IP Library Assignment 018260/0053
Patent Assignment
Reel/Frame 018260/0053

Assignment of Assignor's Interest

Recorded: 2006-09-15 Pages: 12
Assignor
HYPERNEX, INC.
Executed: 2006-08-08
Assignee
NOVA MEASURING INSTRUMENTS LTD.
WEITZMANN SCIENCE PARK, REHOVOTH, 76100, ISRAEL
Covered Properties (10)
Large Angle Solid State Position Sensitive X-Ray Detector System
Patent: 5,724,401 →
Application: 08/590,956 →
Apparatus for Rapid in-Situ X-Ray Stress Measurement During Thermal Cycling of Semiconductor Wafers
Patent: 5,848,122 →
Application: 08/823,967 →
Photo-Sensor Fiber-Optic Stress Analysis System
Patent: 5,828,724 →
Application: 08/823,971 →
Large Angle Solid State Position Sensitive X-Ray Detector System
Patent: 5,784,432 →
Application: 08/916,378 →
Photo-Sensor Fiber-Optic Stress Analysis System
Patent: 6,058,160 →
Application: 09/144,932 →
Apparatus and Method for Texture Analysis on Semiconductor Wafers
Patent: 6,301,330 →
Application: 09/365,063 →
Method and Apparatus for Rapid Grain Size Analysis of Polycrystalline Materials
Patent: 6,882,739 →
Application: 09/884,791 →
Publication: US 2003/0012334
Method and Apparatus for Quantitative Phase Analysis of Textured Polycrystalline Materials
Patent: 6,678,347 →
Application: 10/205,717 →
Method and Apparatus for Thin Film Thickness Mapping
Patent: 6,792,075 →
Application: 10/225,534 →
Publication: US 2004/0047447
Method and Apparatus for Thin Film Thickness Mapping
Patent: 6,909,772 →
Application: 10/744,413 →
Publication: US 2004/0170249
Related Assignments (14)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 24, 1996
From: RUUD, CLAYTON O.
To: PENN STATE RESEARCH FOUNDATION, THE
Reel/Frame 007859/0886 →
Assignment of Assignor's Interest Jan 24, 1996
From: KURTZ, DAVID S.
To: ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 007859/0891 →
Assignment of Assignor's Interest Mar 25, 1997
From: KURTZ, DAVID S,
To: ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 008547/0371 →
Assignment of Assignor's Interest Mar 25, 1997
From: KURTZ, DAVID S.
To: ADVANCED TECHNOLOGY MATERIALS INC.
Reel/Frame 008547/0600 →
Assignment of Assignor's Interest Feb 13, 1998
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: HYPERNEX
Reel/Frame 008973/0725 →
Assignment of Assignor's Interest Aug 10, 1998
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: HYPERNEX, INC.
Reel/Frame 009369/0854 →
Confirmatory License Mar 4, 1999
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: AIR FORCE, UNITED STATES
Reel/Frame 009798/0322 →
Assignment of Assignor's Interest Jul 30, 1999
From: KURTZ, DAVID S.; KOZACZEK, KRZYSZTOF J.; MORAN, PAUL R.
To: ADVANCED TECHNOLOGY MATERIALS, INC.
Reel/Frame 010159/0460 →
Assignment of Assignor's Interest Jan 6, 2000
From: ADVANCED TECHNOLOGY MATERIALS, INC.
To: HYPERNEX, INC.
Reel/Frame 010508/0951 →
Assignment of Assignor's Interest Jun 19, 2001
From: KURTZ, DAVID S.; KOZACZEK, KRZYSZTOF J.; MORAN, PAUL R.
To: HYPERNEX, INC.
Reel/Frame 011924/0079 →
Assignment of Assignor's Interest Jul 26, 2002
From: KOZACZEK, KRZYSZTOF J.; KURTZ, DAVID S.; MORAN, PAUL R.; MARTIN, ROGER I.
To: HYPERNEX, INC.
Reel/Frame 013144/0696 →
Assignment of Assignor's Interest Aug 21, 2002
From: KOZACZEK, KRZYSZTOF J.; KURTZ, DAVID S.; MORAN, PAUL R.; MARTIN, ROGER I.
To: HYPERNEX, INC.; INTERNATIONAL BUSINESS MACHINES CORP.
Reel/Frame 013223/0917 →
Assignment of Assignor's Interest May 4, 2004
From: KOZACZEK, KRZYSZTOF J.; KURTZ, DAVID S.; MORAN, PAUL R.; MARTIN, ROGER I.
To: HYPERNEX, INC.; INTERNATIONAL BUSINESS MACHINES CORP.
Reel/Frame 015295/0756 →
Change of Name May 23, 2023
From: FROM NOVA MEASURING INSTRUMENTS LTD.
To: NOVA LTD.
Reel/Frame 063724/0340 →