IP Library Granted Patent US 9,437,493
Granted Patent B2
US 9,437,493 · App. 14/849,779 · Granted Sep 6, 2016

Method of forming a semiconductor die

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Quick Facts
Patent No.
US 9,437,493
App. No.
14/849,779
Granted
Sep 6, 2016
Kind
B2
Abstract

In one embodiment, semiconductor die having non-rectangular shapes and die having various different shapes are formed and singulated from a semiconductor wafer.

Claims (8)

1. A method of forming a semiconductor die comprising:

providing a semiconductor wafer including a bulk semiconductor substrate having a top surface and a bottom surface;

forming a plurality of semiconductor die on the top surface of the silicon bulk semiconductor substrate with at least one die of the plurality of semiconductor die having regions for forming two substantially straight sides that intersect to form a first corner having a substantially curved shape and other regions for forming one or more other corners of the semiconductor die having a different shape than the first corner;

forming a singulation region as a region of the semiconductor wafer that is between the semiconductor die; and

using a dry etch to form an opening through the silicon bulk semiconductor substrate to simultaneously singulate the plurality of semiconductor die and form at least the first corner, the one or more other corners, and the two substantially straight sides.

2. The method of claim 1 wherein using the dry etch includes forming two other sides of the semiconductor die that intersect to form a substantially right angle.

3. The method of claim 1 wherein using the dry etch includes forming the openings completely through the semiconductor wafer and the semiconductor die along with the bulk semiconductor substrate.

4. The method of claim 1 wherein providing the semiconductor wafer including the bulk semiconductor substrate includes providing the bulk semiconductor substrate as a the bulk silicon semiconductor substrate.

Assignments (4)
RELEASE OF SECURITY INTEREST IN PATENTS RECORDED AT REEL 038620, FRAME 0087 Recorded Jun 22, 2023
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC; FAIRCHILD SEMICONDUCTOR CORPORATION
Reel/Frame 064070/0001 →
CORRECTIVE ASSIGNMENT TO CORRECT THE INCORRECT PATENT NUMBER 5859768 AND TO RECITE COLLATERAL AGENT ROLE OF RECEIVING PARTY IN THE SECURITY INTEREST PREVIOUSLY RECORDED ON REEL 038620 FRAME 0087. ASSIGNOR(S) HEREBY CONFIRMS THE SECURITY INTEREST. Recorded Aug 25, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 039853/0001 →
SECURITY INTEREST Recorded Apr 15, 2016
From: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH
Reel/Frame 038620/0087 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 10, 2015
From: GRIVNA, GORDON M.; SEDDON, MICHAEL J.
To: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
Reel/Frame 036529/0817 →