Patent Assignment
Reel/Frame 008973/0725
Assignment of Assignor's Interest
Recorded: 1998-02-13
Pages: 6
Assignor
ADVANCED TECHNOLOGY MATERIALS, INC.
Executed: 1998-01-31
Assignee
HYPERNEX
3006 RESEARCH DRIVE, STATE COLLEGE, PENNSYLVANIA, 16801
Covered Properties
(3)
Large Angle Solid State Position Sensitive X-Ray Detector System
Patent:
5,724,401 →
Application:
08/590,956 →
Apparatus for Rapid in-Situ X-Ray Stress Measurement During Thermal Cycling of Semiconductor Wafers
Patent:
5,848,122 →
Application:
08/823,967 →
Photo-Sensor Fiber-Optic Stress Analysis System
Patent:
5,828,724 →
Application:
08/823,971 →
Related Assignments
(6)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Jan 24, 1996
From: RUUD, CLAYTON O.
To: PENN STATE RESEARCH FOUNDATION, THE
Reel/Frame 007859/0886 →
Assignment of Assignor's Interest
Jan 24, 1996
From: KURTZ, DAVID S.
To: ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 007859/0891 →
Assignment of Assignor's Interest
Mar 25, 1997
From: KURTZ, DAVID S,
To: ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 008547/0371 →
Assignment of Assignor's Interest
Mar 25, 1997
From: KURTZ, DAVID S.
To: ADVANCED TECHNOLOGY MATERIALS INC.
Reel/Frame 008547/0600 →
Confirmatory License
Mar 4, 1999
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: AIR FORCE, UNITED STATES
Reel/Frame 009798/0322 →
Assignment of Assignor's Interest
Sep 15, 2006
From: HYPERNEX, INC.
To: NOVA MEASURING INSTRUMENTS LTD.
Reel/Frame 018260/0053 →