IP Library Assignment 008547/0600
Patent Assignment
Reel/Frame 008547/0600

Assignment of Assignor's Interest

Recorded: 1997-03-25 Pages: 3
Assignor
KURTZ, DAVID S.
Executed: 1997-03-24
Assignee
ADVANCED TECHNOLOGY MATERIALS INC.
7 COMMERCE DRIVE, DANBURY, CONNECTICUT, 06810
Covered Property (1)
Apparatus for Rapid in-Situ X-Ray Stress Measurement During Thermal Cycling of Semiconductor Wafers
Patent: 5,848,122 →
Application: 08/823,967 →
Related Assignments (3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Feb 13, 1998
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: HYPERNEX
Reel/Frame 008973/0725 →
Confirmatory License Mar 4, 1999
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: AIR FORCE, UNITED STATES
Reel/Frame 009798/0322 →
Assignment of Assignor's Interest Sep 15, 2006
From: HYPERNEX, INC.
To: NOVA MEASURING INSTRUMENTS LTD.
Reel/Frame 018260/0053 →