IP Library Granted Patent US 9,897,564
Granted Patent B2
US 9,897,564 · App. 15/337,887 · Granted Feb 20, 2018

Systems and methods for detecting change in species in an environment

Inventor: Srivatsa G. Kundalgurki (Austin, TX)
Assignee: NXP USA, Inc.
G01N27/226G01N27/227G01N27/228G01N27/403G01N33/0036H01L31/022408H01L31/115
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Quick Facts
Patent No.
US 9,897,564
App. No.
15/337,887
Granted
Feb 20, 2018
Kind
B2
Abstract

One embodiment of making a diode includes forming a first electrode to which an electric field is applied; forming a second electrode to which the electric field is applied; and forming a vapor gap region between the first electrode and the second electrode. A total capacitance measured between the first electrode and the second electrode varies based on presence of a polar vapor species on at least a portion of an electrode surface of at least one of the first electrode and the second electrode.

Claims (48)

1. A method of making a diode comprising:

forming a first electrode to which an electric field is applied;

forming a second electrode to which the electric field is applied; and

forming a vapor gap region between the first electrode and the second electrode, wherein a total capacitance measured between the first electrode and the second electrode varies based on presence of a polar vapor species on at least a portion of an electrode surface of at least one of the first electrode and the second electrode;

forming a first semiconductor region of a first conductivity type in ohmic contact with the first electrode;

forming a second semiconductor region of a second conductivity type in ohmic contact with the second electrode, wherein

the second conductivity type is opposite the first conductivity type; and

an intrinsic semiconductor region is between the first and second semiconductor regions, wherein the vapor gap region is above the intrinsic semiconductor region.

2. The method of claim 1 , wherein

applying a low frequency alternating voltage signal between the first and second electrodes to form an electric double layer of molecules of the polar vapor species at the portion of the electrode surface,

proportionally increasing a capacitance due to the electric double layer with an increase in concentration of the molecules of the polar vapor species present on the portion of the electrode surface, wherein

the total capacitance includes the capacitance due to the electric double layer.

3. The method of claim 2 , wherein

the low frequency alternating voltage signal has a frequency of less than 500 Hz.

4. The method of claim 1 , wherein

the first electrode comprises a first plurality of fingers,

the second electrode comprises a second plurality of fingers, and

the first and second plurality of fingers form an interdigitated structure.

5. The method of claim 4 , wherein

a spacing measured between a finger of the first plurality of fingers and an adjacent finger of the second plurality of fingers is less than 4 microns.

6. The method of claim 1 , wherein

the first and second electrodes comprise a passive conductive metal, and

the passive conductive metal comprises one of a group including aluminum and titanium nitride.

7. The method of claim 1 , further comprising at least one or more of:

forming a layer of nanoclusters over the intrinsic semiconductor region, and

forming a layer of non-conductive material over the intrinsic semiconductor region.

8. A method of forming a diode, comprising:

forming a first electrode to which an electric field is applied,

forming a second electrode to which the electric field is applied, and

forming a vapor gap region between the first electrode and the second electrode, wherein a total capacitance measured between the first electrode and the second electrode varies based on presence of a first polar vapor species on at least a portion of an electrode surface of at least one of the first electrode and the second electrode; and

forming a measuring circuit having a first terminal electrically coupled to the first electrode and a second terminal electrically coupled to the second electrode, wherein the measuring circuit is configured to provide a reading of the total capacitance measured between the first electrode and the second electrode;

forming a first semiconductor region of a first conductivity type in ohmic contact with the first electrode;

forming a second semiconductor region of a second conductivity type in ohmic contact with the second electrode, wherein

the second conductivity type is opposite the first conductivity type; and

an intrinsic semiconductor region is between the first and second semiconductor regions, wherein the vapor gap region is above the intrinsic semiconductor region.

9. The method of claim 8 , wherein

forming an electric double layer of molecules of the first polar vapor species at the portion of the electrode surface upon application of a low frequency alternating voltage signal between the first and second electrodes,

proportionally increasing a capacitance due to the electric double layer with an increase in concentration of the molecules of the first polar vapor species present on the portion of the electrode surface, wherein the total capacitance includes the capacitance due to the electric double layer.

10. The method of claim 9 , further comprising applying the low frequency alternating voltage signal to the first and second electrodes using a power source having a first terminal electrically coupled to the first electrode and a second terminal electrically coupled to the second electrode.

11. The method of claim 8 , further comprising:

reacting a selectively reactive source with the first polar vapor species present within the vapor gap region and in vicinity of the first and second electrodes to produce one or more component non-polar vapor species, wherein a second polar vapor species is also present within the vapor gap region and in vicinity of the first and second electrodes.

12. The method of claim 11 , wherein the selectively reactive source comprises at least one or more of:

a light source configured to expose the first polar vapor species to light of a suitable wavelength capable of selectively inducing photochemical decomposition of the first polar vapor species, and

a chemical source configured to expose the first polar vapor species to a chemical compound.

13. The method of claim 11 , further comprising:

initiating the measurement circuit to provide a first reading of the total capacitance between the first and second electrodes,

activating the selectively reactive source to selectively react with the first polar vapor species for a period of time subsequent to initiation of the first reading of the total capacitance, and

initiating the measurement circuit to provide a second reading of the total capacitance between the first and second electrodes subsequent to activation of the selectively reactive source.

Assignments (2)
CORRECTIVE ASSIGNMENT TO CORRECT THE NATURE OF CONVEYANCE PREVIOUSLY RECORDED AT REEL: 040626 FRAME: 0683. ASSIGNOR(S) HEREBY CONFIRMS THE MERGER AND CHANGE OF NAME EFFECTIVE NOVEMBER 7, 2016. Recorded Jan 12, 2017
From: NXP SEMICONDUCTORS USA, INC. (MERGED INTO); FREESCALE SEMICONDUCTOR, INC. (UNDER)
To: NXP USA, INC.
Reel/Frame 041414/0883 →
CHANGE OF NAME Recorded Nov 16, 2016
From: FREESCALE SEMICONDUCTOR INC.
To: NXP USA, INC.
Reel/Frame 040626/0683 →
Continuity (2)
Division 14625008 · Feb 18, 2015
Related Publication 20170045467A1 · Feb 16, 2017