Patent Assignment
Reel/Frame 034719/0949
Change of Name
Recorded: 2015-01-05
Pages: 4
Assignor
PRECISION INSTRUMENT DEVELOPMENT CENTER, NATIONAL SCIENCE COUNCIL
Executed: 1994-01-16
Assignee
PRECISION INSTRUMENT DEVELOPMENT CENTER, NON-PROFIT ORGANIZATION NATIONAL APPLIED RESEARCH LABORATORIES
20 R&D ROAD VI, HSINCHU SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, TAIWAN
Covered Properties
(4)
Method for Measuring a Thermal Expansion Coefficient of a Thin Film by Using Phase Shifting Interferometry
Patent:
6,466,308 →
Application:
09/547,849 →
Method for in-Situ Monitoring Layer Uniformity of Sputter Coating Based on Intensity Distribution of Plasma Spectrum
Patent:
6,493,070 →
Application:
09/642,793 →
Capacitor Containing Amorphous and Polycrystalline Ferroelectric Films and Fabrication Method Therefor, and Method for Forming Amorphous Ferroelectric Film
Light Emitting Element Driver with Low Supply Voltage
Related Assignments
(3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest
Apr 12, 2000
From: JAING, CHENG-CHUNG; LEE, CHEN-CHUNG; TIEN, CHUEN-LIN; HO, ING-JER
To: PRECISION INSTRUMENT DEVELOPMENT CENTER, NATIONAL SCIENCE COUNCIL
Reel/Frame 010726/0329 →
Assignment of Assignor's Interest
Aug 22, 2000
From: JAING, CHENG-CHUNG; TSAI, CHUEN-HORNG; CHEN, JYH-SHIN; CHENG, MING-HWU
To: PRECISION INSTRUMENT DEVELOPMENT CENTER, NATIONAL SCIENCE COUNCIL
Reel/Frame 011033/0010 →
Assignment of Assignor's Interest
Oct 16, 2001
From: LIAO, TAI-SHAN; CHEN, MING-LI; HUANG, MING HUNG; TSAY, HO-LIN
To: PRECISION INSTRUMENT DEVELOPMENT CENTER, NATIONAL SCIENCE COUNCIL
Reel/Frame 012258/0549 →