Patent Assignment
Reel/Frame 009610/0434
Assignment of Assignor's Interest
Recorded: 1998-11-20
Pages: 2
Assignors
OMURA, RYUJI
Executed: 1998-10-05
SUGIURA, KAZUSHI
Executed: 1998-10-05
SHIBAYAMA, MARI
Executed: 1998-10-05
Assignees
MITSUBISHI DENKI KABUSHIKI KAISHA
2-3, MARUNOUCHI 2-CHOME, CHIYODA-KU, TOKYO 100-8310, JAPAN
RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
4-1, MIZUHARA, ITAMI-SHI, HYOGO 664-0005, JAPAN
Covered Property
(1)
Semiconductor Testing Apparatus for Testing Semiconductor Device Including Built in Self Test Circuit
Patent:
6,311,300 →
Application:
09/196,438 →
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Mar 18, 2011
From: MITSUBISHI DENKI KABUSHIKI KAISHA
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 025980/0219 →
Merger
Apr 3, 2015
From: RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION
To: RENESAS NAKA SEMICONDUCTOR CORP.
Reel/Frame 035329/0587 →
Merger
Apr 3, 2015
From: RENESAS NAKA SEMICONDUCTOR, INC.
To: RENESAS KANSAI SEMICONDUCTOR CO., LTD.
Reel/Frame 035329/0612 →
Assignment of Assignor's Interest
Apr 3, 2015
From: RENESAS SEMICONDUCTOR MANUFACTURING CO., LTD.
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 035329/0641 →
Change of Name
Apr 3, 2015
From: RENESAS KANSAI SEMICONDUCTOR CO., LTD.
To: RENESAS SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 035329/0668 →