMP tool; and

a CMP control system for terminating the polishing of the semiconductor wafer when the measured resistance reaches a target resistance.

12. The CMP tool of claim 11 , wherein the conductive polishing pad comprises a plurality of segments, and wherein the resistance measuring system measures the resistance of a resistive pathway through each of the plurality of segments of the conductive polishing pad while the semiconductor wafer is undergoing polishing in the CMP tool.

13. The CMP tool of claim 11 , wherein the at least one TSV has a critical dimension that is larger than a critical dimension of the at least one via.

14. The CMP tool of claim 11 , wherein the at least one via is formed at a sub ground rule width, and wherein the at least one TSV is formed at a 3× ground rule width or greater.

15. The CMP tool of claim 11 , wherein the resistive pathway through the semiconductor wafer is located in a kerf region of the semiconductor wafer.