IP Library Granted Patent US 10,288,447
Granted Patent B2
US 10,288,447 · App. 15/336,035 · Granted May 14, 2019

Microelectromechanical systems device test system and method

Inventors: Philippe Garre (Tempe, AZ); Silvia Garre (Scottsdale, AZ)
Assignee: NXP USA, Inc.
G01C25/005G01C19/5712G01P21/00
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Quick Facts
Patent No.
US 10,288,447
App. No.
15/336,035
Filed
Oct 27, 2016
Granted
May 14, 2019
Kind
B2
Art Unit
2856
USPC
73/1.37
Abstract

A system includes a rotary platform adapted to undergo oscillatory motion about a fixed point, a test fixture coupled to the rotary platform, the test fixture being adapted to receive a device-under-test, and an inertial sensor mounted to the rotary platform for providing a motion output signal indicative of the oscillatory motion. A controller is in communication with the rotary platform and inertial sensor. The controller receives the motion output signal and provides a drive signal to the rotary platform responsive to the motion output signal. The controller generates the drive signal in response a test profile and the motion output signal provides feedback of actual movement of the rotary platform. The motion output signal is input to the controller to ensure correspondence between the drive signal and the test profile. A multitude of differing validated environmental vibrational stimuli effects can be evaluated via a sense signal from the device.

Claims (20)

1. A method for testing a device comprising:

securing a device in a test fixture coupled to a rotary platform, said rotary platform being adapted to undergo oscillatory motion about a fixed point;

generating a drive signal at a controller in response to a predetermined test profile, said controller being in communication with said rotary platform, wherein said predetermined test profile produces said drive signal comprising a frequency sweep sine wave signal, said frequency sweep sine wave signal being characterized by a series of discrete frequencies, each of said discrete frequencies being continuous for a predetermined duration;

providing said drive signal from said controller to said rotary platform, said drive signal producing said oscillatory motion of said rotary platform; and

receiving, at said controller, a motion output signal from an inertial sensor mounted to said rotary platform, said motion output signal being indicative of said oscillatory motion, wherein said motion output signal provides feedback of actual movement of said rotary platform, and said drive signal is generated in response to said motion output signal to ensure that said drive signal corresponds with said predetermined test profile.

2. The method of claim 1 further comprising:

recording, at said controller, a sense signal output from said device; and

evaluating, at said controller, a functionality of said device using said sensing signal and said motion output signal.

3. The method of claim 1 wherein said device is an angular rate sensor.

4. The method of claim 1 further comprising executing a control program at said controller, said control program specifying said predetermined test profile utilized to generate said drive signal.

5. A method for testing a device comprising:

securing a device in a test fixture coupled to a rotary platform, said rotary platform being adapted to undergo oscillatory motion about a fixed point

generating a drive signal at a controller in response to a predetermined test profile, said controller being in communication with said rotary platform, wherein said predetermined test profile produces said drive signal comprising a shock signal superimposed on a continuous frequency sine wave signal;

providing said drive signal from said controller to said rotary platform, said drive signal producing said oscillatory motion of said rotary platform; and

receiving, at said controller, a motion output signal from an inertial sensor mounted to said rotary platform, said motion output signal being indicative of said oscillatory motion, wherein said motion output signal provides feedback of actual movement of said rotary platform, and said drive signal is generated in response to said motion output signal to ensure that said drive signal corresponds with said predetermined test profile.

6. A method for testing a device comprising:

securing a device in a test fixture coupled to a rotary platform, said rotary platform being adapted to undergo oscillatory motion about a fixed point

generating a drive signal at a controller in response to a predetermined test profile, said controller being in communication with said rotary platform, wherein said predetermined test profile produces said drive signal comprising a random drive signal having at least one of an amplitude and a frequency that varies in a random or pseudorandom manner during a test procedures;

providing said drive signal from said controller to said rotary platform, said drive signal producing said oscillatory motion of said rotary platform; and

receiving, at said controller, a motion output signal from an inertial sensor mounted to said rotary platform, said motion output signal being indicative of said oscillatory motion, wherein said motion output signal provides feedback of actual movement of said rotary platform, and said drive signal is generated in response to said motion output signal to ensure that said drive signal corresponds with said predetermined test profile.

Assignments (2)
MERGER Recorded Jan 3, 2017
From: FREESCALE SEMICONDUCTOR, INC.
To: NXP USA, INC.
Reel/Frame 041144/0363 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 27, 2016
From: GARRE, PHILIPPE; GARRE, SILVIA
To: FREESCALE SEMICONDUCTOR, INC.
Reel/Frame 040152/0145 →
Continuity (1)
Related Publication 20180120126A1 · May 3, 2018
Cited By (1)
US 12,719,592