Patent Assignment
Reel/Frame 011957/0591
Assignment of Assignor's Interest
Recorded: 2001-07-09
Pages: 2
Assignor
KWON, DAEWON
Executed: 2001-06-28
Assignee
RUDOLPH TECHNOLOGIES, INC.
ONE RUDOLPH ROAD, FLANDERS, NEW JERSEY, 07836
Covered Property
(1)
Method and Apparatus for Measuring Very Thin Dielectric Film Thickness and Creating a Stable Measurement Environment
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.