Patent Assignment
Reel/Frame 009798/0322
Confirmatory License
Recorded: 1999-03-04
Pages: 2
Assignor
ADVANCED TECHNOLOGY MATERIALS, INC.
Executed: 1999-03-02
Assignee
AIR FORCE, UNITED STATES
26 ELECTRONIC PARKWAY, ROME, NEW YORK, 13441
Covered Property
(1)
Apparatus for Rapid in-Situ X-Ray Stress Measurement During Thermal Cycling of Semiconductor Wafers
Patent:
5,848,122 →
Application:
08/823,967 →
Related Assignments
(3)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 25, 1997
From: KURTZ, DAVID S.
To: ADVANCED TECHNOLOGY MATERIALS INC.
Reel/Frame 008547/0600 →
Assignment of Assignor's Interest
Feb 13, 1998
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: HYPERNEX
Reel/Frame 008973/0725 →
Assignment of Assignor's Interest
Sep 15, 2006
From: HYPERNEX, INC.
To: NOVA MEASURING INSTRUMENTS LTD.
Reel/Frame 018260/0053 →