IP Library Patent Application 14814662
Patent Application
App. No. 14/814,662

BATTERY SYSTEM RESET SYSTEMS AND RELATED METHODS

Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US None
App. No.
14/814,662
Abstract

A battery reset system. Implementations may include: an embedded battery, a battery control circuit coupled with the embedded battery, a discharging field effect transistor (FET) coupled with the battery control circuit, and a charging FET coupled with the battery control circuit. The system may also include a positive battery terminal coupled with the battery and a negative battery terminal coupled with the embedded battery and a reset terminal coupled with a reset circuit coupled with the battery control circuit. The reset circuit and the battery control circuit may be included in a single semiconductor chip coupled with the discharging FET, charging FET, and embedded battery.

Claims (39)

1 . An embedded battery system comprising:

an embedded battery;

a battery control circuit coupled with the embedded battery;

a discharging field effect transistor (FET) coupled with the battery control circuit;

a charging FET coupled with the battery control circuit;

a positive battery terminal coupled with the battery and a negative battery terminal coupled with the embedded battery;

a reset terminal coupled with a reset circuit coupled with the battery control circuit;

wherein the reset circuit and battery control circuit are comprised in a single semiconductor chip coupled with the discharging FET, charging FET, and embedded battery.

2 . The system of claim 1 , wherein no other FETs are included except the discharging FET and charging FET.

3 . The system of claim 1 , wherein the reset circuit is configured to turn off at least the discharging FET in response to receiving a reset signal from the reset terminal.

4 . The system of claim 3 , wherein a hardware switch configured to be pressed by a user is coupled with the reset terminal and configured to send a reset signal to the reset circuit when pressed by the user for a predetermined period of time.

5 . The system of claim 3 , wherein the reset circuit is configured to receive a reset signal via the reset terminal from one of a load and a charger coupled to the battery.

6 . The system of claim 3 , wherein the reset circuit is configured to receive a reset signal via the reset terminal when an external power signal is applied to the reset terminal.

7 . The system of claim 6 , wherein the external power signal is sent from a power module integrated circuit (IC) coupled with the positive battery terminal and the negative battery terminal and wherein the reset circuit is configured to test the operation of the embedded battery through turning off at least the discharging FET.

8 . The system of claim 1 , further comprising a test switch and a reset switch, wherein when the test switch is closed, the reset terminal is configured to allow a testing system to test the embedded battery system, and when the reset switch is closed, the reset terminal is configured to receive reset signals and forward them to the reset circuit.

9 . The system of claim 8 , wherein the test switch is configured to close in response to receiving one of a testing current sense signal, a testing voltage signal and both a testing current sense signal and a testing voltage signal at the positive battery terminal wherein one of the testing current sense signal and the testing voltage signal are configured to be above an overcharge voltage level for the embedded battery.

10 . The system of claim 1 , further comprising:

a fuse array;

a reset logic circuit configured to turn off at least the discharging FET in response to receiving a reset signal from the reset terminal;

at least one testing fuse coupled with the fuse array and reset logic circuit and configured to move a test/reset switch from a testing position to a reset position upon receiving a testing fuse trimming signal and an end of a testing sequence of the embedded battery system.

11 . A battery control system for an embedded battery, the system comprising:

a battery control circuit configured to be coupled with an embedded battery;

a discharging field effect transistor (FET) coupled with the battery control circuit;

a charging FET coupled with the battery control circuit;

a positive battery terminal coupled with the battery and a negative battery terminal coupled with the battery control circuit;

a reset terminal coupled with a reset circuit coupled with the battery control circuit;

wherein the reset circuit and battery control circuit are comprised in a single semiconductor chip coupled with the discharging FET and charging FET.

12 . The system of claim 11 , wherein no other FETs are included except the discharging FET and charging FET.

13 . The system of claim 11 , wherein the reset circuit is configured to turn off at least the discharging FET in response to receiving a reset signal from the reset terminal.

14 . The system of claim 13 , wherein a hardware switch configured to be pressed by a user is coupled with the reset terminal and configured to send a reset signal to the reset circuit when pressed by the user for a predetermined period of time.

15 . The system of claim 13 , wherein the reset circuit is configured to receive a reset signal via the reset terminal from a one of a load and a charger coupled to the battery control circuit.

16 . The system of claim 13 , wherein the reset circuit is configured to receive a reset signal via the reset terminal when an external power signal is applied to the reset terminal.

17 . The system of claim 16 , wherein the external power signal is sent from a power module integrated circuit (IC) coupled with the positive battery terminal and the negative battery terminal and wherein the reset circuit is configured to test the operation of the embedded battery through turning off at least the discharging FET.

18 . The system of claim 11 , further comprising a test switch and a reset switch, wherein when the test switch is closed, the reset terminal is configured to allow a testing system to test the embedded battery system, and when the reset switch is closed, the reset terminal is configured to receive reset signals and forward them to the reset circuit.

19 . The system of claim 18 , wherein the test switch is configured to close in response to receiving one of a testing current sense signal, a testing voltage signal and both a testing current sense signal and a testing voltage signal at the positive battery terminal wherein one of the testing current sense signal and the testing voltage signal are configured to be above an overcharge voltage level for the embedded battery.

20 . The system of claim 11 , further comprising:

a fuse array;

a reset logic circuit configured to turn off at least the discharging FET in response to receiving a reset signal from the reset terminal;

at least one testing fuse coupled with the fuse array and reset logic circuit and configured to move a test/reset switch from a testing position to a reset position upon receiving a testing fuse trimming signal and an end of a testing sequence of the embedded battery system.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 31, 2015
From: NIKI, MUTSUKI; AMEMIYA, KEIJI; HAYASHI, YASUAKI; YAMAMOTO, KATSUMI
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 036224/0348 →