IP Library › Assignment 011033/0010
Patent Assignment
Reel/Frame 011033/0010

Assignment of Assignor's Interest

Recorded: 2000-08-22 Pages: 4
Assignors
JAING, CHENG-CHUNG
Executed: 2000-08-02
TSAI, CHUEN-HORNG
Executed: 2000-08-03
CHEN, JYH-SHIN
Executed: 2000-08-03
CHENG, MING-HWU
Executed: 2000-08-03
HSIAO, HO-YEN
Executed: 2000-08-02
YEH, PY-SHIUN
Executed: 2000-08-07
KAO, JIANN-SHIUN
Executed: 2000-08-02
Assignee
PRECISION INSTRUMENT DEVELOPMENT CENTER, NATIONAL SCIENCE COUNCIL
HSINCHU SCIENCE-BASED INDUSTRIAL PARK, 20 R&D ROAD VI, HSINCHU, TAIWAN
Covered Property (1)
Method for in-Situ Monitoring Layer Uniformity of Sputter Coating Based on Intensity Distribution of Plasma Spectrum
Patent: 6,493,070 →
Application: 09/642,793 →
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Change of Name Jan 5, 2015
From: PRECISION INSTRUMENT DEVELOPMENT CENTER, NATIONAL SCIENCE COUNCIL
To: PRECISION INSTRUMENT DEVELOPMENT CENTER, NON-PROFIT ORGANIZATION NATIONAL APPLIED RESEARCH LABORATORIES
Reel/Frame 034719/0949 →